scholarly journals Features of static and dynamic friction profiles in one and two dimensions on polymer and atomically flat surfaces using atomic force microscopy

2008 ◽  
Vol 100 (1) ◽  
pp. 012045
Author(s):  
G S Watson ◽  
J A Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Two Dimensions ◽  
Dynamic Friction ◽  
Flat Surfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomically Flat

scholarly journals Dynamic friction energy dissipation and enhanced contrast in high frequency bimodal atomic force microscopy

Friction ◽  
2021 ◽  
Author(s):  
Xinfeng Tan ◽  
Dan Guo ◽  
Jianbin Luo
Keyword(s):  
Atomic Force Microscopy ◽  
Energy Dissipation ◽  
Contact Friction ◽  
Measuring Instruments ◽  
Dynamic Friction ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Friction Energy ◽  
New Applications

AbstractDynamic friction occurs not only between two contact objects sliding against each other, but also between two relative sliding surfaces several nanometres apart. Many emerging micro- and nano-mechanical systems that promise new applications in sensors or information technology may suffer or benefit from noncontact friction. Herein we demonstrate the distance-dependent friction energy dissipation between the tip and the heterogeneous polymers by the bimodal atomic force microscopy (AFM) method driving the second order flexural and the first order torsional vibration simultaneously. The pull-in problem caused by the attractive force is avoided, and the friction dissipation can be imaged near the surface. The friction dissipation coefficient concept is proposed and three different contact states are determined from phase and energy dissipation curves. Image contrast is enhanced in the intermediate setpoint region. The work offers an effective method for directly detecting the friction dissipation and high resolution images, which overcomes the disadvantages of existing methods such as contact mode AFM or other contact friction and wear measuring instruments.

scholarly journals Modeling noncontact atomic force microscopy resolution on corrugated surfaces

2012 ◽  
Vol 3 ◽  
pp. 230-237 ◽  
Author(s):  
Kristen M Burson ◽  
Mahito Yamamoto ◽  
William G Cullen
Keyword(s):  
Atomic Force Microscopy ◽  
Flat Surface ◽  
Van Der Waals Interactions ◽  
Force Microscopy ◽  
Atomic Force ◽  
Corrugated Surfaces ◽  
High Resolution Images ◽  
Atomically Flat ◽  
Technological Interest ◽  
Crystalline Surfaces

Key developments in NC-AFM have generally involved atomically flat crystalline surfaces. However, many surfaces of technological interest are not atomically flat. We discuss the experimental difficulties in obtaining high-resolution images of rough surfaces, with amorphous SiO2 as a specific case. We develop a quasi-1-D minimal model for noncontact atomic force microscopy, based on van der Waals interactions between a spherical tip and the surface, explicitly accounting for the corrugated substrate (modeled as a sinusoid). The model results show an attenuation of the topographic contours by ~30% for tip distances within 5 Å of the surface. Results also indicate a deviation from the Hamaker force law for a sphere interacting with a flat surface.

scholarly journals Statistics of Sliding on Periodic and Atomically Flat Surfaces

2021 ◽  
Vol 7 ◽  
Author(s):  
Maja Srbulovic ◽  
Konstantinos Gkagkas ◽  
Carsten Gachot ◽  
András Vernes
Keyword(s):  
Equations Of Motion ◽  
Two Dimensions ◽  
Analytical Models ◽  
Fourier Series Expansion ◽  
Stick Slip ◽  
Time Resolved ◽  
Flat Surfaces ◽  
Atomic Force ◽  
Reaction Forces ◽  
Atomically Flat

Among the so-called analytical models of friction, the most popular and widely used one, the Prandtl-Tomlinson model in one and two dimensions is considered here to numerically describe the sliding of the tip within an atomic force microscope over a periodic and atomically flat surface. Because in these PT-models, the Newtonian equations of motion for the AFM-tip are Langevin-type coupled stochastic differential equations the resulting friction and reaction forces must be statistically correctly determined and interpreted. For this, it is firstly shown that the friction and reaction forces as averages of the time-resolved ones over the sliding part, are normally (Gaussian) distributed. Then based on this, an efficient numerical scheme is developed and implemented to accurately estimate the means and standard deviations of friction and reaction forces without performing too many repetitions for the same sliding experiments. The used corrugation potential is the simplest one obtained from the Fourier series expansion of the two-dimensional (2D) periodic potential, e.g., for an fcc(111) surface, which permits sliding on both commensurate and incommensurate paths. In this manner, it is proven that the PT-models predict both frictional regimes, namely the structural superlubricity and stick-slip along (in)commensurate sliding paths, if the ratio of mean corrugation and elastic energies is properly set.

Atomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip

2019 ◽  
Vol 25 (05) ◽  
pp. 1106-1111 ◽  
Author(s):  
Zhe Chen ◽  
Jiawei Luo ◽  
Ivo Doudevski ◽  
Sema Erten ◽  
Seong H. Kim
Keyword(s):  
Atomic Force Microscopy ◽  
Three Dimensional ◽  
Finite Size ◽  
Simple Algorithm ◽  
Cutting Edge ◽  
Razor Blade ◽  
Flat Surfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Height Data

AbstractAtomic force microscopy (AFM) is typically used for analysis of relatively flat surfaces with topographic features smaller than the height of the AFM tip. On flat surfaces, it is relatively easy to find the object of interest and deconvolute imaging artifacts resulting from the finite size of the AFM tip. In contrast, AFM imaging of three-dimensional objects much larger than the AFM tip height is rarely attempted although it could provide topographic information that is not readily available from two-dimensional imaging, such as scanning electron microscopy. In this paper, we report AFM measurements of a vertically-mounted razor blade, which is taller and sharper than the AFM tip. In this case, the AFM height data, except for the data collected around the cutting edge of the blade, reflect the shape of the AFM tip. The height data around the apex area are effectively the convolution of the AFM tip and the blade cutting edge. Based on computer simulations mimicking an AFM tip scanning across a round sample, a simple algorithm is proposed to deconvolute the AFM height data of an object taller and sharper than the AFM tip and estimate its effective curvature.

Microstructures in Lubricant Thin Layers at the Magnetic Disk Surface, Observed Using Cryogenic Atomic Force Microscopy

2006 ◽  
Vol 59 (6) ◽  
pp. 394
Author(s):  
Teiji Kato ◽  
Takayuki Nakakawaji
Keyword(s):  
Atomic Force Microscopy ◽  
Disk Surface ◽  
Thin Layers ◽  
Solid Surfaces ◽  
Carbon Overcoat ◽  
Magnetic Disk ◽  
Force Microscopy ◽  
Atomic Force ◽  
Pfpe Lubricant ◽  
Atomically Flat

Cryogenic Atomic Force Microscopy (AFM) was used to observe perfluoropolyether (PFPE) lubricant molecules at atomically flat solid surfaces and at a magnetic disk surface to understand the lubricity of ultra-thin (1 nm) lubricant layers at the hard disk surface. Molecular imaging of PFPE lubricant molecules reveals the formation of reversed micelle structures at comparatively non-polar solid surfaces such as gold or the carbon overcoat of magnetic disks.

Data Analysis Technique of Atomic Force Microscopy for Atomically Flat Silicon Surfaces

2009 ◽  
Vol E92-C (5) ◽  
pp. 664-670 ◽  
Author(s):  
Masahiro KONDA ◽  
Akinobu TERAMOTO ◽  
Tomoyuki SUWA ◽  
Rihito KURODA ◽  
Tadahiro OHMI
Keyword(s):  
Atomic Force Microscopy ◽  
Data Analysis ◽  
Silicon Surfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Data Analysis Technique ◽  
Analysis Technique ◽  
Atomically Flat

Atomic force microscopy study of atomically flat (001) diamond surfaces treated with hydrogen plasma

1998 ◽  
Vol 125 (1) ◽  
pp. 120-124 ◽  
Author(s):  
Kazushi Hayashi ◽  
Sadanori Yamanaka ◽  
Hideyuki Watanabe ◽  
Takashi Sekiguchi ◽  
Hideyo Okushi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Hydrogen Plasma ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Diamond Surfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomically Flat

Morphology of surfactant–polymer complexes on mica substrate visualized by atomic force microscopy

2006 ◽  
Vol 84 (11) ◽  
pp. 1557-1562 ◽  
Author(s):  
Feng Zhao ◽  
Yukou Du ◽  
Jingkun Xu ◽  
Shufeng Liu
Keyword(s):  
Aqueous Solution ◽  
Atomic Force Microscopy ◽  
Fractal Structure ◽  
Two Dimensions ◽  
Hexadecyltrimethylammonium Bromide ◽  
Mica Substrate ◽  
Polymer Complexes ◽  
Force Microscopy ◽  
Atomic Force ◽  
Potential Applications

The morphology of surfactant–polymer complexes formed in two dimensions has been studied. We found that the morphology of hexadecyltrimethylammonium bromide – modified partially hydrated polyacrylamide (CTAB–MHPAM) complexes transferred to mica from the interface between air and MHPAM aqueous solution shows pearl necklace structures, and it is orientationally aligned. On the addition of salt, this structure is altered to the dendritic fractal structure with a smaller fractal dimension about 1.1 ± 0.01. These structures have potential applications in the fabrication of materials in the nanoscale. The mechanism of the formation of different patterns has been discussed.Key words: morphology, Surfactant–polymer complexes, Dendritic fractal structure.

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