Interface States Characterization of UTB SOI MOSFETs From the Subthreshold Current

IEEE Transactions on Electron Devices ◽

10.1109/ted.2020.3043223 ◽

2020 ◽

pp. 1-6

Author(s):

Matthias L. Vermeer ◽

Raymond J. E. Hueting ◽

Luca Pirro ◽

Jan Hoentschel ◽

Jurriaan Schmitz

Keyword(s):

Interface States ◽

Subthreshold Current

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Suppression and characterization of interface states at low-pressure-chemical-vapor-deposited SiN /III-nitride heterostructures

Applied Surface Science ◽

10.1016/j.apsusc.2020.148530 ◽

2021 ◽

Vol 542 ◽

pp. 148530

Author(s):

Kexin Deng ◽

Xinhua Wang ◽

Sen Huang ◽

Haibo Yin ◽

Jie Fan ◽

...

Keyword(s):

Chemical Vapor ◽

Low Pressure ◽

Interface States ◽

Chemical Vapor Deposited ◽

Pressure Chemical

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A Statistical Characterization of CMOS Process Fluctuations in Subthreshold Current Mirrors

9th International Symposium on Quality Electronic Design (isqed 2008) ◽

10.1109/isqed.2008.4479717 ◽

2008 ◽

Author(s):

Lei Zhang ◽

Zhiping Yu ◽

Xiangqing He

Keyword(s):

Cmos Process ◽

Statistical Characterization ◽

Subthreshold Current ◽

Current Mirrors

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Characterization of MOSFET Interface States Using the Charge Pumping Technique

Hot Carrier Degradation in Semiconductor Devices ◽

10.1007/978-3-319-08994-2_8 ◽

2014 ◽

pp. 231-255 ◽

Author(s):

Thomas Aichinger ◽

Michael Nelhiebel

Keyword(s):

Interface States ◽

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Electrical Characterization of Interface States in In/p-Si Schottky Diode From I–V Characteristics

Physics of Semiconductor Devices - Environmental Science and Engineering ◽

10.1007/978-3-319-03002-9_20 ◽

2014 ◽

pp. 85-87 ◽

Author(s):

B P Modi ◽

J M Dhimmar

Keyword(s):

Schottky Diode ◽

Electrical Characterization ◽

Interface States

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Characterization of Interface States of HfO2/Ge with Fluorine Treatment by Using DLTS/ICTS

ECS Meeting Abstracts ◽

10.1149/ma2010-02/30/1879 ◽

2010 ◽

Keyword(s):

Interface States

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Characterization of interface states at oxide/GaN(AlGaN) interfaces using illumination

10.1109/imfedk53601.2021.9637620 ◽

2021 ◽

Author(s):

Boguslawa Adamowicz

Keyword(s):

Interface States

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Effects of Interface States on C-V Profile Characterization of Semiconductor-Semiconductor Interfaces of GaAs and Related Alloys

Control of Semiconductor Interfaces ◽

10.1016/b978-0-444-81889-8.50103-6 ◽

1994 ◽

pp. 567-572

Author(s):

H. Tomozawa ◽

H. Hasegawa

Keyword(s):

Interface States ◽

Semiconductor Interfaces

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Distribution of Interface States in MOS Systems Extracted by the Subthreshold Current in MOSFETs under Optical Illumination

Journal of the Korean Physical Society ◽

10.3938/jkps.43.873 ◽

2003 ◽

Vol 43 (5) ◽

pp. 873-878 ◽

Author(s):

M. S. Kim ◽

H. T. Kim ◽

S. S. Chi ◽

T. E. Kim ◽

H. T. Shin ◽

...

Keyword(s):

Interface States ◽

Subthreshold Current

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Characterization of interface states at Au/InSb/InP(100) Schottky barrier diodes as a function of frequency

Vacuum ◽

10.1016/s0042-207x(00)00131-7 ◽

2000 ◽

Vol 57 (2) ◽

pp. 219-228 ◽

Author(s):

B. Akkal ◽

Z. Benamara ◽

B. Gruzza ◽

L. Bideux

Keyword(s):

Schottky Barrier ◽

Interface States ◽

Schottky Barrier Diodes

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Characterization of Interface States in Degraded ZnO Varistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.41.190 ◽

2002 ◽

Vol 41 (Part 1, No. 1) ◽

pp. 190-196 ◽

Author(s):

Yasuhiro Ohbuchi ◽

Toshio Kawahara ◽

Yoichi Okamoto ◽

Jun Morimoto

Keyword(s):

Interface States ◽

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