An Analytical Elasto-Creep Model of Solder Joints in Leadless Chip Resistors: Part 2—Applications in Fatigue Reliability Predictions for SnPb and Lead-Free Solders

2007 ◽  
Vol 30 (4) ◽  
pp. 695-704 ◽  
Author(s):  
H.R. Ghorbani ◽  
J.K. Spelt
Author(s):  
I. Dutta ◽  
C. Park ◽  
S. Choi

Microelectronic solder joints are typically exposed to aggressive thermo-mechanical cycling (TMC) conditions, resulting in significant strain-enhanced microstructural coarsening during service. This microstructural evolution produces continuously evolving mechanical properties during extended use. Since solder joint life is dictated largely by the creep strain range, it is necessary to develop microstructurally adaptive creep models for solders to enable accurate prediction of joint life. In this paper, we present (1) a new closed-form creep model incorporating microstructural coarsening in lead-free solders, which can be easily incorporated into life-prediction models; and (2) a methodology for impression creep testing of Sn-3.5Ag solders which can potentially enable creep testing of individual flip chip or BGA balls in a package. The proposed creep model incorporates the effects of both static and strain-enhanced coarsening of second phase intermetallic particles which are present in lead-free solders, and shows that as a joint undergoes TMC, the creep rate increases continuously, adversely impacting life. This inference is supported by the impression creep experiments, which are shown to capture the essential features of creep in Sn-Ag alloys, in accordance with the available literature. It is also shown that the creep resistance of a given alloy composition is strongly dependent on the microstructure, making it important that creep data used for joint life prediction be based on testing of actual joints or very tightly controlled microstructures.


2021 ◽  
Author(s):  
Mohammad Ashraful Haq ◽  
Mohd Aminul Hoque ◽  
Jeffrey C. Suhling ◽  
Pradeep Lall

Abstract A major problem faced by electronic packaging industries is the poor reliability of lead free solder joints. One of the most common methods utilized to tackle this problem is by doping the alloy with other elements, especially bismuth. Researches have shown Bismuth doped solder joints to mostly fail near the Intermetallic (IMC) layer rather than the bulk of the solder joint as commonly observed in traditional SAC305 solder joints. An understanding of the properties of this IMC layer would thus provide better solutions on improving the reliability of bismuth doped solder joints. In this study, the authors have used three different lead free solders doped with 1%, 2% and 3% bismuth. Joints of these alloys were created on copper substrates. The joints were then polished to clearly expose the IMC layers. These joints were then aged at 125 °C for 0, 1, 2, 5 and 10 days. For each aging condition, the elastic modulus and the hardness of the IMC layers were evaluated using a nanoindenter. The IMC layer thickness and the chemical composition of the IMC layers were also determined for each alloy at every aging condition using Scanning Electron Microscopy (SEM) and EDS. The results from this study will give a better idea on how the percentage of bismuth content in lead free solder affects the IMC layer properties and the overall reliability of the solder joints.


2010 ◽  
Vol 2010 (1) ◽  
pp. 000314-000318
Author(s):  
Tong Jiang ◽  
Fubin Song ◽  
Chaoran Yang ◽  
S. W. Ricky Lee

The enforcement of environmental legislation is pushing electronic products to take lead-free solder alloys as the substitute of traditional lead-tin solder alloys. Applications of such alloys require a better understanding of their mechanical behaviors. The mechanical properties of the lead-free solders and IMC layers are affected by the thermal aging. The lead-free solder joints on the pads subject to thermal aging test lead to IMC growth and cause corresponding reliability concerns. In this paper, the mechanical properties of the lead-free solders and IMCs were characterized by nanoindentation. Both the Sn-rich phase and Ag3Sn + β-Sn phase in the lead-free solder joint exhibit strain rate depended and aging soften effect. When lead-free solder joints were subject to thermal aging, Young's modulus of the (Cu, Ni)6Sn5 IMC and Cu6Sn5 IMC changed in very small range. While the hardness value decreased with the increasing of the thermal aging time.


2009 ◽  
Vol 77 (1) ◽  
Author(s):  
Fei Qin ◽  
Tong An ◽  
Na Chen

As traditional lead-based solders are banned and replaced by lead-free solders, the drop impact reliability is becoming increasingly crucial because there is little understanding of mechanical behaviors of these lead-free solders at high strain rates. In this paper, mechanical properties of one lead-based solder, Sn37Pb, and two lead-free solders, Sn3.5Ag and Sn3.0Ag0.5Cu, were investigated at strain rates that ranged from 600 s−1 to 2200 s−1 by the split Hopkinson pressure and tensile bar technique. At high strain rates, tensile strengths of lead-free solders are about 1.5 times greater than that of the Sn37Pb solder, and also their ductility are significantly greater than that of the Sn37Pb. Based on the experimental data, strain rate dependent Johnson–Cook models for the three solders were derived and employed to predict behaviors of solder joints in a board level electronic package subjected to standard drop impact load. Results indicate that for the drop impact analysis of lead-free solder joints, the strain rate effect must be considered and rate-dependent material models of lead-free solders are indispensable.


