Determination of K–L vacancy transfer probabilities of some 3d elements using synchrotron radiation

2015 ◽  
Vol 93 (7) ◽  
pp. 760-764 ◽  
Author(s):  
Santosh Mirji ◽  
A.S. Bennal ◽  
Krishnananda ◽  
N.M. Badiger ◽  
M.K. Tiwari ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Energy Resolution ◽  
Intensity Ratio ◽  
Fluorescence Yield ◽  
Silicon Drift Detector ◽  
X Ray ◽  
3D Elements ◽  
Experimental Values ◽  
Cu And Zn

The K–L total vacancy transfer probabilities (ηKL) of some 3d elements have been determined using Indus-2 synchrotron radiation. The targets, such as Cr, Cu, and Zn, are excited by using 6.5, 10, and 11 keV synchrotron radiation, respectively. The K X-ray photons are detected with a silicon drift detector, which has an energy resolution of 130 eV at 5.9 keV. By measuring the K-shell fluorescence yield and K X-ray intensity ratio, the K–L vacancy transfer probabilities have been determined. Measured values have been compared with the theoretical values and other experimental values.

Study of the solid-state effect on L3 subshell fluorescence yield for high Z targets using Indus-2 synchrotron radiation

2020 ◽  
Vol 98 (5) ◽  
pp. 470-473
Author(s):  
Gangadharayya B. Hiremath ◽  
A.S. Bennal ◽  
Santosh Mirji ◽  
M.M. Hosamani ◽  
N.M. Badiger ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Solid State ◽  
Synchrotron Radiation ◽  
Oxidation State ◽  
Significant Role ◽  
Chemical Bonding ◽  
Fluorescence Yield ◽  
Silicon Drift Detector ◽  
X Ray ◽  
Experimental Values

L3 subshell fluorescence yields (ω3) have been determined experimentally for the compounds of Hg, Pb, and Bi and Pb element using Indus-2 synchrotron radiation available at RRCAT, India. Compounds with the same chemical bonding and oxidation state but different crystal structure have been selected in the present investigation to understand the effect of solid-state environment on ω3. The characteristic L X-ray spectra of the element and compounds were generated by synchrotron radiation and then recorded with a Vortex-90EX silicon drift detector. By measuring intensities of the characteristic Lα X-ray photons, the ω3 have been determined and compared with theoretical values and other available experimental values. Comparison between the experimental and the theoretical values indicates that the solid-state environment plays a significant role on the ω3 for the selected compounds.

A fast energy-dispersive multi-element detector for X-ray absorption spectroscopy

2009 ◽  
Vol 16 (2) ◽  
pp. 293-298 ◽  
Author(s):  
Edmund Welter ◽  
Karsten Hansen ◽  
Christian Reckleben ◽  
Inge Diehl
Keyword(s):  
Fine Structure ◽  
Absorption Spectroscopy ◽  
Energy Resolution ◽  
Integrated Circuit ◽  
Fluorescence Yield ◽  
Silicon Drift Detector ◽  
Excellent Performance ◽  
High Count ◽  
X Ray ◽  
X Ray Absorption

In this paper results are presented from fluorescence-yield X-ray absorption fine-structure spectroscopy measurements with a new seven-cell silicon drift detector (SDD) module. The complete module, including an integrated circuit for the detector readout, was developed and realised at DESY utilizing a monolithic seven-cell SDD. The new detector module is optimized for applications like XAFS which require an energy resolution of ∼250–300 eV (FWHM Mn Kα) at high count rates. Measurements during the commissioning phase proved the excellent performance for this type of application.

scholarly journals Accurate experimental determination of gallium K- and L3-shell XRF fundamental parameters

2018 ◽  
Vol 33 (6) ◽  
pp. 1003-1013 ◽  
Author(s):  
Rainer Unterumsberger ◽  
Philipp Hönicke ◽  
Julien L. Colaux ◽  
Chris Jeynes ◽  
Malte Wansleben ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Experimental Determination ◽  
Fluorescence Yield ◽  
X Ray ◽  
Fundamental Parameters

The fluorescence yield of the K- and L3-shell of gallium was determined using the radiometrically calibrated (reference-free) X-ray fluorescence instrumentation at the BESSY II synchrotron radiation facility.

