Coherence-based edge diffraction sharpening of x-ray images: A simple model

1999 ◽  
Vol 85 (7) ◽  
pp. 3406-3408 ◽  
Author(s):  
G. Margaritondo ◽  
G. Tromba
Keyword(s):  
Simple Model ◽  
X Ray ◽  
Edge Diffraction

scholarly journals X-ray and UV Radiation Damage of dsDNA/Protein Complexes

Molecules ◽  
2021 ◽  
Vol 26 (11) ◽  
pp. 3132
Author(s):  
Paweł Wityk ◽  
Dorota Kostrzewa-Nowak ◽  
Beata Krawczyk ◽  
Michał Michalik ◽  
Robert Nowak
Keyword(s):  
Dna Damage ◽  
Simple Model ◽  
Uv Radiation ◽  
Protein Complexes ◽  
Chemical Processes ◽  
Model Systems ◽  
Degradation Pathways ◽  
X Ray ◽  
Physico Chemical ◽  
Sensitization Process

Radiation and photodynamic therapies are used for cancer treatment by targeting DNA. However, efficiency is limited due to physico-chemical processes and the insensitivity of native nucleobases to damage. Thus, incorporation of radio- and photosensitizers into these therapies should increase both efficacy and the yield of DNA damage. To date, studies of sensitization processes have been performed on simple model systems, e.g., buffered solutions of dsDNA or sensitizers alone. To fully understand the sensitization processes and to be able to develop new efficient sensitizers in the future, well established model systems are necessary. In the cell environment, DNA tightly interacts with proteins and incorporating this interaction is necessary to fully understand the DNA sensitization process. In this work, we used dsDNA/protein complexes labeled with photo- and radiosensitizers and investigated degradation pathways using LC-MS and HPLC after X-ray or UV radiation.

GROWTH OF OXIDE LAYER ON GERMANIUM (011) SUBSTRATE UNDER DRY AND WET ATMOSPHERES

1999 ◽  
Vol 06 (06) ◽  
pp. 1053-1060 ◽  
Author(s):  
N. TABET ◽  
J. AL-SADAH ◽  
M. SALIM
Keyword(s):  
Simple Model ◽  
Oxide Film ◽  
Growth Kinetics ◽  
Photoelectron Spectroscopy ◽  
Early Stage ◽  
X Ray ◽  
Apparent Thickness ◽  
Different Temperatures ◽  
Kinetics Of

X-ray Photoelectron Spectroscopy (XPS) has been used to investigate the oxidation of (011) Ge substrates. The sample surfaces were CP4-etched, then annealed in situ, at different temperatures, for various durations. Dry and wet atmospheres were used. The oxidation rate during the early stage was increased by the presence of moisture in the atmosphere. A simple model was used to define and determine an apparent thickness of the oxide film from XPS measurements. The time dependence of the apparent thickness is consistent with a partial coverage of the surface by oxide islands. The growth kinetics of the oxide islands obeys a nearly cubic law.

Some Observations on X-Ray Emission as a Function of Accelerating Voltage in the Microprobe

1964 ◽  
Vol 8 ◽  
pp. 384-399
Author(s):  
D. L. Burk
Keyword(s):  
Experimental Data ◽  
Simple Model ◽  
Atomic Number ◽  
X Ray ◽  
Absorption Wavelength

AbstractData are presented from several systems for which the emitted X-ray intensity goes through a maximum as accelerating voltage is increased. An attempt is made to systematize the data in terms of absorption, wavelength, and atomic number. A very simple model, analyzed graphically, is capable of displaying many of the features of the experimental data.

Energy Resolution of STJ X-Ray Detectors with Killed Electrode. Simple Model

2012 ◽  
Vol 167 (3-4) ◽  
pp. 404-409
Author(s):  
V. A. Andrianov ◽  
L. V. Filippenko
Keyword(s):  
Simple Model ◽  
Energy Resolution ◽  
X Ray

Mechanism of the morphotropic transformation between the rutile and corundum structural types

2003 ◽  
Vol 59 (4) ◽  
pp. 456-462 ◽  
Author(s):  
H. Katzke ◽  
R. Schlögl
Keyword(s):  
Simple Model ◽  
Phase Segregation ◽  
Transformation Process ◽  
Transformation Mechanism ◽  
One Dimensional ◽  
X Ray ◽  
Structural Types ◽  
Crystallographic Shear ◽  
Diffraction Patterns ◽  
Shear Planes

