scholarly journals A new process-variation-immunity method for extracting capacitance coupling coefficients in flash memory cells

2002 ◽  
Vol 23 (7) ◽  
pp. 422-424 ◽  
Author(s):  
Caleb Yu-Sheng Cho ◽  
Ming-Jer Chen ◽  
Jia-Han Lin ◽  
Chiou-Feng Chen
Keyword(s):  
Flash Memory ◽  
Process Variation ◽  
Memory Cells ◽  
Coupling Coefficients ◽  
New Process ◽  
Capacitance Coupling

Fluorine Effects Originating From the CVD-W Process on Charge-Trap Flash Memory Cells

2019 ◽  
Vol 66 (1) ◽  
pp. 378-382 ◽  
Author(s):  
Jungmin Moon ◽  
Tae Yoon Lee ◽  
Hyun Jun Ahn ◽  
Tae In Lee ◽  
Wan Sik Hwang ◽  
...  
Keyword(s):  
Flash Memory ◽  
Memory Cells ◽  
Charge Trap

The Effect of Trapped Charge Distributions on Data Retention Characteristics of nand Flash Memory Cells

2007 ◽  
Vol 28 (8) ◽  
pp. 750-752 ◽  
Author(s):  
M. Park ◽  
Kangdeog Suh ◽  
Keonsoo Kim ◽  
S. Hur ◽  
K. Kim ◽  
...  
Keyword(s):  
Flash Memory ◽  
Memory Cells ◽  
Nand Flash ◽  
Nand Flash Memory ◽  
Data Retention ◽  
Charge Distributions ◽  
Retention Characteristics ◽  
Trapped Charge
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