scholarly journals The effect of post-deposition annealing conditions on structural and thermoelectric properties of sputtered copper oxide films

RSC Advances ◽  
2020 ◽  
Vol 10 (49) ◽  
pp. 29394-29401
Author(s):  
Chandrasekaran Abinaya ◽  
Kevin Bethke ◽  
Virgil Andrei ◽  
Jonas Baumann ◽  
Beatrix Pollakowski-Herrmann ◽  
...  
Keyword(s):  
Thin Films ◽  
Copper Oxide ◽  
Thermoelectric Properties ◽  
Oxide Films ◽  
Thermoelectric Performance ◽  
Annealing Atmosphere ◽  
Oxide Thin Films ◽  
Post Deposition Annealing ◽  
Annealing Conditions ◽  
Post Deposition

This study reveals the interplay between the composition and thermoelectric performance of mixed copper oxide thin films, which can be finely adjusted by varying the annealing atmosphere.

scholarly journals Temperature-dependent phase evolution of copper-oxide thin-films on Au(111)

2018 ◽  
Vol 20 (8) ◽  
pp. 5636-5643 ◽  
Author(s):  
Christoph Möller ◽  
Hanna Fedderwitz ◽  
Claudine Noguera ◽  
Jacek Goniakowski ◽  
Niklas Nilius
Keyword(s):  
Thin Films ◽  
Phase Transitions ◽  
Dft Calculations ◽  
Copper Oxide ◽  
Structural Phase ◽  
Oxide Films ◽  
Phase Evolution ◽  
Structural Phase Transitions ◽  
Oxide Thin Films ◽  
Temperature Dependent

STM and DFT calculations are employed to explore structural phase transitions in thin copper-oxide films grown on Au(111).

Effect of Annealing Atmosphere on the Morphology of Copper Oxide Thin Films Deposited on TiO2 Substrates Prepared by Sol-Gel Process

2013 ◽  
Vol 594-595 ◽  
pp. 113-117 ◽  
Author(s):  
Dewi Suriyani Che Halin ◽  
Ibrahim Abu Talib ◽  
Abdul Razak Daud ◽  
Muhammad Azmi Abdul Hamid
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Grain Size ◽  
Copper Oxide ◽  
Spin Coating ◽  
Sol Gel ◽  
Annealing Atmosphere ◽  
Oxide Thin Films ◽  
Different Temperatures ◽  
Xrd Patterns

Copper oxide films were prepared via sol-gel like spin coating starting from methanolic solutions of cupric chloride onto the TiO2 substrates. Films were obtained by spin coating under room conditions (temperature, 25-30 °C) and were subsequently annealed at different temperatures (200-400 °C) in oxidizing (air) and inert (N2) atmospheres. X-ray diffraction (XRD) patterns showed crystalline phases, which were observed as a function of the annealing conditions. The film composition resulted single or multi-phasic depending on both temperature and atmosphere. The grain size of film was measured using scanning electron microscopy (SEM) and the surface roughness of thin films was characterized by atomic force microscopy (AFM). The grain size of which was annealed in air at 300 °C was 30.39 nm with the surface roughness of 96.16 nm. The effects of annealing atmosphere on the structure and morphology of copper oxide thin films are reported.

Post-deposition annealing of sputtered zinc-oxide thin films

1984 ◽  
Vol 2 (3) ◽  
pp. 237-241 ◽  
Author(s):  
M. Bertolotti ◽  
A. Ferrari ◽  
D. Seite ◽  
A. Jaskow ◽  
A. Palma ◽  
...  
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Oxide Thin Films ◽  
Post Deposition Annealing ◽  
Post Deposition

Changes in electrical and structural properties of indium oxide thin films through post-deposition annealing

2011 ◽  
Vol 520 (1) ◽  
pp. 110-116 ◽  
Author(s):  
Kazuhiro Kato ◽  
Hideo Omoto ◽  
Takao Tomioka ◽  
Atsushi Takamatsu
Keyword(s):  
Thin Films ◽  
Structural Properties ◽  
Indium Oxide ◽  
Oxide Thin Films ◽  
Post Deposition Annealing ◽  
Post Deposition

Influence of post-deposition annealing on the electrical properties of zinc oxide thin films

2014 ◽  
Vol 573 ◽  
pp. 22-26 ◽  
Author(s):  
Hui Kyung Park ◽  
Jaeseung Jo ◽  
Hee Kyeung Hong ◽  
Jaeyeong Heo
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Electrical Properties ◽  
Oxide Thin Films ◽  
Post Deposition Annealing ◽  
Post Deposition

Effects of Annealing Process on the Structural, Optical and Electrical Properties of Copper Oxide Thin Films Grown by Immersion Technique

2016 ◽  
Vol 1133 ◽  
pp. 439-443
Author(s):  
Mohd Fauzee Nurfazliana ◽  
Sharul Ashikin Kamaruddin ◽  
Nayan Nafarizal ◽  
Hashim Saim ◽  
Mohd Zainizan Sahdan
Keyword(s):  
Thin Films ◽  
Copper Oxide ◽  
Oxide Films ◽  
Annealing Process ◽  
Oxide Thin Films ◽  
X Ray ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Large Clusters ◽  
Small Clusters

The synthesized and characterization on the growth of copper oxide thin films on fluorine-doped tin oxide (FTO) coated glass with annealing and without annealing process has been studied by immersion techniques. Furthermore, ZnO layer has been used in order to improved the absorption spectrum of CuO films. The copper oxide films were analyzed on the morphological, structural, optical and electrical by field emission scanning electron microscopy (FESEM), X-ray diffractometer (XRD), UV-Vis spectroscopy (absorbance) and I-V characteristics instruments. The atomic force microscope (AFM) was used in order to characterize the surface imaging of copper oxide films and the thicknesses were measured using a surface profiler. The AFM studies revealed that the roughness of the CuO films increased after annealing was applied this is due to the formation of large clusters of grains from the merging of small clusters grains. The CuO films thicknesses also becomes two times higher than the CuO films without annealing process.

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