Analysis of Electrical Properties Using the four point Probe Method

E3S Web of Conferences ◽

10.1051/e3sconf/20187313019 ◽

2018 ◽

Vol 73 ◽

pp. 13019 ◽

Cited By ~ 3

Author(s):

Richard S. Waremra ◽

Philipus Betaubun

Keyword(s):

Electrical Properties ◽

Probe Method ◽

High Resistivity ◽

Thick Sheet ◽

Electric Characteristic

There has been conducted Physics research on a material, that is, monitoring electric characteristic of a material using four-point probe method. This research measures current and voltage. The result is used to determine resistivity of a material. The research uses 2 samples, that is, chalk and charcoal. The result shows the resistivity of the sample in the form of bulk (t>s) for chalk has high resistivity on voltage of 6.6 Volt. Meanwhile, resistivity on thick sheet (t<s) has high resistivity on voltage of 7 Volt. On the charcoal material, large resistivity (t>s) is in 6 Volt, and on large resistivity (t<s) is in 6.6 Volt.

Download Full-text

Tuning the Electrical Properties of NiO Thin Films by Stoichiometry and Microstructure

Coatings ◽

10.3390/coatings11060697 ◽

2021 ◽

Vol 11 (6) ◽

pp. 697

Author(s):

Yu-He Liu ◽

Xiao-Yan Liu ◽

Hui Sun ◽

Bo Dai ◽

Peng Zhang ◽

...

Keyword(s):

Thin Films ◽

Electrical Properties ◽

Energy Loss ◽

Single Crystal ◽

Oxygen Stoichiometry ◽

High Resistivity ◽

Edge Structure ◽

Glass Substrates ◽

Lower Resistivity

Here, the electrical properties of NiO thin films grown on glass and Al2O3 (0001) substrates have been investigated. It was found that the resistivity of NiO thin films strongly depends on oxygen stoichiometry. Nearly perfect stoichiometry yields extremely high resistivity. In contrast, off-stoichiometric thin films possess much lower resistivity, especially for oxygen-rich composition. A side-by-side comparison of energy loss near the edge structure spectra of Ni L3 edges between our NiO thin films and other theoretical spectra rules out the existence of Ni3+ in NiO thin films, which contradicts the traditional hypothesis. In addition, epitaxial NiO thin films grown on Al2O3 (0001) single crystal substrates exhibit much higher resistivity than those on glass substrates, even if they are deposited simultaneously. This feature indicates the microstructure dependence of electrical properties.

Download Full-text

Electrical Properties of High‐Resistivity Nickel‐Doped Silicon

Journal of Applied Physics ◽

10.1063/1.1659275 ◽

1970 ◽

Vol 41 (6) ◽

pp. 2644-2647 ◽

Cited By ~ 16

Author(s):

W. B. Chua ◽

K. Rose

Keyword(s):

Electrical Properties ◽

High Resistivity ◽

Doped Silicon

Download Full-text

Tailoring the Structural and Electrical Properties of Ba–Zn–Co M-Type Hexaferrites by Lanthanum Substitution for High-Resistivity Applications

Journal of Superconductivity and Novel Magnetism ◽

10.1007/s10948-020-05750-5 ◽

2020 ◽

Author(s):

M. Imran Arshad ◽

S. Nadeem ◽

N. Amin ◽

Khalid Mahmood ◽

M. Ramzan ◽

...

Keyword(s):

Electrical Properties ◽

High Resistivity ◽

Structural And Electrical Properties

Download Full-text

Variable Range Hopping Resistivity in La2-xSrxCuO4 Nanoparticles Evaluated by Four Point Probe Method

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.860.142 ◽

2020 ◽

Vol 860 ◽

pp. 142-147

Author(s):

Suci Winarsih ◽

Faisal Budiman ◽

Hirofumi Tanaka ◽

Tadashi Adachi ◽

Takayuki Goto ◽

...

Keyword(s):

Temperature Dependence ◽

Thermal Activation ◽

Resistivity Measurement ◽

Probe Method ◽

Charge Carriers ◽

High Resistivity ◽

Variable Range Hopping ◽

Variable Range ◽

Hopping Model ◽

Variable Range Hopping Model

We report the results of the resistivity measurement on La2-xSrxCuO4 nanoparticles with x = 0, 0.05, and 0.20 evaluated by the four-point probe method. The high resistivity value shows the predominance of the inter-grain part. The temperature dependence of the conductivity can be analyzed by variable range hopping model showing the charge carriers are formed by thermal activation. There is no superconducting behavior that could be observed in La2-xSrxCuO4 nanoparticles with x = 0.05 and 0.20.

