Low-voiding solder pastes in LED assembly

2020 ◽  
Vol 32 (4) ◽  
pp. 201-217
Author(s):  
Barbara Dziurdzia ◽  
Maciej Sobolewski ◽  
Janusz Mikołajek ◽  
Sebastian Wroński
Keyword(s):  
Solder Joints ◽  
Mean Value ◽  
Solder Paste ◽  
Production Environment ◽  
Content Type ◽  
X Ray ◽  
Electronic Manufacturing ◽  
Industry Practice ◽  
Solder Pastes ◽  
Free Solder

Purpose This paper aims to investigate voiding phenomena in solder joints under thermal pads of light-emitting diodes (LEDs) assembled in mass production environment by reflow soldering by using seven low-voiding lead-free solder pastes. Design/methodology/approach The solder pastes investigated are of SAC305 type, Innolot type or they are especially formulated by the manufacturers on the base of (SnAgCu) alloys with addition of some alloying elements such as Bi, In, Sb and Ti to provide low-void contents. The SnPb solder paste – OM5100 – was used as a benchmark. The solder paste coverage of LED solder pads was chosen as a measure of void contents in solder joints because of common usage of this parameter in industry practice. Findings It was found that the highest coverage and, related to it, the least void contents are in solder joints formed with the pastes LMPA-Q and REL61, which are characterized by the coverage of mean value 93.13% [standard deviation (SD) = 2.72%] and 92.93% (SD = 2.77%), respectively. The void diameters reach the mean value equal to 0.061 mm (SD = 0.044 mm) for LMPA-Q and 0.074 mm (SD = 0.052 mm) for REL61. The results are presented in the form of histograms, plot boxes and X-ray images. Some selected solder joints were observed with 3D computer tomography. Originality/value The statistical analyses are carried out on the basis of 2D X-ray images with using Origin software. They enable to compare features of various solder pastes recommended by manufacturers as low voiding. The results might be useful for solder paste manufacturers or electronic manufacturing services.

X-ray inspection and Six-Sigma in analysis of LED thermal pad coverage

2017 ◽  
Vol 29 (1) ◽  
pp. 28-33 ◽  
Author(s):  
Barbara Dziurdzia ◽  
Janusz Mikolajek
Keyword(s):  
Six Sigma ◽  
Vapour Phase ◽  
Inspection System ◽  
Solder Paste ◽  
Process Variables ◽  
Reflow Soldering ◽  
Content Type ◽  
X Ray ◽  
Solder Pastes ◽  
Free Solder

Purpose The purpose of this paper is to evaluate selected methods of reduction voidings in lead-free solder joints underneath thermal pads of light-emitting diodes (LEDs), using X-ray inspection and Six Sigma methodology. Design/methodology/approach On the basis of cause and effect diagram for solder voiding, the potential causes of voids and influence of process variables on void formation were found. Three process variables were chosen: the type of reflow soldering, vacuum incorporation and the type of solder paste. Samples of LEDs were mounted with convection and vapour phase reflow soldering. Vacuum was incorporated into vapour phase soldering. Two types of solder pastes OM338PT and LFS-216LT were used. Algorithm incorporated into X-ray inspection system enabled to calculate the statistical distribution of LED thermal pad coverage and to find the process capability index (Cpk) of applied soldering techniques. Findings The evaluation of selected soldering processes of LEDs in respect of their thermal pad coverage and statistical Cpk indices is presented. Vapour-phase soldering with vacuum is capable (Cpk > 1) for OM338PT and LFS-216LT paste. Convection reflow without vacuum with LFS-216LT paste is also capable (Cpk = 1.1). Other technological soldering processes require improvements. Vacuum improves radically the capability of a reflow soldering for an LED assembly. When vacuum is not accessible, some improvement of capability to a lower extent is possible by an application of void-free solder pastes. Originality/value Six Sigma statistical methodology combined with X-ray diagnosis was used to check whether applied methods of void reduction underneath LED thermal pads are capable processes.

