Evaluation of the performance of erasable marker pen ink for the development of indentations on documents upon surface charging by electrostatic detection device

Author(s):  
Nabeesathul Sumayya Mohamed Sadiq ◽  
Izliana Izyanti Abdullah ◽  
Siti Nur Musliha Mohamad Noor ◽  
Kong Yong Wong ◽  
Kah Haw Chang ◽  
...  
Keyword(s):  
Author(s):  
T.C. Sheu ◽  
S. Myhajlenko ◽  
D. Davito ◽  
J.L. Edwards ◽  
R. Roedel ◽  
...  

Liquid encapsulated Czochralski (LEC) semi-insulating (SI) GaAs has applications in integrated optics and integrated circuits. Yield and device performance is dependent on the homogeniety of the wafers. Therefore, it is important to characterise the uniformity of the GaAs substrates. In this respect, cathodoluminescence (CL) has been used to detect the presence of crystal defects and growth striations. However, when SI GaAs is examined in a scanning electron microscope (SEM), there will be a tendency for the surface to charge up. The surface charging affects the backscattered and secondary electron (SE) yield. Local variations in the surface charge will give rise to contrast (effectively voltage contrast) in the SE image. This may be associated with non-uniformities in the spatial distribution of resistivity. Wakefield et al have made use of “charging microscopy” to reveal resistivity variations across a SI GaAs wafer. In this work we report on CL imaging, the conditions used to obtain “charged” SE images and some aspects of the contrast behaviour.


Author(s):  
Sheng‐Te Chang ◽  
Wen‐Yi Dong ◽  
Kai‐Cheng Chen ◽  
Yan He ◽  
Yi‐An Yen ◽  
...  

2020 ◽  
Vol 22 (35) ◽  
pp. 20123-20142
Author(s):  
Hadi Saboorian-Jooybari ◽  
Zhangxin Chen

This research work is directed at development of accurate physics-based formulas for quantification of curvature-dependence of surface potential, surface charge density, and total surface charge for cylindrical and spherical charged particles immersed in a symmetrical electrolyte solution.


2015 ◽  
Vol 43 (9) ◽  
pp. 2901-2906
Author(s):  
Justin J. Likar ◽  
Robert E. Lombardi ◽  
Alexander L. Bogorad ◽  
Roman Herschitz

2021 ◽  
Vol 45 (7) ◽  
pp. 377-387
Author(s):  
Gwang-Wook Hong ◽  
Jihyun Kim ◽  
Hyu-Soung Shin ◽  
Taeil Chung

1994 ◽  
Vol 354 ◽  
Author(s):  
Junzo Ishikawa

AbstractNegative-ion implantation is a promising technique for forthcoming ULSI (more than 256 M bits) fabrication and TFT (for color LCD) fabrication, since the surface charging voltage of insulated electrodes or insulators implanted by negative ions is found to saturate within so few as several volts, no breakdown of insulators would be expected without a charge neutralizer in these fabrication processes. Scatter-less negative-ion implantation into powders is also possible. For this purpose an rf-plasma-sputter type heavy negative-ion source was developed, which can deliver several milliamperes of various kinds of negative ion currents such as boron, phosphor, silicon, carbon, copper, oxygen, etc. A medium current negative-ion implanter with a small version of this type of ion source has been developed.


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