Impact of Random Telegraph Noise Profiles on Drain-Current Fluctuation During Dynamic Gate Bias
2014 ◽
Vol 35
(1)
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pp. 3-5
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2015 ◽
Vol 36
(1)
◽
pp. 26-28
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2011 ◽
Vol 58
(5(2))
◽
pp. 1518-1521
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