On effective I/sub DDQ/ testing of low voltage CMOS circuits using leakage control techniques

2002 ◽  
Author(s):  
Zhanping Chen ◽  
Liqiong Wei ◽  
Kaushik Roy
Keyword(s):  
Low Voltage ◽  
Cmos Circuits ◽  
Control Techniques ◽  
Leakage Control

Packaging of MEMS for Integrated RF Circuit Verifications

2011 ◽  
Vol 2011 (DPC) ◽  
pp. 000926-000951
Author(s):  
Bruce C. Kim ◽  
Sai Evana ◽  
Rahim Kasim
Keyword(s):  
Low Voltage ◽  
Cell Phones ◽  
Deep Submicron ◽  
Low Noise ◽  
Low Noise Amplifiers ◽  
Cmos Circuits ◽  
Test Technique ◽  
Mems Switches ◽  
Network Routers ◽  
Noise Amplifier

This paper provides development of MEMS switches and packaging of MEMS to test radio frequency circuits used in wireless products such as cell phones and network routers. We discuss fabrication of MEMS using low voltage magnetic materials and their configurations to achieve the optimum switch to test RF low noise amplifiers. We have accomplished a very unique methodology to test low noise amplifiers using built-in sellf-test technique and our MEMS switches are proposed to achieve the verification of low noise amplifiers. Furthermore, we have used MEMS switches that we developed to perform self calibration to correct for the parametric variations and faults within the deep submicron CMOS circuits. We also discuss packaging of MEMS and low noise amplifier using 3D TSV technology.

Organic Pseudo-CMOS Circuits for Low-Voltage Large-Gain High-Speed Operation

2011 ◽  
Vol 32 (10) ◽  
pp. 1448-1450 ◽  
Author(s):  
Kenjiro Fukuda ◽  
Tsuyoshi Sekitani ◽  
Tomoyuki Yokota ◽  
Kazunori Kuribara ◽  
Tsung-Ching Huang ◽  
...  
Keyword(s):  
High Speed ◽  
Low Voltage ◽  
Cmos Circuits ◽  
Large Gain
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