SAC–xTiO2 nano-reinforced lead-free solder joint characterizations in ultra-fine package assembly

2018 ◽  
Vol 30 (1) ◽  
pp. 1-13 ◽  
Author(s):  
Fakhrozi Che Ani ◽  
Azman Jalar ◽  
Abdullah Aziz Saad ◽  
Chu Yee Khor ◽  
Roslina Ismail ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Solder Joint ◽  
Solder Joints ◽  
Ion Beam ◽  
Lead Free ◽  
Lead Free Solder ◽  
Solder Paste ◽  
Content Type ◽  
X Ray ◽  
Free Solder

Purpose This paper aims to investigate the characteristics of ultra-fine lead-free solder joints reinforced with TiO2 nanoparticles in an electronic assembly. Design/methodology/approach This study focused on the microstructure and quality of solder joints. Various percentages of TiO2 nanoparticles were mixed with a lead-free Sn-3.5Ag-0.7Cu solder paste. This new form of nano-reinforced lead-free solder paste was used to assemble a miniature package consisting of an ultra-fine capacitor on a printed circuit board by means of a reflow soldering process. The microstructure and the fillet height were investigated using a focused ion beam, a high-resolution transmission electron microscope system equipped with an energy dispersive X-ray spectrometer (EDS), and a field emission scanning electron microscope coupled with an EDS and X-ray diffraction machine. Findings The experimental results revealed that the intermetallic compound with the lowest thickness was produced by the nano-reinforced solder with a TiO2 content of 0.05 Wt.%. Increasing the TiO2 content to 0.15 Wt.% led to an improvement in the fillet height. The characteristics of the solder joint fulfilled the reliability requirements of the IPC standards. Practical implications This study provides engineers with a profound understanding of the characteristics of ultra-fine nano-reinforced solder joint packages in the microelectronics industry. Originality/value The findings are expected to provide proper guidelines and references with regard to the manufacture of miniaturized electronic packages. This study also explored the effects of TiO2 on the microstructure and the fillet height of ultra-fine capacitors.

Quantitative Evaluation of Voids in Lead Free Solder Joints

2015 ◽  
Vol 772 ◽  
pp. 284-289 ◽  
Author(s):  
Sabuj Mallik ◽  
Jude Njoku ◽  
Gabriel Takyi
Keyword(s):  
Solder Bump ◽  
Solder Joints ◽  
Void Formation ◽  
Lead Free ◽  
Lead Free Solder ◽  
Solder Paste ◽  
X Ray ◽  
Size And Shape ◽  
Solder Bumps ◽  
Free Solder

Voiding in solder joints poses a serious reliability concern for electronic products. The aim of this research was to quantify the void formation in lead-free solder joints through X-ray inspections. Experiments were designed to investigate how void formation is affected by solder bump size and shape, differences in reflow time and temperature, and differences in solder paste formulation. Four different lead-free solder paste samples were used to produce solder bumps on a number of test boards, using surface mount reflow soldering process. Using an advanced X-ray inspection system void percentages were measured for three different size and shape solder bumps. Results indicate that the voiding in solder joint is strongly influenced by solder bump size and shape, with voids found to have increased when bump size decreased. A longer soaking period during reflow stage has negatively affectedsolder voids. Voiding was also accelerated with smaller solder particles in solder paste.

Influence of assembly parameters on lead-free solder joints reliability in Package-on-Package (PoP) technology

2015 ◽  
Vol 27 (3) ◽  
pp. 98-102 ◽  
Author(s):  
Janusz Sitek ◽  
Wojciech Stęplewski ◽  
Kamil Janeczek ◽  
Marek Kościelski ◽  
Krzysztof Lipiec ◽  
...  
Keyword(s):  
Solder Joints ◽  
Accelerated Aging ◽  
Lead Free ◽  
Process Window ◽  
Lead Free Solder ◽  
Solder Paste ◽  
Materials Selection ◽  
Content Type ◽  
Free Solder ◽  
Component Assembly

Purpose – The purpose of this paper is to evaluate the influence of assembly parameters on lead-free solder joints reliability in Package-on-Package (PoP) Technology and demonstrate factors important for this issue. Design/methodology/approach – Two types of soldering materials and three different assembly procedures were used for assembly of PoP system. The reliability properties of assembled PoP systems were investigated using accelerated aging and periodic resistance measurements of daisy-chain solder joints systems. The purpose of such approach was to determine which soldering material (flux or solder paste) as well as which assembly process parameter (dipping depth of upper component in soldering material), would provide better reliability properties of the solder joints in the PoP system. Findings – It was stated that both selected flux and solder paste dedicated to assembly of PoP systems can be utilized in soldering of PoP applications. More reliable PoP systems applications require larger attention regarding materials selection and assembly parameters. It is recommended 50 per cent dipping depth of ball’s height into soldering material during upper PoP component assembly for more reliable applications. For less demanding PoP systems, the process window from 30 up to 70 per cent is acceptable. All observed failures after thermal shocks occurred in upper PoP components. Originality/value – This paper explains how materials and assembly parameters have influence on lead-free solder joints reliability in PoP systems. Especially, influence of process window for dipping procedure of upper components balls into soldering material was presented.