Download Full-text

Electrical properties of deuteron irradiated high resistivity silicon

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2014.01.021 ◽

2014 ◽

Vol 325 ◽

pp. 107-114 ◽

Cited By ~ 5

Author(s):

Jerzy Krupka ◽

Waldemar Karcz ◽

Sergej P. Avdeyev ◽

Paweł Kamiński ◽

Roman Kozłowski

Keyword(s):

Electrical Properties ◽

High Resistivity ◽

High Resistivity Silicon

Download Full-text

The effect of stoichiometry on the microstructure and properties of lead lanthanum titanate thin films

Journal of Materials Research ◽

10.1557/jmr.1995.2777 ◽

1995 ◽

Vol 10 (11) ◽

pp. 2777-2787 ◽

Cited By ~ 19

Author(s):

Ashraf R. Khan ◽

Seshu B. Desu

Keyword(s):

Thin Films ◽

Electrical Properties ◽

Relative Permittivity ◽

Room Temperature ◽

Optical Transmittance ◽

High Resistivity ◽

Charge Storage ◽

Electrical Measurements ◽

Storage Density ◽

Lanthanum Titanate

Thin films of Lead Lanthanum Titanate (PLT) corresponding to 28 at. % of La were prepared by the metal-organic decomposition (MOD) process. The films were fabricated from two solutions of different composition. The composition of the first solution was determined, assuming that the incorporation of La3+ in the PbTiO3 structure gives rise to A-site or Pb vacancies, whereas for the composition of the other solution the creation of B-site or Ti vacancies was assumed. The effect of excess lead on the microstructure and the optical and electrical properties was studied for 0% to 20% excess PbO. The x-ray diffraction patterns of all films at room temperature indicated a cubic structure with a lattice constant of 3.92 Å. Optical and electrical measurements showed the films made assuming B-site vacancies had better properties. In general, excess PbO was found to improve the optical transmittance as well as the electrical properties of films. However, in films assuming the formation of B-site vacancies, PLT showed improved electrical properties only up to 5–10% excess PbO, while higher PbO additions had a deleterious effect. The films had a high resistivity, good relative permittivity, low loss, very low leakage current density, and high charge storage density. A type-B film with 10% excess Pb had a relative permittivity of 1340 at 100 kHz and a charge storage density of around 16.1 μC/cm2 at a field of 200 kV/cm at room temperature.

Download Full-text

Processing Effect of Injection Molded Nanoparticle/Polymer Composites on their Resistivity

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.314-316.2531 ◽

2011 ◽

Vol 314-316 ◽

pp. 2531-2538

Author(s):

Hai Hong Wu ◽

Yong Feng Cheng ◽

Ai Yun Jiang ◽

Bao Feng Zhang

Keyword(s):

Electrical Properties ◽

Polymer Composites ◽

Injection Pressure ◽

Nano Particles ◽

High Resistivity ◽

Packing Pressure ◽

High Injection Pressure ◽

Injection Molded ◽

Skin Zone ◽

The Relationship

In order to improve the application of nano-particles/polymer composite, we investigated the relationship between microstructures and electrical properties on injection molded composites made from carbon black(CB) particles mixed with polypropylene(PP). Standard tensile specimens were injected under different processing conditions, after which, the specimens were cut off along the surface to observe the microstructures at different positions of the moldings. The microstructures were observed with Scanning Electrical Microscope(SEM), and electrical properties were measured by using a two-terminal standard resistor under DC condition at room temperature. The results showed that CB nano-particles may form the best conductive path under the higher packing pressure combined higher injection pressure. If packing pressure is low, the resistivities at the skin zone loaded by high injection pressure are smaller than low injection pressure, but the resistivities increase at the sub-skin zone. We found that the sub-skin zone is a high resistivity district which would expand with higher injection pressure matched lower packing pressure. Contrast to the injection molded polymer whose microstructural orientation is stronger at the sub-skin zones, injection molded CB particles/polymer composites develop strong oriented microstructures at the core zones in stead of the skin or sub-skin zones due to CB particles’ migration.

Download Full-text