Miniaturized Wideband Metasurface Antennas Using Cross-layer Capacitive Loading

Author(s):  
Dongxu Chen ◽  
Wanchen Yang ◽  
Wenquan Che ◽  
Quan Xue
2015 ◽  
Vol E98.B (7) ◽  
pp. 1333-1344
Author(s):  
Raymundo BUENROSTRO-MARISCAL ◽  
Maria COSIO-LEON ◽  
Juan-Ivan NIETO-HIPOLITO ◽  
Juan-Antonio GUERRERO-IBANEZ ◽  
Mabel VAZQUEZ-BRISENO ◽  
...  

2014 ◽  
Vol E97.B (4) ◽  
pp. 746-754 ◽  
Author(s):  
Wei FENG ◽  
Suili FENG ◽  
Yuehua DING ◽  
Yongzhong ZHANG

Author(s):  
SETHI ANITA ◽  
VIJAY SANDIP ◽  
KUMAR RAKESH ◽  
◽  
◽  
...  

Author(s):  
Kenneth Krieg ◽  
Richard Qi ◽  
Douglas Thomson ◽  
Greg Bridges

Abstract A contact probing system for surface imaging and real-time signal measurement of deep sub-micron integrated circuits is discussed. The probe fits on a standard probe-station and utilizes a conductive atomic force microscope tip to rapidly measure the surface topography and acquire real-time highfrequency signals from features as small as 0.18 micron. The micromachined probe structure minimizes parasitic coupling and the probe achieves a bandwidth greater than 3 GHz, with a capacitive loading of less than 120 fF. High-resolution images of submicron structures and waveforms acquired from high-speed devices are presented.


2017 ◽  
pp. 252
Author(s):  
Mohammed A. Abuhelaleh ◽  
Tahseen A. Al-Ramadin ◽  
Bassam A. Alqaralleh ◽  
Moha'med Al-Jaafereh ◽  
Khaled Almi'ani

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