Analysis and Prediction of Vibration-Induced Solder Joint Failure for a Ceramic Column Grid Array Package

2008 ◽  
Vol 130 (1) ◽  
Author(s):  
Andy Perkins ◽  
Suresh K. Sitaraman
Keyword(s):  
Numerical Modeling ◽  
Solder Joint ◽  
Fatigue Failure ◽  
Heat Sink ◽  
Solder Joints ◽  
Numerical Models ◽  
Sinusoidal Vibration ◽  
Solder Joint Fatigue ◽  
Damage Mapping ◽  
Frequency Sweeps

Solder joint fatigue failure under vibration loading continues to be a concern in microelectronic industry. Existing literature has not adequately addressed high-cycle fatigue failure of high-lead solder joints, especially under a broad spectrum of vibration frequencies. Also, damage mapping across solder joints in an area-array package has not been effectively studied using numerical models and experimental cross sectioning. This paper aims to develop an experimental and modeling approach that can accurately determine the solder joint behavior of electronic components under vibration conditions. In particular, this paper discusses the out-of-plane sinusoidal vibration experiments at 1G, numerical modeling, and fatigue life prediction for a 42.5×42.5×4mm3 1089 input∕output ceramic column grid array (CCGA) package on a 133×56×2.8mm3 FR4 board. Detailed investigation and characterization involving dye-and-pry analysis, microstructural examination, and numerical modeling enabled the development of a high-cycle stress-based equation for lead-containing CCGA under sinusoidal loading. The developed approach has been applied to a number of cases including a CCGA package with a heat sink as well as a CCGA package subjected to frequency sweeps. It is seen that the predictions from the developed model agree well with experimental data and that the developed model can map the evolution of solder damage across all solder joints and can also provide important design recommendations in terms of solder joint location as well as heat sink attachment.

A Comparison of Thermal Stress/Strain Behavior of Elliptical/Round Solder Pads

1999 ◽  
Vol 123 (2) ◽  
pp. 127-131 ◽  
Author(s):  
Kuo-Ning Chiang ◽  
Chang-Ming Liu
Keyword(s):  
Thermal Stress ◽  
Solder Joint ◽  
Solder Joints ◽  
Numerical Models ◽  
Ball Grid Array ◽  
Stress Strain ◽  
Restoring Force ◽  
Array Type ◽  
Finite Element Software ◽  
Area Array

As electronic packaging technology moving to the CSP, wafer level packaging, fine pitch BGA (ball grid array) and high density interconnections, the wireability of the PCB/substrate and soldering technology are as important as reliability issues. In this work, a comparison of elliptical/round pads of area array type packages has been studied for soldering, reliability, and wireability requirements. The objective of this research is to develop numerical models for predicting reflow shapes of solder joint under elliptical/round pad boundary conditions and to study the reliability issue of the solder joint. In addition, a three-dimensional solder liquid formation model is developed for predicting the geometry, the restoring force, the wireability, and the reliability of solder joints in an area array type interconnections (e.g., ball grid array, flip chip) under elliptical and round pad configurations. In general, the reliability of the solder joints is highly dependent on the thermal-mechanical behaviors of the solder and the geometry configuration of the solder ball. These reliability factors include standoff height/contact angle of the solder joint, and the geometry layout/material properties of the package. An optimized solder pad design cannot only lead to a good reliability life of the solder joint but also can achieve a better wireability of the substrate. Furthermore, the solder reflow simulation used in this study is based on an energy minimization engine called Surface Evolver and the finite element software ABAQUS is used for thermal stress/strain nonlinear analysis.

scholarly journals Thermo mechanical analysis of through-hole solder joint using strain partitioning method

2021 ◽  
Author(s):  
Imtiaz Ahmed Shaik
Keyword(s):  
Solder Joint ◽  
Creep Strain ◽  
Fatigue Failure ◽  
Thermal Loading ◽  
Solder Joints ◽  
Coefficient Of Thermal Expansion ◽  
Deformation Mode ◽  
Temperature Cycle ◽  
Plated Through Hole ◽  
Through Hole

Currently in the electronics industry there is a desire to increase component reliability. Fatigue failure in solder joints is an important design consideration for electronic packaging. In through-hole components, fatigue failure of leads has been observed to antecede fatigue failure of solder joints. The main objective of the study for a solder joint in a plated-through-hole bearing the pin during the temperature cycle was to ascertain the thermo mechanical behavior and the dominant deformation mode. The Digital Speckle Correlation (DSC) technique, which is a computer vision technique, was applied for the measurement of solder joint deforamtion for a prescribed outlined temperature and time. The dimensions for the area of the solder joint under study were 21 by 21 um, located at the centre of the hole. And computation of averaged shear strains at 6 data points for this area was done. R Darveaux's constitutive model was applied for the data analysis such as the solder joint yields stress with respect to the time and temperature. On achieving the stress solution, the measured total strains were partitioned into elastic, plastic and creep terms separately and hence the creep strain was evaluated. From the analysis, it was found that the dominant deformation mode was shear deformation due to mismatch of coefficient of thermal expansion between pin and copper plating material of through-hole under thermal loading. And the dominant deformation mechanism was creep strain while stress started to relax at the end of ramp up and continued throughout the test and creep strain rate decreased during high temperature dwell. In Addition, the elastic strain was dominating during the initial stage of thermal cycle but later it was neglibible when compared to creep strain.

scholarly journals Numerical modeling for heatsink emissions in power electronics