The rutile/corundum structural transformation which is based on crystallographic shear is discussed in terms of a one-dimensional disorder model. The transformation process is described by a simple model based on the structural relationship between the rutile-type and corundum-type phases. The model is able to handle randomly spaced crystallographic shear planes, the so-called Wadsley defects, as well as clustered CS planes. Calculations hsow that simply modifying the probability parameters of the model can lead to phase segregation. X-ray powder diffraction patterns are calculated for the proposed transformation mechanism as a function of the stoichiometry x in MO2−x in order to show the influence of such defects on the intensities and linewidths of the Bragg reflections.

scholarly journals A simple model for soft X-ray conversion efficiency from laser-irradiated gold disk targets

1984 ◽  
Vol 2 (3) ◽  
pp. 303-307 ◽  
Author(s):  
P. H. Y. Lee ◽  
H. G. Ahlstrom
Keyword(s):  
Heat Conduction ◽  
Simple Model ◽  
Conversion Efficiency ◽  
Laser Light ◽  
Laser Intensity ◽  
Laser Energy ◽  
High Irradiance ◽  
X Rays ◽  
X Ray ◽  
Laser Heated

Simple arguments are used to construct a model to explain the conversion efficiency of absorbed laser energy into soft X-rays from laser-irradiated targets. In this model, we postulate that the energy available for conversion is bounded at some low irradiance limit by heat conduction away from the laser heated spot, while at some high irradiance limit it is bounded by the energy lost in plasma blowoff. Consequently, at some appropriate laser intensity, where the sum energy of the conduction and blowoff losses is at a minimum, the X-ray conversion efficiency should reach a maximum. A specific example for gold disk targets irradiated by 0·53 μm laser light will be treated. Simple heuristic scalings of blowoff and conduction as functions of laser intensity are obtained.

scholarly journals A simple model for dynamic small-angle X-ray diffraction in colloidal crystals

2007 ◽  
Vol 40 (1) ◽  
pp. 144-150 ◽  
Author(s):  
Alex G. F. de Beer ◽  
Andrei V. Petukhov
Keyword(s):  
Simple Model ◽  
Small Angle ◽  
Colloidal Crystals ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Patterns

A simple model is presented that allows calculation of the small-angle X-ray diffraction patterns of perfect colloidal crystals. The model is based on the Wentzel–Kramers–Brillouin approximation and permits a straightforward evaluation of multibeam interactions. Results are illustrated by several examples.

Evolution of Residual Stresses in Thin Films Deposited on Mechanically Strained Substrates

1990 ◽  
Vol 203 ◽  
Author(s):  
G. Sheikh ◽  
A. Berger ◽  
I. C. Noyan
Keyword(s):  
Thin Films ◽  
Simple Model ◽  
Residual Stresses ◽  
Vapor Phase ◽  
X Ray Diffraction ◽  
Total Stress ◽  
X Ray ◽  
Cu Films ◽  
Residual Film ◽  
Nickel Substrates

ABSTRACTA simple model for the formation of residual stresses in thin films deposited on elastically strained substrates was derived and experimentally tested. In the experiments, Cu thin films were deposited on elastically stretched nickel substrates. These Cu films were2 to 4.m thick and were deposited through vapor phase evaporation or electroplating. The loads applied during the deposition were then relaxed, and the total stress in both the film and the substrate were monitored (by x-ray diffraction) during this relaxation. It was seen that the final (residual) film stresses were significantly different for bothdeposition methods. The causes of such differences are discussed.

A Simple Model for Predicating Dielectric Constant of CaCu3Ti4O12-SrTiO3 Composite Ceramics

2011 ◽  
Vol 689 ◽  
pp. 24-28
Author(s):  
Hong Tao Yu ◽  
Wen Bo Zhang ◽  
Jing Song Liu ◽  
Lin Hong Cao ◽  
Han Xing Liu
Keyword(s):  
Dielectric Constant ◽  
Simple Model ◽  
Complex Impedance ◽  
Impedance Spectra ◽  
Composite Ceramics ◽  
X Ray Diffraction ◽  
X Ray ◽  
Grain Sizes ◽  
Complex Impedance Spectra ◽  
Variation Tendency

In this work, we have proposed a simple model to predicte the dielectric constant of CaCu3Ti4O12-SrTiO3composite ceramics. The model has been established based on the analysis of composition and microstructure. Two different compositions in the composite ceramics correspond to two different grain sizes, large for CaCu3Ti4O12, and small for SrTiO3, which has been identified by the x-ray diffraction, the scanning electron microscope and the energy spectrum analysis. All specimens have been assumed to be the barrier layer dielectrics in the model, according to the complex impedance spectra. The dielectric constant of serial, parallel, and logarithmic mixture models has been discussed. Compared with the experimental results, the model shows the similar variation tendency as SrTiO3content increases.

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