X-ray and optical characterization of the metal-dielectric structures based on synthetic opals

2015 ◽  
Author(s):  
D. Kolisnyk ◽  
M. Dergachov
Keyword(s):  
Optical Characterization ◽  
X Ray ◽  
Synthetic Opals ◽  
Dielectric Structures

Structural and Optical Characterization of Zinc Telluride Thin Films

2013 ◽  
Vol 665 ◽  
pp. 254-262 ◽  
Author(s):  
J.R. Rathod ◽  
Haresh S. Patel ◽  
K.D. Patel ◽  
V.M. Pathak
Keyword(s):  
Thin Films ◽  
Extinction Coefficient ◽  
Nir Spectroscopy ◽  
Optical Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Evaporation Technique ◽  
Film Form ◽  
Znte Thin Films

Group II-VI compounds have been investigated largely in last two decades due to their interesting optoelectronic properties. ZnTe, a member of this family, possesses a bandgap around 2.26eV. This material is now a day investigated in thin film form due to its potential towards various viable applications. In this paper, the authors report their investigations on the preparation of ZnTe thin films using vacuum evaporation technique and their structural and optical characterizations. The structural characterization, carried out using an X-ray diffraction (XRD) technique shows that ZnTe used in present case possesses a cubic structure. Using the same data, the micro strain and dislocation density were evaluated and found to be around 1.465×10-3lines-m2and 1.639×1015lines/m2respecctively. The optical characterization carried out in UV-VIS-NIR region reveals the fact that band gap of ZnTe is around 2.2eV in present case. In addition to this, it was observed that the value of bandgap decreases as the thickness of films increases. The direct transitions of the carries are involved in ZnTe. Using the data of UV-VIS-NIR spectroscopy, the transmission coefficient and extinction coefficient were also calculated for ZnTe thin films. Besides, the variation of extinction coefficient with wavelength has also been discussed here.

Nanofabrication and characterization of a grating-based condenser for uniform illumination with hard X-rays

2017 ◽  
Vol 24 (3) ◽  
pp. 595-599
Author(s):  
Jianpeng Liu ◽  
Xin Li ◽  
Shuo Chen ◽  
Sichao Zhang ◽  
Shanshan Xie ◽  
...  
Keyword(s):  
Finite Difference Time Domain ◽  
Optical Characterization ◽  
X Rays ◽  
Uniform Illumination ◽  
Basic Study ◽  
Full Field ◽  
X Ray ◽  
High Uniformity ◽  
Difference Time

In the development of full-field transmission X-ray microscopy for basic study in science and technology, a condenser capable of providing intense illumination with high uniformity and stability on tested specimens in order to achieve high-quality images is essential. The latest design of a square-shaped condenser based on diffractive gratings has demonstrated promising uniformity in illumination. This paper describes in more detail the development of such a beam shaper for hard X-rays at 10 keV with regard to its design, manufacture and optical characterization. The effect of the grating profile on the diffracted intensity has been theoretically predicted by numerical simulation using the finite-difference time-domain method. Based on this, the limitations of the grating-based condenser are discussed.

Synthesis and Characterization of Cellular SiO2 Materials by Foaming Sol Gels

1990 ◽  
Vol 207 ◽  
Author(s):  
Josephine Covino ◽  
Allen P. Gehris
Keyword(s):  
Sol Gel ◽  
Optical Characterization ◽  
Viscosity Change ◽  
Density Measurements ◽  
X Ray ◽  
X Ray Crystallography ◽  
Foaming Process ◽  
Sol Gel Process ◽  
Porous Oxides

AbstractA variety of cellular SiO2 materials have been synthesized using a foaming sol-gel process and their properties have been characterized. The process uses the rapid viscosity change during gelation to stabilize the structure of a foamed silica sol. It was found that the properties of these cellular materials are determined by method used. For example, the porosity and strength of these porous oxides depend on method of agitation and addition of Freon during the foaming process.Density measurements, viscosity measurements as a function of pH, optical characterization, x-ray crystallography, ultimate compressive strength, dielectric constant measurements and thermal diffusivity were used to characterize these porous SiO2 materials. This paper will discuss the synthetic processes used to develop the porous silicas and properties of these materials.

