Evolution of the cyclic stress-strain and constitutive behaviors of SAC305 lead free solder during fatigue testing

Author(s):  
Nianjun Fu ◽  
Jeffrey C. Suhling ◽  
Sa'd Hamasha ◽  
Pradeep Lall
2015 ◽  
Vol 137 (2) ◽  
Author(s):  
Awni Qasaimeh ◽  
Sa’d Hamasha ◽  
Younis Jaradat ◽  
Peter Borgesen

The extrapolation and generalization of accelerated test results for lead free solder joints require the identification of a damage function that can be counted on to apply beyond the region of the test. Individual ball grid array (BGA) scale Sn3Ag0.5Cu (SAC305) solder joints were subjected to isothermal shear fatigue testing at room temperature and 65 °C. The resulting mechanical response degradation and crack behavior, including strain hardening, crack initiation, and propagation, were correlated with the inelastic work and effective stiffness derived from load–displacement hysteresis loops. Crack initiation was found to scale with the accumulated work, independently of cycling amplitude and strain rate. The subsequent damage rate varied slightly with amplitude.


Author(s):  
Takashi Kawakami ◽  
Takahiro Kinoshita ◽  
Hirokazu Oriyama

Solder joints are sometimes opened under thermal cyclic loads as low cycle fatigue phenomena. The fatigue crack is usually initiated around the edge of the interface where stress and strain very severely concentrate, having stress strain singularity. In this study, Sn-3.0Ag-0.5Cu test pieces with V shape notch were supplied to low cycle fatigue tests at 100°C. And inelastic stress strain simulations, which were based on time-dependent non-unified material model, were carried out under several cyclic load levels to obtain strain distributions around the bottom of the V notch. By results of fatigue test and inelastic simulation, the depth from the bottom of the V notch, where the strain range agrees with the prediction of the fatigue life based on smooth test pieces on Coffin-Manson rule, was investigated as the mechanical design rule for lead free solder joints.


Author(s):  
Zijie Cai ◽  
Jeffrey C. Suhling ◽  
Pradeep Lall ◽  
Michael J. Bozack

The microstructure, mechanical response, and failure behavior of lead free solder joints in electronic assemblies are constantly evolving when exposed to isothermal aging and/or thermal cycling environments. In our prior work on aging effects, we have demonstrated that large degradations occur in the material properties (stiffness and strength) and creep behavior of Sn-Ag-Cu (SAC) lead free solders during aging. These effects are universally detrimental to reliability and are exacerbated as the aging temperature and aging time increases. Conversely, changes due to aging are relatively small in conventional Sn-Pb solders. In our current work, we are exploring several doped SAC+X alloys in an attempt to reduce the aging induced degradation of the material behavior of SAC solders. The doped materials are lead free SAC solders that have been modified by the addition of small percentages of one or more additional elements (X). Using dopants (e.g. Bi, In, Ni, La, Mg, Mn, Ce, Co, Ti, Zn, etc.) has become widespread to enhance shock/drop reliability, wetting, and other properties; and we have extended this approach to examine the ability of dopants to reduce the effects of aging and extend thermal cycling reliability. In this paper, we concentrate on presenting the results for SAC+X (X = Zn, Co, Ni). The enhancement of aging resistance for the doped lead free solders was explored. Comparisons were made to the responses of non-doped SAC lead free solder alloys. The effects of aging on mechanical behavior have been examined by performing stress-strain and creep tests on solder samples that were aged for various durations (0–6 months) at elevated temperature (100 °C). Variations of the mechanical and creep properties (elastic modulus, yield stress, ultimate strength, creep compliance, etc.) were observed and modeled as a function of aging time and aging temperature. Our findings show that the doped SAC+X alloys illustrate reduced degradations with aging for all of the aging temperatures considered. Also, the stress-strain and creep mechanical properties of doped solders are better than those of reference solders after short durations of aging. After long term aging, doped solder alloys were found to have more stable behaviors than those of the standard SAC alloys. A parallel microstructure study has shown that less degradation and coarsening of the phases occurs in doped solder materials relative to non-doped solders after severe aging.


Author(s):  
Munshi Basit ◽  
Mohammad Motalab ◽  
Jeffrey C. Suhling ◽  
Pradeep Lall

In the electronic packaging industry, it is important to be able to make accurate predictions of board level solder joint reliability during thermal cycling exposures. The Anand viscoplastic constitutive model is often used to represent the material behavior of the solder in finite element simulations. This model is defined using nine material parameters, and the reliability prediction results are often highly sensitive to the Anand parameters. In this work, an investigation on the Anand constitutive model and its application to SAC solders of various Ag contents (i.e. SACN05, with N = 1, 2, 3, 4) has been performed. For each alloy, both water quenched (WQ) and reflowed (RF) solidification profiles were utilized to establish two unique specimen microstructures, and the same reflow profile was used for all four of the SAC alloys so that the results could be compared and the effects of Ag content could be studied systematically. In addition, we have performed tensile testing on reflowed specimens subjected to 6 months of aging at 100 C. After this level of aging, any further changes in the mechanical response and properties will be rather small. Thus, the results for these tests can be regarded as approaching the highest level of mechanical behavior degradation possible for a “severely aged” lead free solder material. The nine Anand parameters were determined for each unique solder alloy and microstructure from a set of stress strain tests performed at several strain rates and temperatures. Testing conditions included strain rates of 0.001, 0.0001, and 0.00001 (sec−1), and temperatures of 25, 50, 75, 100, and 125 C. As expected, the mechanical properties (modulus and strength) increase with the percentage of Ag content, and these changes strongly affect the Anand parameters. The sensitivity of the mechanical properties and Anand parameters to silver content is higher at lower silver percentages (1–2%). Also, the observed mechanical properties of water quenched samples were better (higher in magnitude) than the corresponding mechanical properties of the reflowed samples. Although the differences in elastic modulus between the water quenched and reflowed samples are relatively small, significant differences are present for the yield and ultimate tensile stresses of all four SAC alloys. The changes in the Anand model parameters after severe aging (6 months at 100 °C) were significant. The measured experimental results have been used to illustrate the range of values possible for Anand parameters for the SACN05 alloys. The upper extreme was the water quenched limit, where the materials have extremely fine microstructures and high mechanical properties. The lower extreme was the severely aged limit, where the materials have extremely coarsened microstructures and highly degraded mechanical properties. While further degradations are certainly possible with even further aging, the limiting values found for a severely aged SAC alloy can be used by designers as a conservative set of constitutive parameters representing the lower end of the material properties for that alloy. After deriving the Anand parameters for each alloy and microstructure, the stress-strain curves have been calculated for various conditions, and excellent agreement was found between the predicted results and experimental stress-strain curves.


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