Residual free solder process for fluxless solder pastes

2018 ◽  
Vol 30 (2) ◽  
pp. 118-128 ◽  
Author(s):  
Alexander Hanss ◽  
Gordon Elger
Keyword(s):  
Formic Acid ◽  
Market Potential ◽  
Solder Paste ◽  
Solder Alloys ◽  
Content Type ◽  
Soldering Process ◽  
Fluxless Soldering ◽  
Solder Pastes ◽  
Free Solder ◽  
Metal Formates

Purpose For soldering, flux is essential because it enables the wetting of the molten solder. Fluxless soldering, i.e. residue-free soldering with the aid of gaseous activators, has been known for many years, but is only well established in the field of opto- and microwave electronics where the solder is applied as preform. In high-volume SMD applications where solder paste is printed, this technology is rarely used until now. The reducing effect of a gaseous activator like formic acid vapor on certain solder alloys is known in practice. However, the corresponding reactions which occur under soldering conditions in nitrogen atmosphere have so far not been systematically investigated for different solder alloys. This study aims to analyze the different chemical reaction channels which occur on the surface of different solders, i.e. catalytical dissociation of formic acid on the pure or oxidized metal surface and the formation and evaporation of metal formates. Based on this analysis, a residue-free solder process under formic acid is developed for solder paste applications. Design/methodology/approach In this paper, different solder alloys (SnAgCu, SnPb, BiSn, In) were analyzed with thermal gravimetric analysis (TGA) under formic acid flow. Details on mass change depending on the soldering temperature are presented. Activation temperatures are estimated and correlated to the soldering processes. Based on the analysis, fluxless solder pastes and suitable soldering processes are developed and presented. Major paste properties such as printability are compared to a commercial flux solder paste. High-power flip chip LEDs which can be assembled directly on a printed circuit board are used to demonstrate the fluxless soldering. Likewise, the soldering results of standard paste and fluxless paste systems after a reflow process are evaluated and compared. Findings The experimental results show that TGA is an efficient way to gain deeper understanding of the redox processes which occur under formic acid activation, i.e. the formation of metal formates and their evaporation and dissociation. It is possible to solder residue-free not only with preforms but also with a fluxless solder paste. The resulting solder joints have the same quality as those for standard solder paste in terms of voids detected by X-ray and mechanical shear strength. Originality/value In the fluxless soldering process, the reduction of oxide layers, and therefore the wetting of the solder spheres, is enabled by gaseous formic acid. After the soldering process, no cleaning process is necessary because no corrosive residues are left on the circuit boards and components. Therefore, soldering using solder paste without aggressive chemical ingredients has a high market potential. Expensive preforms could be replaced by paste dispensing or paste printing.

Characterization of SAC – x NiO nano-reinforced lead-free solder joint in an ultra-fine package assembly

2019 ◽  
Vol 31 (2) ◽  
pp. 109-124 ◽  
Author(s):  
Fakhrozi Che Ani ◽  
Azman Jalar ◽  
Abdullah Aziz Saad ◽  
Chu Yee Khor ◽  
Mohamad Aizat Abas ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Solder Joint ◽  
Lead Free ◽  
Inspection System ◽  
Lead Free Solder ◽  
Solder Paste ◽  
Nio Nanoparticles ◽  
Content Type ◽  
X Ray ◽  
Free Solder