Author(s):  
Hongtao Ma ◽  
Jeffrey C. Suhling ◽  
Yifei Zhang ◽  
Pradeep Lall ◽  
Michael J. Bozack

The microstructure, mechanical response, and failure behavior of lead free solder joints in electronic assemblies are constantly evolving when exposed to isothermal aging and/or thermal cycling environments. In our prior work on aging effects (Ma, et al., ECTC 2006), we demonstrated that the observed material behavior variations of SAC405 and SAC305 lead free solders during room temperature aging (25 °C) were unexpectedly large and universally detrimental to reliability. Such effects for lead free solder materials are much more dramatic at the higher aging temperatures (e.g. 100–150 °C) typical of the harsh environments present in high performance computing and in automotive, aerospace, and defense applications. However, there has been little work in the literature, and the work that has been done has concentrated on the degradation of solder ball shear strength (e.g. Dage Shear Tester). Current finite element models for solder joint reliability during thermal cycling accelerated life testing are based on traditional solder constitutive and failure models that do not evolve with material aging. Thus, there will be significant errors in the calculations with the new lead free SAC alloys that illustrate dramatic aging phenomena. In the current work, we have explored the effects of elevated temperature isothermal aging on the mechanical behavior and reliability of lead free solders. The effects of aging on mechanical behavior have been examined by performing stress-strain and creep tests on SAC405 and SAC305 samples that were aged for various durations (0–6 months) at several elevated temperatures (80, 100, 125, and 150 °C). Analogous tests were performed with 63Sn-37Pb eutectic solder samples for comparison purposes. Variations of the temperature dependent mechanical properties (elastic modulus, yield stress, ultimate strength, creep compliance, etc.) were observed and modeled as a function of aging time and temperature. In this paper, we have concentrated our efforts on presenting the results for samples aged at 125 °C. In addition, the new elevated temperature aging data were correlated with our room temperature results from last year’s investigation. The results obtained in this work have demonstrated the significant effects of elevated temperature exposure on solder joints. As expected, the mechanical properties evolved at a higher rate and experienced larger changes during elevated temperature aging (compared to room temperature aging). After approximately 200 hours of aging, the lead free solder joint material properties were observed to degrade at a nearly constant rate. We have developed a mathematical model to predict the variation of the properties with aging time and aging temperature. Our data for the evolution of the creep response of solders with elevated temperature aging show that the creep behavior of lead free and tin-lead solders experience a “crossover point” where lead free solders begin to creep at higher rates than standard 63Sn-37Pb solder for the same stress level. Such an effect is not observed for solder joints aged at room temperature, where SAC alloys always creep at lower rates than Sn-Pb solder.


2017 ◽  
Vol 69 (4) ◽  
Author(s):  
Yao Yao ◽  
Xu Long ◽  
Leon M. Keer

Due to the restriction of lead-rich solder and the miniaturization of electronic packaging devices, lead-free solders have replaced lead-rich solders in the past decades; however, it also brings new technical problems. Reliability, fatigue, and drop resistance are of concern in the electronic industry. The paper provides a comprehensive survey of recent research on the methodologies to describe the mechanical behavior of lead-free solders. In order to understand the fundamental mechanical behavior of lead-free solders, the visco-plastic characteristics should be considered in the constitutive modeling. Under mechanical and thermal cycling, fatigue is related to the time to failure and can be predicted based on the analysis to strain, hysteresis energy, and damage accumulation. For electronic devices with potential drop impacts, drop resistance plays an essential role to assess the mechanical reliability of solder joints through experimental studies, establishing the rate-dependent material properties and proposing advanced numerical techniques to model the interconnect failure. The failure mechanisms of solder joints are complicated under coupled electrical-thermal-mechanical loadings, the increased current density can lead to electromigration around the current crowding zone. The induced void initiation and propagation have been investigated based on theoretical approaches to reveal the effects on the mechanical properties of solder joints. To elucidate the dominant mechanisms, the effects of current stressing and elevated temperature on mechanical behavior of lead-free solder have been reviewed. Potential directions for future research have been discussed.


2010 ◽  
Vol 654-656 ◽  
pp. 2450-2454 ◽  
Author(s):  
De Kui Mu ◽  
Hideaki Tsukamoto ◽  
Han Huang ◽  
Kazuhiro Nogita

High-temperature lead-free solders are important materials for electrical and electronic devices due to increasing legislative requirements that aim at reducing the use of traditional lead-based solders. For the successful use of lead-free solders, a comprehensive understanding of the formation and mechanical properties of Intermetallic Compounds (IMCs) that form in the vicinity of the solder-substrate interface is essential. In this work, the effect of nickel addition on the formation and mechanical properties of Cu6Sn5 IMCs in Sn-Cu high-temperature lead-free solder joints was investigated using Scanning Electron Microscopy (SEM) and nanoindentation. It was found that the nickel addition increased the elastic modulus and hardness of the (Cu, Ni)6Sn5. The relationship between the nickel content and the mechanical properties of the IMCs was also established.


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