Transmission electron microscopy, in particular high-resolution TEM, is proving to be a valuable tool in the continuing effort to characterize and understand the “high-Tc” superconducting oxides. Since specimen quality is of critical importance in high-resolution studies, care must be taken to choose the most appropriate specimen preparation technique for the material under study. The BiCaSrCuO material investigated here was in the form of small, sintered pellets with a porous microstructure which consists of small, randomly oriented, poorly connected, plate-like grains (see Figure 1). We have found that this morphology can significantly effect the production of suitable TEM specimens.The simplest and most rapid specimen preparation method employed consists of crushing a small amount of the starting material to a fine powder in an agate mortar and suspending the powder in pure ethanol or propanol. An eye dropper or syringe is then used to transfer 4-6 drops of the suspension onto a holey carbon film supported on a mesh grid, thus effectively dispersing the powder across the grid. A strong tendency for the crystal to cleave along (001) planes, due to the weak bonding between BiO layers, results in flake-like particles which exhibit a preferred [001] orientation on the grid. A high-resolution image of a specimen prepared using this method is shown in Figure 2. We have observed that some specimens produced in this manner are unstable under a 200kV beam (with LaB6 filament), with heavy damage occurring within the time that a through-focus series of micrographs can be exposed. It is also important to note that since separation along grain boundaries occurs during crushing, this method is not an appropriate choice for imaging grain boundary structures.
Cross-Sectional Transmission Electron Microscopy Specimen Preparation Technique by Backside Ar Ion Milling