Purpose This study aims to investigate the NiO nano-reinforced solder joint characteristics of ultra-fine electronic package. Design/methodology/approach Lead-free Sn-Ag-Cu (SAC) solder paste was mixed with various percentages of NiO nanoparticles to prepare the new form of nano-reinforced solder paste. The solder paste was applied to assemble the ultra-fine capacitor using the reflow soldering process. A focussed ion beam, high resolution transmission electron microscopy system equipped with energy dispersive X-ray spectroscopy (EDS) was used in this study. In addition, X-ray inspection system, field emission scanning electron microscopy coupled with EDS, X-ray photoelectron spectroscopy (XPS) and nanoindenter were used to analyse the solder void, microstructure, hardness and fillet height of the solder joint. Findings The experimental results revealed that the highest fillet height was obtained with the content of 0.01 Wt.% of nano-reinforced NiO, which fulfilled the reliability requirements of the international IPC standard. However, the presence of the NiO in the lead-free solder paste only slightly influenced the changes of the intermetallic layer with the increment of weighted percentage. Moreover, the simulation method was applied to observe the distribution of NiO nanoparticles in the solder joint. Originality/value The findings are expected to provide a profound understanding of nano-reinforced solder joint’s characteristics of the ultra-fine package.

Convection vs vapour phase reflow in LED and BGA assembly

2018 ◽  
Vol 30 (2) ◽  
pp. 87-99 ◽  
Author(s):  
Barbara Dziurdzia ◽  
Maciej Sobolewski ◽  
Janusz Mikolajek
Keyword(s):  
Statistical Analysis ◽  
Solder Joints ◽  
Void Formation ◽  
Vapour Phase ◽  
Distribution Data ◽  
Solder Paste ◽  
Content Type ◽  
X Ray ◽  
Bga Packages ◽  
Solder Balls

Purpose The aim of this paper is to evaluate using statistical methods how two soldering techniques – the convection reflow and vapour phase reflow with vacuum – influence reduction of voids in lead-free solder joints under Light Emitted Diodes (LEDs) and Ball Grid Arrays (BGAs). Design/methodology/approach Distribution of voids in solder joints under thermal and electrical pads of LEDs and in solder balls of BGAs assembled with convection reflow and vapour phase reflow with vacuum has been investigated in terms of coverage or void contents, void diameters and number of voids. For each soldering technology, 80 LEDs and 32 solder balls in BGAs were examined. Soldering processes were carried out in the industrial or semi-industrial environment. The OM340 solder paste of Innolot type was used for LED soldering. Voidings in solder joints were inspected with a 2D X-ray transmission system. OriginLab was used for statistical analysis. Findings Investigations supported by statistical analysis showed that the vapour phase reflow with vacuum decreases significantly void contents and number and diameters of voids in solder joints under LED and BGA packages when compared to convection reflow. Originality/value Voiding distribution data were collected on the basis of 2D X-ray images for test samples manufactured during the mass production processes. Statistical analysis enabled to appraise soldering technologies used in these processes in respect of void formation.

Effects of Mn nanoparticle addition on wettability, microstructure and microhardness of low-Ag Sn-0.3Ag-0.7Cu-xMn(np) composite solders

2018 ◽  
Vol 30 (3) ◽  
pp. 153-163 ◽  
Author(s):  
Yu Tang ◽  
Shaoming Luo ◽  
Guoyuan Li ◽  
Zhou Yang ◽  
Chaojun Hou
Keyword(s):  
Solder Matrix ◽  
Solder Paste ◽  
Dispersion Strengthening ◽  
Content Type ◽  
X Ray ◽  
Spread Ratio ◽  
Classic Theory ◽  
Free Solder ◽  
Wetting Process ◽  
Average Size

Purpose The purpose of this paper is to investigate of the effects of Mn nanoparticle addition on the wettability, microstructure and microhardness of SAC0307-xMn(np) (SAC: Sn–Ag–Cu; x = 0, 0.02, 0.05, 0.1 and 0.3 Wt.%) composite solders. Design/methodology/approach The SAC0307-xMn(np) composite solders were prepared by mechanically mixing different weight percentages of Mn nanopowders into the SAC0307 solder paste with rosin flux. In this study, the wettability of the solders was studied using contact angle and spread ratio methods. Afterward, the microstructure of the solders was investigated using scanning electron microscopy, energy-dispersive X-ray spectroscopy and X-ray diffractometry. Moreover, the microhardness of the solders was studied. Findings The wetting process of SAC0307-xMn(np) composite solders was found to experience four stages. Adding a small amount of Mn nanoparticles (x = 0.05 Wt.%) could improve the wettability compared to Mn-free solder. Beyond this level, the wettability deteriorated. The addition of Mn nanoparticles significantly refined the size and spacing of Ag3Sn grains in the solder matrix. When 0.1 Wt.% Mn nanoparticles was added, both the average size of the Ag3Sn grains and the spacing between the Ag3Sn grains decreased significantly and approached minimum values. Beyond this amount, the size and spacing between Ag3Sn grains increased slightly but remained smaller than those in the Mn-free solder matrix. The refined Ag3Sn grains increased the microhardness of the Mn-containing composite solders by 6-25 per cent, in good agreement with the prediction of the classic theory of dispersion strengthening. Originality/value The paper demonstrates that Mn nanoparticle addition could improve the SAC0307-xMn(np) solder wettability and reduce the grain size and spacing between Ag3Sn grains. The enhancement of the solder microhardness shows good correlation with the microstructure.

