Accurate experimental determination of gallium K- and L3-shell XRF fundamental parameters

The fluorescence yield of the K- and L3-shell of gallium was determined using the radiometrically calibrated (reference-free) X-ray fluorescence instrumentation at the BESSY II synchrotron radiation facility.

Download Full-text

Determination of K–L vacancy transfer probabilities of some 3d elements using synchrotron radiation

Canadian Journal of Physics ◽

10.1139/cjp-2014-0552 ◽

2015 ◽

Vol 93 (7) ◽

pp. 760-764 ◽

Cited By ~ 5

Author(s):

Santosh Mirji ◽

A.S. Bennal ◽

Krishnananda ◽

N.M. Badiger ◽

M.K. Tiwari ◽

...

Keyword(s):

Synchrotron Radiation ◽

Energy Resolution ◽

Intensity Ratio ◽

Fluorescence Yield ◽

Silicon Drift Detector ◽

X Ray ◽

3D Elements ◽

Experimental Values ◽

Cu And Zn

The K–L total vacancy transfer probabilities (ηKL) of some 3d elements have been determined using Indus-2 synchrotron radiation. The targets, such as Cr, Cu, and Zn, are excited by using 6.5, 10, and 11 keV synchrotron radiation, respectively. The K X-ray photons are detected with a silicon drift detector, which has an energy resolution of 130 eV at 5.9 keV. By measuring the K-shell fluorescence yield and K X-ray intensity ratio, the K–L vacancy transfer probabilities have been determined. Measured values have been compared with the theoretical values and other experimental values.

Download Full-text

Experimental determination of the x-ray atomic fundamental parameters of nickel

Metrologia ◽

10.1088/1681-7575/aa9b12 ◽

2017 ◽

Vol 55 (1) ◽

pp. 56-66 ◽

Cited By ~ 13

Author(s):

Y Ménesguen ◽

M-C Lépy ◽

P Hönicke ◽

M Müller ◽

R Unterumsberger ◽

...

Keyword(s):

Experimental Determination ◽

X Ray ◽

Fundamental Parameters

Download Full-text

Experimental Determination of Effective Attenuation Length for SiO2 Thin Film with Synchrotron Radiation Photoemission Spectroscopy

IEEJ Transactions on Electronics Information and Systems ◽

10.1541/ieejeiss.130.1817 ◽

2010 ◽

Vol 130 (10) ◽

pp. 1817-1818

Author(s):

Keisuke Inoue ◽

Yuden Teraoka

Keyword(s):

Thin Film ◽

Synchrotron Radiation ◽

Experimental Determination ◽

Photoemission Spectroscopy ◽

Attenuation Length ◽

Sio2 Thin Film ◽

Synchrotron Radiation Photoemission

Download Full-text

Sorption of Se (IV) from aqueous solutions with subsequent determination by X-ray fluorescence analysis

Industrial laboratory Diagnostics of materials ◽

10.26896/1028-6861-2020-86-10-5-9 ◽

2020 ◽

Vol 86 (10) ◽

pp. 5-9

Author(s):

D. G. Filatova ◽

A. A. Arkhipenko ◽

M. A. Statkus ◽

V. V. Es’kina ◽

V. B. Baranovskaya ◽

...

Keyword(s):

Inductively Coupled Plasma ◽

Fluorescence Analysis ◽

Standard Samples ◽

Phase Contact Time ◽

Sorbent Phase ◽

X Ray ◽

Fundamental Parameters ◽

Inductively Coupled ◽

Subsequent Determination

An approach to sorptive separation of Se (IV) from solutions on a novel S,N-containing sorbent with subsequent determination of the analyte in the sorbent phase by micro-x-ray fluorescence method is presented. The sorbent copolymethylenesulfide-N-alkyl-methylenamine (CMA) was synthesized using «snake in the cage» procedure and proven to be stable in acid solutions. Conditions for quantitative extraction of Se (IV) were determined: sorption in 5 M HCl or 0.05 M HNO3 solutions when heated to 60°C, phase contact time being 1 h. The residual selenium content in the solution was determined by inductively coupled plasma mass spectrometry (ICP-MS) using 82Se isotope. The absence of selenium losses is proved and the mechanism of sorption interaction under specified conditions is proposed. The method of micro-x-ray fluorescence analysis (micro-RFA) with mapping revealed a uniform distribution of selenium on the sorbent surface. The possibility of determining selenium in the sorbent phase by micro-RFA is shown. When comparing the obtained results with the results of calculations by the method of fundamental parameters, it is shown the necessity of using standard samples of sorbates to obtain correct results of RFA determination of selenium in the sorbent phase.

Download Full-text