POWER DISSIPATION CONSIDERATIONS IN LOW-VOLTAGE CMOS CIRCUITS

Author(s):  
ALKIS A. HATZOPOULOS
2011 ◽  
Vol 403-408 ◽  
pp. 3791-3796
Author(s):  
Parisa Mahmoudi ◽  
Ashkan Mahmoudi ◽  
Esmaeil Najafiaghdam

Requirement of voltage up-converters due to high pull-in voltage is one of the main problems by merely electrostatic actuated Microelectromechanical system-based switches. Thermally actuated switches are another alternatives but with very high power dissipation. In this paper a low voltage switch is demonstrated, which uses a combined thermo-electrostatic actuator. The switch can be integrated with standard CMOS circuits without any up-converters. Thermally power dissipation for the switch is lower than just thermal actuators. The switching time is about 70µs and the maximal temperature of thermal actuator is lower than 150oC which cannot cause any longtime damage. Isolation and Insertion Loss quantities have been calculated to -25dB and -0.65dB at 20GHz from HFSS results respectively.


VLSI Design ◽  
2002 ◽  
Vol 15 (2) ◽  
pp. 547-553
Author(s):  
S. M. Rezaul Hasan ◽  
Yufridin Wahab

This paper explores the deterministic transistor reordering in low-voltage dynamic BiCMOS logic gates, for reducing the dynamic power dissipation. The constraints of load driving (discharging) capability and NPN turn-on delay for MOSFET reordered structures has been carefully considered. Simulations shows significant reduction in the dynamic power dissipation for the transistor reordered BiCMOS structures. The power-delay product figure-of-merit is found to be significantly enhanced without any associated silicon-area penalty. In order to experimentally verify the reduction in power dissipation, original and reordered structures were fabricated using the MOSIS 2 μm N-well analog CMOS process which has a P-base layer for bipolar NPN option. Measured results shows a 20% reduction in the power dissipation for the transistor reordered structure, which is in close agreement with the simulation.


2011 ◽  
Vol 2011 (DPC) ◽  
pp. 000926-000951
Author(s):  
Bruce C. Kim ◽  
Sai Evana ◽  
Rahim Kasim

This paper provides development of MEMS switches and packaging of MEMS to test radio frequency circuits used in wireless products such as cell phones and network routers. We discuss fabrication of MEMS using low voltage magnetic materials and their configurations to achieve the optimum switch to test RF low noise amplifiers. We have accomplished a very unique methodology to test low noise amplifiers using built-in sellf-test technique and our MEMS switches are proposed to achieve the verification of low noise amplifiers. Furthermore, we have used MEMS switches that we developed to perform self calibration to correct for the parametric variations and faults within the deep submicron CMOS circuits. We also discuss packaging of MEMS and low noise amplifier using 3D TSV technology.


Author(s):  
Hector Daniel Rico-Aniles ◽  
Jaime Ramirez-Angulo ◽  
Antonio J. Lopez-Martin ◽  
Jose Miguel Rocha ◽  
Alejandro Diaz-Sanchez ◽  
...  

2018 ◽  
Vol 7 (2.7) ◽  
pp. 863
Author(s):  
Damarla Paradhasaradhi ◽  
Kollu Jaya Lakshmi ◽  
Yadavalli Harika ◽  
Busa Ravi Teja Sai ◽  
Golla Jayanth Krishna

In deep sub-micron technologies, high number of transistors is mounted onto a small chip area where, SRAM plays a vital role and is considered as a major part in many VLSI ICs because of its large density of storage and very less access time. Due to the demand of low power applications the design of low power and low voltage memory is a demanding task. In these memories majority of power dissipation depends on leakage power. This paper analyzes the basic 6T SRAM cell operation. Here two different leakage power reduction approaches are introduced to apply for basic 6T SRAM. The performance analysis of basic SRAM cell, SRAM cell using drowsy-cache approach and SRAM cell using clamping diode are designed at 130nm using Mentor Graphics IC Studio tool. The proposed SRAM cell using clamping diode proves to be a better power reduction technique in terms of power as compared with others SRAM structures. At 3.3V, power saving by the proposed SRAM cell is 20% less than associated to basic 6T SRAM Cell.


2020 ◽  
Vol 18 (3) ◽  
pp. 210-215
Author(s):  
Shubham Tayal ◽  
Sunil Jadav

Power dissipation and delay are the challenging issues in the design of VLSI circuits. This manuscript explores joint effect of Self-Bias transistors (SBTs) and Optimum Bulk Bias Technique (OBBT) on CMOS circuits. Earlier investigations on SBTs shows decrease in power dissipation of combinational as well as sequential circuits. We extend the analysis by studying the effect of OBBT on the static and dynamic power of CMOS circuits with SBTs coupled amid the pull-up/down network and the supply bars. Extensive SPICE simulations have been carried out in 0.18 μm technology. Results demonstrate that, a 73% drop in power in case of combinational circuits and 43% in case of sequential circuits can be accomplished by engaging OBBT in digital circuits. Trade-off between power and delay is also been presented.


2011 ◽  
Vol 32 (10) ◽  
pp. 1448-1450 ◽  
Author(s):  
Kenjiro Fukuda ◽  
Tsuyoshi Sekitani ◽  
Tomoyuki Yokota ◽  
Kazunori Kuribara ◽  
Tsung-Ching Huang ◽  
...  

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