High resolution imaging in cross-section of a metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy
2013 ◽
Vol 471
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pp. 012023
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2005 ◽
Vol 44
(4B)
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pp. 2400-2404
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2021 ◽
Vol 134
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pp. 106046
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2020 ◽
Vol 21
(3)
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pp. 339-347
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1997 ◽
Vol 9
(8)
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pp. 1143-1145
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2010 ◽
Vol 49
(4)
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pp. 04DE16
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