scholarly journals Extraordinary optical transmission in silicon nanoholes

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Hosam Mekawey ◽  
Yehea Ismail ◽  
Mohamed Swillam
Keyword(s):  
Thin Film ◽  
Refractive Index ◽  
Optical Transmission ◽  
Extraordinary Optical Transmission ◽  
Careful Consideration ◽  
Visible Range ◽  
Metallic Films ◽  
Mode Cutoff ◽  
Response Modeling ◽  
Si Thin Film

AbstractIn this work, for the first time, a study was conducted of the existence of Extraordinary Optical Transmission (EOT) in Silicon (Si) thin films with subwavelength holes array and high excess carrier concentration. Typically EOT is studied in opaque perforated metal films. Using Si would bring EOT and its many applications to the silicon photonics realm and the mid-IR range. Since Si thin film is a semi-transparent film in mid-IR, a generalization was proposed of the normalized transmission metric used in literature for EOT studies in opaque films. The plasma dispersion effect was introduced into the studied perforated Si film through either doping or carriers’ generation. Careful consideration for the differences in optical response modeling in both cases was given. Full-wave simulation and analysis showed an enhanced transmission when using Si with excess carriers, mimicking the enhancement reported in perforated metallic films. EOT was found in the mid-IR instead of the visible range which is the case in metallic films. The case of Si with generated excess carriers showed a mid-IR EOT peak reaching 157% around 6.68 µm, while the phosphorus-doped Si case showed a transmission enhancement of 152% around 8.6 µm. The effect of varying the holes’ dimensions and generated carriers’ concentration on the transmission was studied. The analogy of the relation between the fundamental mode cutoff and the EOT peak wavelength in the case of Si to the case of metal such as silver was studied and verified. The perforated Si thin film transmission sensitivity for a change in the refractive index of the holes and surroundings material was investigated. Also, a study of the device potential in sensing the hole and surroundings materials that have almost the same refractive index yet with different absorption fingerprints was performed as well.

scholarly journals Negative refractive index metamaterials aided by extraordinary optical transmission

2009 ◽  
Vol 17 (8) ◽  
pp. 6026 ◽  
Author(s):  
C. García-Meca ◽  
R. Ortuño ◽  
F. J. Rodríguez-Fortuño ◽  
J. Martí ◽  
A. Martínez
Keyword(s):  
Refractive Index ◽  
Optical Transmission ◽  
Negative Refractive Index ◽  
Extraordinary Optical Transmission

Large area Si thin film solar module applying n-μc-SiOx:H intermediate layer with low refractive index

2013 ◽  
Vol 113 ◽  
pp. 79-84 ◽  
Author(s):  
Sun-Tae Hwang ◽  
Dong Joo You ◽  
Sun Ho Kim ◽  
Sungeun Lee ◽  
Heon-Min Lee
Keyword(s):  
Thin Film ◽  
Refractive Index ◽  
Intermediate Layer ◽  
Large Area ◽  
Solar Module ◽  
Si Thin Film ◽  
Low Refractive Index

scholarly journals Оптические свойства пленок ниобата бария стронция SBN61

2018 ◽  
Vol 60 (5) ◽  
pp. 993
Author(s):  
В.Б. Широков ◽  
А.В. Павленко ◽  
Д.В. Стрюков ◽  
Ю.В. Ревинский
Keyword(s):  
Refractive Index ◽  
Single Crystal ◽  
Band Gap ◽  
Optical Transmission ◽  
Visible Range ◽  
Transmission Spectra ◽  
X Ray Diffraction ◽  
Dispersion Parameters ◽  
X Ray ◽  
Optical Transmission Spectra

AbstractHeteroepitaxial Sr_0.61Ba_0.39Nb_2O_6 films have been formed on MgO(001) substrates by RF deposition in an oxygen atmosphere. The film orientation with respect to the substrate is investigated using X-ray diffraction. The permittivity dispersion parameters in the visible range are determined by measuring optical transmission spectra. The films are found to have a wider band gap and a smaller refractive index as compared with the single-crystal material.

scholarly journals Precise spectrophotometric method for semitransparent metallic thin-film index determination using interference enhancement

2021 ◽  
Vol 17 (1) ◽  
Author(s):  
Riley Shurvinton ◽  
Fabien Lemarchand ◽  
Antonin Moreau ◽  
Julien Lumeau
Keyword(s):  
Thin Film ◽  
Refractive Index ◽  
Spectrophotometric Method ◽  
Precise Determination ◽  
Visible Range ◽  
Transparent Substrate ◽  
Dielectric Spacer ◽  
Titanium Thin Films ◽  
Absorbing Layer ◽  
Metallic Thin Film