K to L shell vacancy transfer probabilities and Auger electron emission ratios for elements in the atomic range 30 ≤ Z ≤ 58

2016 ◽  
Vol 94 (7) ◽  
pp. 679-686 ◽  
Author(s):  
Ferdi Akman
Keyword(s):  
Intensity Ratio ◽  
Fluorescence Yield ◽  
Auger Electrons ◽  
X Ray ◽  
Radioisotope Source ◽  
Experimental Values ◽  
Semi Empirical ◽  
First Time ◽  
Shell Vacancy ◽  
Emission Ratios

The K to L shell vacancy transfer probabilities for some elements in the atomic range 30 ≤ Z ≤ 58 were determined using the semi-empirical values of K shell fluorescence yield and the experimental values of Kβ/Kα X-ray intensity ratio. Furthermore, the KLX/KLL and KXY/KLL Auger electrons emission ratios for the same elements were obtained using the experimental values of Kβ/Kα X-ray intensity ratio. The experiments were performed using a 241Am annular radioisotope source and a high-resolution Si(Li) semiconductor detector. The experimental values of K to L shell vacancy transfer probabilities, and KLX/KLL and KXY/KLL Auger electrons emission ratios were compared with the fitted, theoretical, semi-empirical, and other available experimental values. To the best knowledge of the author, the KLX/KLL and KXY/KLL Auger electrons emission ratios of ruthenium, palladium, and tellurium have been obtained for the first time in the present work.

X‐ray determination of the Debye temperature at high pressure using high‐energy synchrotron radiation

1990 ◽  
Vol 68 (6) ◽  
pp. 2719-2722 ◽  
Author(s):  
A. Matsumuro ◽  
M. Kobayashi ◽  
T. Kikegawa ◽  
M. Senoo
Keyword(s):  
High Pressure ◽  
Synchrotron Radiation ◽  
Debye Temperature ◽  
High Energy ◽  
X Ray

Determination of the alloying content in the matrix of Zr alloys using synchrotron radiation microprobe X-ray fluorescence

2003 ◽  
Vol 321 (2-3) ◽  
pp. 221-232 ◽  
Author(s):  
A Yilmazbayhan ◽  
O Delaire ◽  
A.T Motta ◽  
R.C Birtcher ◽  
J.M Maser ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
X Ray ◽  
The Matrix ◽  
Zr Alloys

scholarly journals Protein–ligand complex structure from serial femtosecond crystallography using soaked thermolysin microcrystals and comparison with structures from synchrotron radiation

2017 ◽  
Vol 73 (8) ◽  
pp. 702-709 ◽  
Author(s):  
Hisashi Naitow ◽  
Yoshinori Matsuura ◽  
Kensuke Tono ◽  
Yasumasa Joti ◽  
Takashi Kameshima ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Room Temperature ◽  
Complex Structure ◽  
Binding Mode ◽  
Ligand Complex ◽  
X Ray ◽  
Cell Parameters ◽  
Serial Femtosecond Crystallography ◽  
Small Molecule Ligand

Serial femtosecond crystallography (SFX) with an X-ray free-electron laser is used for the structural determination of proteins from a large number of microcrystals at room temperature. To examine the feasibility of pharmaceutical applications of SFX, a ligand-soaking experiment using thermolysin microcrystals has been performed using SFX. The results were compared with those from a conventional experiment with synchrotron radiation (SR) at 100 K. A protein–ligand complex structure was successfully obtained from an SFX experiment using microcrystals soaked with a small-molecule ligand; both oil-based and water-based crystal carriers gave essentially the same results. In a comparison of the SFX and SR structures, clear differences were observed in the unit-cell parameters, in the alternate conformation of side chains, in the degree of water coordination and in the ligand-binding mode.

Diffuse x-ray scattering from InGaAs/GaAs quantum dots

2003 ◽  
Vol 799 ◽  
Author(s):  
Rolf Köhler ◽  
Daniil Grigoriev ◽  
Michael Hanke ◽  
Martin Schmidbauer ◽  
Peter Schäfer ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Synchrotron Radiation ◽  
Diffuse Scattering ◽  
Data Evaluation ◽  
X Ray ◽  
X Ray Scattering ◽  
Gaas Matrix ◽  
Wetting Layers ◽  
Ray Scattering

ABSTRACTMulti-fold stacks of In0.6Ga0.4As quantum dots embedded into a GaAs matrix were investigated by means of x-ray diffuse scattering. The measurements were done with synchrotron radiation using different diffraction geometries. Data evaluation was based on comparison with simulated distributions of x-ray diffuse scattering. For the samples under consideration ((001) surface) there is no difference in dot extension along [110] and [-110] and no directional ordering. The measurements easily allow the determination of the average indium amount in the wetting layers. Data evaluation by simulation of x-ray diffuse scattering gives an increase of Incontent from the dot bottom to the dot top.

Determination of strain in moving objects by X-ray diffraction using synchrotron radiation

1988 ◽  
Vol 21 (6) ◽  
pp. 972-974 ◽  
Author(s):  
J. Ihringer ◽  
T. Wroblewski ◽  
A. Küster ◽  
J. K. Maichle
Keyword(s):  
Synchrotron Radiation ◽  
Moving Objects ◽  
X Ray Diffraction ◽  
X Ray
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