Microstructural modulation of organic passivation layers for metal oxide semiconductors to achieve high bias stability
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This study investigates the microstructural control of organic back-channel passivation layers for bias stability enhancement and electrical property tuning of metal oxide thin-film transistors.
2020 ◽
Vol 8
(43)
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pp. 14983-14995
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2019 ◽
Vol 19
(9)
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pp. 5619-5623
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2020 ◽
Vol 35
(11)
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pp. 1103-1109
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2016 ◽
Vol 12
(9)
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pp. 888-891
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2021 ◽
Vol 10
(2)
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pp. 025003
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