Synthesis, X-ray crystal structures and linear and nonlinear optical characterization of a series of nickel(II) and copper(II) salicylaldiminato complexes

2005 ◽  
Vol 358 (13) ◽  
pp. 3773-3785 ◽  
Author(s):  
J. Melissa Floyd ◽  
Gary M. Gray ◽  
Amelia G. VanEngen Spivey ◽  
Christopher M. Lawson ◽  
Timothy M. Pritchett ◽  
...  
Keyword(s):  
Crystal Structures ◽  
Nonlinear Optical ◽  
Optical Characterization ◽  
X Ray ◽  
Linear And Nonlinear

scholarly journals Synthesis and Characterization of ZnS Nanoparticles Using Co-precipitation Method

2020 ◽  
pp. 26-33
Author(s):  
S. Mohanapriya ◽  
M. Vennila ◽  
S. Kowsalya
Keyword(s):  
Sodium Sulfide ◽  
Optical Characterization ◽  
Precipitation Method ◽  
Synthesis And Characterization ◽  
Precipitation Reaction ◽  
Zns Nanoparticles ◽  
X Ray ◽  
Homogeneous Chemical ◽  
Co Precipitation

ZnS nanoparticles were prepared from homogeneous chemical co-precipitation reaction by using zinc acetate, sodium sulfide [Na2S] and Poly Vinyl Polypyrrolidone [PVP]. The basic, morphological, and optical properties of the synthesized nanoparticles were characterized using Scanning Electron Microscopy (SEM), Fourier Transform Infrared Spectroscopy (FTIR), Energy Dispersive X-ray Analysis (EDX) and Ultraviolet-Visible (UV-Vis) absorption. The structural and optical characterization of the samples observed by SEM, FTIR, EDX and UV-Vis spectrometer showed that ZnS nanoparticles were formed.

Structural and Optical Characterization of ZnO and Glucose Capped ZnO Nanoparticles

2018 ◽  
Vol 21 (1) ◽  
pp. 001-005 ◽  
Author(s):  
A. Dhanalakshmi ◽  
S. Thanikaikarasan ◽  
B. Natarajan ◽  
V. Ramadas ◽  
T. Mahalingam ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Spectroscopic Analysis ◽  
Optical Characterization ◽  
Hexagonal Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Infrared Spectroscopic Analysis ◽  
Structure Surface ◽  
Chemical Reaction Method

Zinc Oxide and Glucose capped Zinc Oxide nanoparticles have been prepared using modified chemical reaction method. X-ray diffraction analysis showed that the prepared samples possess polycrystalline nature with hexagonal structure. Surface morphology has been analyzed using scanning electron microscopy. The estimated value of band gap was found to be 3.41 and 3.87 eV for Zinc Oxide and Glucose capped ZnO respectively. Fourier Transform Infrared spectroscopic analysis has been carried out to find the chemical bond and elemental composition present in Zinc Oxide and Glucose capped Zinc Oxide.

scholarly journals Optical Characterization of an X-ray Zoom Lens

2018 ◽  
Vol 24 (S2) ◽  
pp. 270-271 ◽  
Author(s):  
Elisa Kornemann ◽  
Ottó Márkus ◽  
Alexander Opolka ◽  
Kawal Sawhney ◽  
Angelica Cecilia ◽  
...  
Keyword(s):  
Optical Characterization ◽  
Zoom Lens ◽  
X Ray

Optical characterization of synthetic opals

2002 ◽  
Vol 44 (9) ◽  
pp. 1648-1655 ◽  
Author(s):  
A. V. Baryshev ◽  
A. V. Ankudinov ◽  
A. A. Kaplyanskii ◽  
V. A. Kosobukin ◽  
M. F. Limonov ◽  
...  
Keyword(s):  
Optical Characterization ◽  
Synthetic Opals

Comprehensive structural and optical characterization of AlAs/GaAs distributed Bragg reflector

2019 ◽  
Vol 33 (08) ◽  
pp. 1950054
Author(s):  
B. O. Alaydin ◽  
E. S. Tuzemen ◽  
D. Altun ◽  
S. Elagoz
Keyword(s):  
High Resolution ◽  
Penetration Depth ◽  
Optical Characterization ◽  
Bragg Reflector ◽  
High Angle ◽  
X Ray Diffraction ◽  
Distributed Bragg Reflector ◽  
X Ray ◽  
Dynamical Simulations

30-pair AlAs/GaAs distributed Bragg reflector (DBR), which has 1030 nm center reflectivity, is studied extensively by means of High Resolution X-ray Diffraction (HR-XRD) and reflectivity measurements. Theta/2-Theta measurements and dynamical simulations have been done for (002), (004) and (006) planes to determine strain and thickness of AlAs and GaAs layers in the DBR stack. Reciprocal space mappings (RSMs) are measured for same planes and also for (224) plane to find out tilt and relaxation of the DBR stack. Relaxation is not observed and it is confirmed with symmetric in-plane (400) Theta/2-Theta and RSM measurements. This is a first study in the literature according to the best of our knowledge. Finally, we have shown sensitivity of high angle diffraction planes to disorders in crystal. Angle-dependent reflectivity simulations have been also done and compared with measurements. 99.99% reflectivity is obtained with 99.5 nm stop bandwidth and 482.7 nm penetration depth.

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