scholarly journals KL double core hole pre-edge states of HCl

2018 ◽  
Vol 20 (4) ◽  
pp. 2724-2730 ◽  
Author(s):  
D. Koulentianos ◽  
R. Püttner ◽  
G. Goldsztejn ◽  
T. Marchenko ◽  
O. Travnikova ◽  
...  

The formation of double core hole pre-edge states of the form 1s−12p−1(1,3P)σ*,n for HCl, located on the binding energy scale as deep as 3 keV, has been investigated by means of a high resolution single channel electron spectroscopy technique recently developed for the hard X-ray region.

2018 ◽  
Vol 25 (5) ◽  
pp. 1541-1547 ◽  
Author(s):  
Jagannath ◽  
U. K. Goutam ◽  
R. K. Sharma ◽  
J. Singh ◽  
K. Dutta ◽  
...  

The Hard X-ray Photo-Electron Spectroscopy (HAXPES) beamline (PES-BL14), installed at the 1.5 T bending-magnet port at the Indian synchrotron (Indus-2), is now available to users. The beamline can be used for X-ray photo-emission electron spectroscopy measurements on solid samples. The PES beamline has an excitation energy range from 3 keV to 15 keV for increased bulk sensitivity. An in-house-developed double-crystal monochromator [Si (111)] and a platinum-coated X-ray mirror are used for the beam monochromatization and manipulation, respectively. This beamline is equipped with a high-energy (up to 15 keV) high-resolution (meV) hemispherical analyzer with a microchannel plate and CCD detector system with SpecsLab Prodigy and CasaXPS software. Additional user facilities include a thin-film laboratory for sample preparation and a workstation for on-site data processing. In this article, the design details of the beamline, other facilities and some recent scientific results are described.


1996 ◽  
Vol 11 (4) ◽  
pp. 290-296
Author(s):  
I. C. Madsen ◽  
R. J. Hill ◽  
G. Stereff

A conventional vertical powder diffractometer has been adapted to allow the collection of high-resolution, single-wavelength diffraction data using Co, Cu or Mo radiation. The major modifications are (i) incorporation of an incident beam focusing monochromator attached to the tube shield, (ii) a variable tilt angle of the tube shield to provide a horizontal beam path through the diffractometer (for ease of alignment), (iii) mounting of the entire diffractometer on a single, very stable base-plate, with micrometer-controlled adjustment of the orientation, (iv) inclusion of a knife-edge, micrometer-controlled focusing slit, and (v) use of a range of Soller slits with acceptance angles down to 1.5° 2φ. The performance of the instrument compares favourably with conventional non-monochromated diffractometer data collected from SRM660 LaB6 and monoclinic ZrO2. In particular, the peaks are more symmetric and have narrower widths, and the peak-to-background ratio is much higher, leading to much superior resolution and profile shapes for structure solution and Rietveld refinement.


2002 ◽  
Vol 66 (2) ◽  
Author(s):  
A. Koitzsch ◽  
J. Fink ◽  
M. S. Golden ◽  
K. Karlsson ◽  
O. Jepsen ◽  
...  

2020 ◽  
Author(s):  
Ying-Yi Chang ◽  
Yi-Wei Tsai ◽  
Shih-Chang Weng ◽  
SHIH-LUN CHEN ◽  
Shih-Lin Chang

2012 ◽  
Vol 113-114 ◽  
pp. 43-51 ◽  
Author(s):  
Evgeny V. Kudrik ◽  
Olga Safonova ◽  
Pieter Glatzel ◽  
Janine C. Swarbrick ◽  
Leonardo X. Alvarez ◽  
...  

2013 ◽  
Vol 20 (6) ◽  
pp. 899-904 ◽  
Author(s):  
Atsushi Tokuhisa ◽  
Junya Arai ◽  
Yasumasa Joti ◽  
Yoshiyuki Ohno ◽  
Toyohisa Kameyama ◽  
...  

1969 ◽  
Vol 13 ◽  
pp. 390-405 ◽  
Author(s):  
Ragnar Nordberg

The results reviewed in this article were obtained by means of the ESCA technique at the Institute of Physics, University of Uppsala, Uppsala, Sweden and at the Department of Physics, Vanderbilt University, Nashville, Tennessee, USA.The ESCA technique is basically the study of induced emission of photo and Auger electrons from a sample irradiated with x-rays. If the incident radiation is monochromatic (e.g. an x-ray emission line) the spectrum of these electrons gives precise information about the energy states of the electrons in the sample. To extract this information, high resolution electron spectroscopy is necessary. Instruments for such spectroscopy have therefore been extensively developed during the last decade.


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