Characterization of a multi-keV x-ray source produced by nanosecond laser irradiation of a solid target: The influence of laser focus spot and target thickness

2008 ◽  
Vol 15 (2) ◽  
pp. 023103 ◽  
Author(s):  
Guang-Yue Hu ◽  
Jian Zheng ◽  
Bai-fei Shen ◽  
An-le Lei ◽  
Shen-Ye Liu ◽  
...  
Keyword(s):  
Laser Irradiation ◽  
Target Thickness ◽  
Nanosecond Laser ◽  
Solid Target ◽  
X Ray ◽  
Laser Focus ◽  
Focus Spot

scholarly journals Preparation and characterization of polyani-line/polyvinyl alcohol nanocomposite by laser irradiation

2017 ◽  
Vol 6 (4) ◽  
pp. 77
Author(s):  
N A M Shahin ◽  
S Abd El Mongy ◽  
R Kamal ◽  
A B El- Bially ◽  
A A Shabaka ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Relaxation Time ◽  
Polyvinyl Alcohol ◽  
Laser Irradiation ◽  
Imaginary Part ◽  
Electronic Transition ◽  
X Ray Diffraction ◽  
X Ray ◽  
Amorphous Nature

Polyaniline (PANI) - Polyvinyl alcohol (PVA) nanocomposite were prepared using laser irradiation method. X-ray diffraction results showed that, (PANI/PVA) nanocomposite exhibited amorphous nature of polymer. The electronic transition will be studied using Ultraviolet-Visible spectrometer (UV-Vis). The real part of dielectric constant (έ) and imaginary part (ε") were studied. Also, the relaxation time was calculated.

Ion acceleration with a narrow energy spectrum by nanosecond laser-irradiation of solid target

2016 ◽  
Vol 87 (2) ◽  
pp. 02A914 ◽  
Author(s):  
C. Altana ◽  
G. Lanzalone ◽  
D. Mascali ◽  
A. Muoio ◽  
G. A. P. Cirrone ◽  
...  
Keyword(s):  
Energy Spectrum ◽  
Laser Irradiation ◽  
Ion Acceleration ◽  
Nanosecond Laser ◽  
Solid Target

Detailed characterization of the early x-ray emission of a plasma produced by point-like laser irradiation of solid Al targets

2005 ◽  
Vol 12 (8) ◽  
pp. 083101 ◽  
Author(s):  
L. Labate ◽  
C. A. Cecchetti ◽  
M. Galimberti ◽  
A. Giulietti ◽  
D. Giulietti ◽  
...  
Keyword(s):  
Laser Irradiation ◽  
Detailed Characterization ◽  
X Ray

scholarly journals Development of an Experimental Platform for Combinative Use of an XFEL and a High-Power Nanosecond Laser

2020 ◽  
Vol 10 (7) ◽  
pp. 2224 ◽  
Author(s):  
Yuichi Inubushi ◽  
Toshinori Yabuuchi ◽  
Tadashi Togashi ◽  
Keiichi Sueda ◽  
Kohei Miyanishi ◽  
...  
Keyword(s):  
Laser Irradiation ◽  
High Power ◽  
Large Angle ◽  
Nanosecond Laser ◽  
Diffraction Measurement ◽  
Single Shot ◽  
X Ray Diffraction ◽  
X Ray ◽  
Experimental Platform

We developed an experimental platform for combinative use of an X-ray free electron laser (XFEL) and a high-power nanosecond laser. The main target of the platform is an investigation of matter under high-pressure states produced by a laser-shock compression. In this paper, we show details of the experimental platform, including XFEL parameters and the focusing optics, the laser irradiation system and X-ray diagnostics. As a demonstration of the high-power laser-pump XFEL-probe experiment, we performed an X-ray diffraction measurement. An in-situ single-shot X-ray diffraction pattern expands to a large angle side, which shows a corundum was compressed by laser irradiation.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

High Resolution Replication of Organoclay Surfaces

1982 ◽  
Vol 40 ◽  
pp. 576-577
Author(s):  
W. W. Barker ◽  
W. E. Rigsby ◽  
V. J. Hurst ◽  
W. J. Humphreys
Keyword(s):  
Clay Mineral ◽  
Organic Molecule ◽  
Organic Molecules ◽  
X Ray Diffraction ◽  
Xrd Pattern ◽  
X Ray ◽  
Naturally Occurring ◽  
Silicate Layers ◽  
Mineral Identification

Experimental clay mineral-organic molecule complexes long have been known and some of them have been extensively studied by X-ray diffraction methods. The organic molecules are adsorbed onto the surfaces of the clay minerals, or intercalated between the silicate layers. Natural organo-clays also are widely recognized but generally have not been well characterized. Widely used techniques for clay mineral identification involve treatment of the sample with H2 O2 or other oxidant to destroy any associated organics. This generally simplifies and intensifies the XRD pattern of the clay residue, but helps little with the characterization of the original organoclay. Adequate techniques for the direct observation of synthetic and naturally occurring organoclays are yet to be developed.

Digital x-ray mapping of nanometer-size supported bimetallic catalysts

1988 ◽  
Vol 46 ◽  
pp. 530-531
Author(s):  
L. T. Germinario
Keyword(s):  
Background Radiation ◽  
Metal Cluster ◽  
Single Element ◽  
Beam Diameter ◽  
X Rays ◽  
X Ray ◽  
Major Interest ◽  
Induced Changes

Understanding the role of metal cluster composition in determining catalytic selectivity and activity is of major interest in heterogeneous catalysis. The electron microscope is well established as a powerful tool for ultrastructural and compositional characterization of support and catalyst. Because the spatial resolution of x-ray microanalysis is defined by the smallest beam diameter into which the required number of electrons can be focused, the dedicated STEM with FEG is the instrument of choice. The main sources of errors in energy dispersive x-ray analysis (EDS) are: (1) beam-induced changes in specimen composition, (2) specimen drift, (3) instrumental factors which produce background radiation, and (4) basic statistical limitations which result in the detection of a finite number of x-ray photons. Digital beam techniques have been described for supported single-element metal clusters with spatial resolutions of about 10 nm. However, the detection of spurious characteristic x-rays away from catalyst particles produced images requiring several image processing steps.

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