scholarly journals Head-on-Pillow Defect Detection: X-Ray Inspection Limitations

2019 ◽  
Vol 16 (2) ◽  
pp. 91-102
Author(s):  
Lars Bruno ◽  
Benny Gustafson
Keyword(s):  
Solder Joints ◽  
Solder Paste ◽  
Wafer Level ◽  
Reflow Soldering ◽  
X Ray ◽  
Soldering Process ◽  
Irregular Shapes ◽  
Fine Pitch ◽  
Solder Balls ◽  
Ball Grid Array Packages

Abstract Both the number and the variants of ball grid array packages (BGAs) are tending to increase on network printed board assemblies with sizes ranging from a few millimeter die size wafer level packages with low ball count to large multidie system-in-package (SiP) BGAs with 60–70 mm side lengths and thousands of I/Os. One big challenge, especially for large BGAs, SiPs, and for thin fine-pitch BGA assemblies, is the dynamic warpage during the reflow soldering process. This warpage could lead to solder balls losing contact with the solder paste and its flux during parts of the soldering process, and this may result in solder joints with irregular shapes, indicating poor or no coalescence between the added solder and the BGA balls. This defect is called head-on-pillow (HoP) and is a failure type that is difficult to determine. In this study, x-ray inspection was used as a first step to find deliberately induced HoP defects, followed by prying off of the BGAs to verify real HoP defects and the fault detection correlation between the two methods. The result clearly shows that many of the solder joints classified as potential HoP defects in the x-ray analysis have no evidence at all of HoP after pry-off. This illustrates the difficulty of determining where to draw the line between pass and fail for HoP defects when using x-ray inspection.

Effects of nano-copper particles on the properties of Sn58Bi composite solder pastes

2017 ◽  
Vol 34 (1) ◽  
pp. 40-44 ◽  
Author(s):  
Hao Zhang ◽  
Yang Liu ◽  
Fenglian Sun ◽  
Gaofang Ban ◽  
Jiajie Fan
Keyword(s):  
Formation Mechanism ◽  
Composite Solder ◽  
Defect Formation ◽  
Void Formation ◽  
Experimental Results ◽  
Solder Paste ◽  
Content Type ◽  
Weight Percentage ◽  
Copper Particles ◽  
Solder Pastes

Purpose This paper aimed to investigate the effects of nano-copper particles on the melting behaviors, wettability and defect formation mechanism of the Sn58Bi composite solder pastes. Design/methodology/approach In this paper, the mechanical stirring method was used to get the nano-composite solder pastes. Findings Experimental results indicated that the addition of 3 wt.% (weight percentage) 50 nm copper particles showed limited effects on the melting behaviors of the Sn58Bi composite solder paste. The spreading rate of the Sn58Bi composite solder paste showed a decreasing trend with the increase of the weight percentage of 50 nm copper particles from 0 to 3 wt.%. With the addition of copper particles of diameters 50 nm, 500 nm or 6.5 μm into the Sn58Bi solder paste, the porosities of the three types of solder pastes showed a similar trend. The porosity increased with the increase of the weight percentage of copper particles. Based on the experimental results, a model of the void formation mechanism was proposed. During reflow, the copper particles reacted with Sn in the matrix and formed intermetallic compounds, which gathered around the voids produced by the volatilization of flux. The exclusion of the voids was suppressed and eventually led to the formation of defects. Originality/value This study provides an optimized material for the second and third level packaging. A model of the void formation mechanism was proposed.

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