Improved subthreshold slope method for precise extraction of gate capacitive coupling coefficients in stacked gate and source-side injection flash memory cells
2004 ◽
Vol 48
(7)
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pp. 1189-1195
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2002 ◽
Vol 49
(2)
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pp. 301-307
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2001 ◽
Vol 48
(9)
◽
pp. 2081-2089
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2002 ◽
Vol 23
(7)
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pp. 422-424
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2019 ◽
Vol 66
(1)
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pp. 378-382
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