AbstractA precise spectrophotometric method to determine the refractive index of a semitransparent metallic thin film is presented. This method relies on interference enhancement of the measured spectra, employing an opaque substrate with a dielectric spacer layer beneath the absorbing layer of interest to create interference fringes.The resulting spectral oscillations of the stack are highly sensitive to the properties of the top absorbing layer, allowing precise determination of the refractive index via fitting. The performance of this method is verified using simulations in comparison to the typical method of depositing the absorbing thin film directly onto a transparent substrate. An experimental demonstration is made for titanium thin films over the visible range (370-835 nm). The refractive index of these films is extracted from experimental data using a combination of the Modified Drude and Forouhi-Bloomer models. This method showed high repeatability and precision, and is verified for Ti films between 6-70 nm thickness.

Extraordinary optical transmission of periodic array of subwavelength holes within titanium nitride thin film

2017 ◽  
Vol 11 (3) ◽  
pp. 036006 ◽  
Author(s):  
Alireza Shabani ◽  
Mahmood Rezaee Roknabadi ◽  
Mohammad Behdani ◽  
Mehdi Khazaei Nezhad ◽  
Neda Rahmani
Keyword(s):  
Thin Film ◽  
Titanium Nitride ◽  
Optical Transmission ◽  
Extraordinary Optical Transmission ◽  
Periodic Array

scholarly journals A Theoretical Study of Broadband Extraordinary Optical Transmission in Gold Plasmonic Square Nanohole Arrays and its Application on Refractive Index Sensor

2021 ◽  
Author(s):  
Rehan Shafiq ◽  
Javed Iqbal ◽  
Adnan Daud Khan ◽  
Anees Ur Rehman
Keyword(s):  
Refractive Index ◽  
Optical Transmission ◽  
Near Infrared ◽  
Contrast Ratio ◽  
Extraordinary Optical Transmission ◽  
Index Of Refraction ◽  
Practical Significance ◽  
Localized Surface Plasmon ◽  
Refractive Index Sensor ◽  
Plasmonic Sensor

Abstract Extraordinary optical transmission (EOT) behaviour is investigated in a subwavelength plasmonic nanostructure, consisting of a gold film perforated with a square nanohole array and deposited on a silicon dioxide substrate. The essential aspect of the proposed structure is the periodic disorder that enables broadband transmission peaks in the visible and near-infrared region and reduces the structure's size, which mainly arises from the excitation of localized surface plasmon resonances (LSPRs). Optical cavity modes formed in the nanoholes and the hybridization of plasmon modes. Further, the performance of the proposed nanostructure as a plasmonic sensor is analyzed by increasing the index of refraction of the local environment; the EOT exhibit remarkable refractive index sensitivity of up to 944 nm/RIU, a figure of merit of 9.25 and a contrast ratio of 47% are realized. The proposed structure has some practical significance for designing low-cost and effective sensing devices.

scholarly journals Accurate Spectrophotometric Method for Semitransparent Metallic Thin-film Index Determination Using Interference Enhancement

2021 ◽  
Author(s):  
Riley Shurvinton ◽  
Fabien Lemarchand ◽  
Antonin Moreau ◽  
Julien Lumeau
Keyword(s):  
Thin Film ◽  
Refractive Index ◽  
Spectrophotometric Method ◽  
Precise Determination ◽  
Visible Range ◽  
Transparent Substrate ◽  
Dielectric Spacer ◽  
Titanium Thin Films ◽  
Absorbing Layer ◽  
Metallic Thin Film

Abstract An accurate spectrophotometric method to determine the refractive index of a semitransparent metallic thin film is presented. This method relies on interference enhancement of the measured spectra, employing an opaque substrate with a dielectric spacer layer beneath the absorbing layer of interest to create interference fringes. The resulting spectral oscillations of the stack are highly sensitive to the properties of the top absorbing layer, allowing precise determination of the refractive index via fitting. The performance of this method is verified using simulations in comparison to the typical method of depositing the absorbing thin film directly onto a transparent substrate. An experimental demonstration is made for titanium thin films over the visible range (370-835 nm). The refractive index of these films is extracted from experimental data using a combination of the Modified Drude and Forouhi-Bloomer models. This method showed high repeatability and accuracy, and is verified for Ti films between 6-70 nm thickness.

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