scholarly journals Effect of Concentration of Precursor Solution on Surface Morphology and Optical Properties of Titania Thin Film

Author(s):  
N. Barua ◽  
J.F. Moushumi ◽  
A.K.M.B. Rashid
2018 ◽  
Vol 17 (03) ◽  
pp. 1760037 ◽  
Author(s):  
A. Nancy Anna Anasthasiya ◽  
K. Gowtham ◽  
R. Shruthi ◽  
R. Pandeeswari ◽  
B. G. Jeyaprakash

The spray pyrolysis technique was employed to deposit V2O5 thin films on a glass substrate. By varying the precursor solution volume from 10[Formula: see text]mL to 50[Formula: see text]mL in steps of 10[Formula: see text]mL, films of various thicknesses were prepared. Orthorhombic polycrystalline V2O5 films were inferred from the XRD pattern irrespective of precursor solution volume. The micro-Raman studies suggested that annealed V2O5 thin film has good crystallinity. The effect of precursor solution volume on morphological and optical properties were analysed and reported.


Optik ◽  
2019 ◽  
Vol 199 ◽  
pp. 163517 ◽  
Author(s):  
Mahsa Etminan ◽  
Nooshin. S. Hosseini ◽  
Narges Ajamgard ◽  
Ataalah Koohian ◽  
Mehdi Ranjbar

2020 ◽  
Vol 21 (4) ◽  
pp. 660-668
Author(s):  
Z. R. Zapukhlyak ◽  
L.I. Nykyruy ◽  
G. Wisz ◽  
V.M. Rubish ◽  
V.V. Prokopiv ◽  
...  

The authors have developed a simple, cheap and reproducible technology for obtaining thin-film heterostructures based on CdTe with a given surface morphology during vacuum deposition, which contributes to their low cost [1, 2]. The critical dimensions (thicknesses) of individual layers of the heterostructure were substantiated, a simulation was performed and a wide range of optical properties was investigated [3]. It is shown that for the deposited CdS / CdTe heterostructure on glass it is possible to obtain an efficiency of 15.8%. Given that thin films are relatively new systems, their study can offer much wider opportunities for technological improvement of photovoltaic energy converters. According to the analysis of modern literature data, the efficiency can be increased by performing deposition on ITO films and introducing nanoparticles of controlled sizes.


2011 ◽  
Vol 3 (4) ◽  
pp. 1148-1153 ◽  
Author(s):  
Eunice S. P. Leong ◽  
Yan Jun Liu ◽  
Bing Wang ◽  
Jinghua Teng

2020 ◽  
Vol 12 (2) ◽  
pp. 02013-1-02013-3
Author(s):  
Mugdha Patki ◽  
◽  
Rohan Bagade ◽  
Ganesh Madkaikar ◽  
Poonam Agarwal ◽  
...  

2015 ◽  
Vol 773-774 ◽  
pp. 682-685
Author(s):  
Muhammad Luqman Mohd Napi ◽  
Ng Kim Seng ◽  
Mohd Khairul Ahmad

Fluorine doped tin oxide (FTO) thin film was prepared by using two different precursor solutions which are tin (ii) chloride dihydrate and tin (iv) chloride pentahydrate. These two precursors are used in spray pyrolysis process to prepare the fluorine doped tin oxide thin film. Surface Morphology of the thin film was characterized using field emission scanning electron microscope (FE-SEM). FESEM image shows the particle distribution and the morphology of fluorine doped tin oxide thin film. Two point probe I-V measurement and UV-Vis spectroscopy were used to study the electrical and optical properties of both films. Both precursors produced different particles distribution, electrical properties and also optical properties. The results show that the sheet resistance (Rs) of fluorine doped SnO2 is about 49.24×106Ω for tin (iv) chloride pentahydrate compared to 43.03×1012Ω for tin (ii) chloride dihydrate


Author(s):  
Wael Abdullah

Undoped and halogen-doped zinc oxide thin films are prepared by the thermal oxidation process. Zinc acetate dihydrate, ethanol, and Diethanolamine are used as precursor, solvent, and stabilizer, respectively. In the case of ZnO:Hal. dopant Ammonium chloride NH4Cl 99%, Benzene Bromide C6H5Br, or Benzene Iodide C6H5I for making dopant ZnO thin film with Cl, Br, I respectively is added to the precursor solution with an atomic percentage equal to 2-10.% hal. The transparent solution sprayed onto glass substrates, and are transformed into ZnO upon annealing at 500°C. XRD spectra of ZnO thin films, and optical properties of them as a function of halogen content have been investigated using U.V spectroscopy ( transmittance , refractive index, extinction coefficient and energy band gap ) for undoped and halogen-doped zinc oxide thin films.


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