Structural and electrical characteristics of InSb thin films grown by rf sputtering

1976 ◽  
Vol 47 (8) ◽  
pp. 3630-3639 ◽  
Author(s):  
J. E. Greene ◽  
C. E. Wickersham







2021 ◽  
Vol 33 (1) ◽  
pp. 101229
Author(s):  
A. Ismail ◽  
M.J. Abdullah ◽  
M.A. Qaeed ◽  
Mohammed A. Khamis ◽  
Bandar Ali AL-Asbahi ◽  
...  


1988 ◽  
Vol 135 ◽  
Author(s):  
S. Yeh ◽  
D. J. Cheng ◽  
G. F. Chi ◽  
M. T. Chu

AbstractPolycrystalline InSb thin films have been prepared by the two-source thermal co-evaporation method. The InSb films have been grown on both pure Si (100) substrate and on Si (100) substrate which has been thermally oxidized to form a thin amorphous SiOx overlayer. The as-grown films have been heat treated under N2 atmosphere at different temperatures ranged from 520 to 535 C. Both as-grown films have (220) diffraction as the main peak. The heat treated films which have high mobility values show the (111) preferred orientation. For the heat treated film on oxidized Si substrate, the TEM cross sectional morphologies show the existence of the precipitaion of the second phase and the interface diffusion of InSb into the SiOx layer.



2019 ◽  
Vol 7 (17) ◽  
pp. 10696-10701 ◽  
Author(s):  
Fábio G. Figueiras ◽  
J. Ramiro A. Fernandes ◽  
J. P. B. Silva ◽  
Denis O. Alikin ◽  
Eugénia C. Queirós ◽  
...  

Thriving ferroelectric oxide Bi2ZnTiO6 thin films with a 1.48 eV optical gap.



2010 ◽  
Vol 43 (5) ◽  
pp. 055402 ◽  
Author(s):  
Ocal Tuna ◽  
Yusuf Selamet ◽  
Gulnur Aygun ◽  
Lutfi Ozyuzer


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