Effect of annealing temperature on interfacial and electrical performance of Au–Pt–Ti/HfAlO/InAlAs metal–oxide–semiconductor capacitor
2016 ◽
Vol 10
(9)
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pp. 703-707
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2017 ◽
Vol 11
(9)
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pp. 1700180
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2019 ◽
Vol 467-468
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pp. 1161-1169
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2017 ◽
Vol 178
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pp. 182-185
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2019 ◽
Vol 7
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pp. 744-753
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