A re-evaluation of diffraction from Si(111) 7 × 7: decoding the encoded phase information in the 7 × 7 diffraction pattern
The diffraction features of Si(111) 7 × 7 are analyzed using new X-ray data (top) and found to provide improved agreement for a particular C3v structure (bottom) over earlier measurements and their structural models.
1974 ◽
Vol 32
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pp. 506-507
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1988 ◽
Vol 46
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pp. 846-847
1992 ◽
Vol 50
(2)
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pp. 1190-1191
2020 ◽
Vol 7
(21)
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pp. 4197-4221
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