2012 ◽  
Vol 10 ◽  
pp. 239-243
Author(s):  
J. Kulanayagam ◽  
J. H. Hagmann ◽  
S. Schenke ◽  
K. F. Hoffmann ◽  
S. Dickmann
Keyword(s):  
Numerical Modeling ◽  
Power Supply ◽  
Heat Sink ◽  
Numerical Models ◽  
Laboratory Measurements ◽  
Radiation Characteristics ◽  
Power Semiconductors ◽  
Noise Current ◽  
Radiated Emissions ◽  
Switching Mode

Abstract. The parasitic coupling between power semiconductors and the heat sink is responsible for noise current in Switching Mode Power Supply (SMPS) systems. In this paper, the variations in the radiation characteristics of heatsinks are investigated with respect to their geometries by use of numerical models. Analyses are facilitated by using a mopole antenna as an EMI receiver and by using simplified heatsink models as EMI transmitters to model the heatsink radiated emissions. In addition, the analysis is confirmed using laboratory measurements.

scholarly journals Thermo mechanical analysis of through-hole solder joint using strain partitioning method

2021 ◽  
Author(s):  
Imtiaz Ahmed Shaik
Keyword(s):  
Solder Joint ◽  
Creep Strain ◽  
Fatigue Failure ◽  
Thermal Loading ◽  
Solder Joints ◽  
Coefficient Of Thermal Expansion ◽  
Deformation Mode ◽  
Temperature Cycle ◽  
Plated Through Hole ◽  
Through Hole

Currently in the electronics industry there is a desire to increase component reliability. Fatigue failure in solder joints is an important design consideration for electronic packaging. In through-hole components, fatigue failure of leads has been observed to antecede fatigue failure of solder joints. The main objective of the study for a solder joint in a plated-through-hole bearing the pin during the temperature cycle was to ascertain the thermo mechanical behavior and the dominant deformation mode. The Digital Speckle Correlation (DSC) technique, which is a computer vision technique, was applied for the measurement of solder joint deforamtion for a prescribed outlined temperature and time. The dimensions for the area of the solder joint under study were 21 by 21 um, located at the centre of the hole. And computation of averaged shear strains at 6 data points for this area was done. R Darveaux's constitutive model was applied for the data analysis such as the solder joint yields stress with respect to the time and temperature. On achieving the stress solution, the measured total strains were partitioned into elastic, plastic and creep terms separately and hence the creep strain was evaluated. From the analysis, it was found that the dominant deformation mode was shear deformation due to mismatch of coefficient of thermal expansion between pin and copper plating material of through-hole under thermal loading. And the dominant deformation mechanism was creep strain while stress started to relax at the end of ramp up and continued throughout the test and creep strain rate decreased during high temperature dwell. In Addition, the elastic strain was dominating during the initial stage of thermal cycle but later it was neglibible when compared to creep strain.

Determination of Anand Parameters From Creep Testing of SAC305 Solder Joints

2020 ◽  
Author(s):  
Mohammad Ashraful Haq ◽  
Mohd Aminul Hoque ◽  
Jeffrey C. Suhling ◽  
Pradeep Lall
Keyword(s):  
Solder Joint ◽  
Printed Circuit Boards ◽  
Solder Joints ◽  
Creep Testing ◽  
Response Curves ◽  
Sac305 Solder ◽  
Wide Range ◽  
Stress Levels ◽  
Creep Measurements ◽  
Solder Joint Fatigue

Abstract Solder Joints are among the most vulnerable components within electronic packages, and solder joint fatigue is regarded to be one of the major methods of electronic package failure. The prediction of solder joint reliability is thus of great importance and most finite element packages utilize the Anand Viscoplastic Model to model the mechanical behavior of the solder joint material. In this work, 3 × 3 arrays of SAC305 solder joints of roughly 750 μm in diameter were reflowed in between two FR-4 printed circuit boards to create a sandwich structural sample. These samples were then subjected to creep testing in shear at various temperatures (T = 25, 50, 75, 100 °C) and stress levels (τ = 5, 10, and 15 MPa). A set of specially designed fixtures was used to grip the solder joint specimens. The nine Anand model constants were then extracted from the creep data. The Anand model predicted creep response curves were then compared with the experimental creep measurements to determine the accuracy of the model. The Anand model predictions were found to match the measured data very well over a wide range of temperatures and stress levels.

A Comparative Study of the Solder Joint Reliability in Flip Chip Assemblies with Compliant and Rigid Substrates

2007 ◽  
Vol 353-358 ◽  
pp. 2932-2935
Author(s):  
Yong Cheng Lin ◽  
Xu Chen ◽  
Xing Shen Liu ◽  
Guo Quan Lu
Keyword(s):  
Solder Joint ◽  
Fatigue Failure ◽  
Flip Chip ◽  
Solder Joints ◽  
Temperature Cycling ◽  
Failure Behavior ◽  
Stress Strain ◽  
Solder Joint Reliability ◽  
Joint Reliability ◽  
Failure Life

The reliability of solder joints in flip chip assemblies with both compliant (flex) and rigid (PCB) substrates was studied by accelerated temperature cycling tests and finite element modeling (FEM). In-process electrical resistance measurements and nondestructive evaluations were conducted to monitor solder joint failure behavior, hence the fatigue failure life. Meanwhile, the predicted fatigue failure life of solder joints was obtained by Darveaux’s crack initiation and growth models. It can be concluded that the solder joints in flip chip on flex assembly (FCOF) have longer fatigue life than those in flip chip on rigid board assembly (FCOB); the maximum von Mises stress/strain and the maximum shear stress/strain of FCOB solder joints are much higher than those of FCOF solder joints; the thermal strain and stress in solder joints is reduced by flex buckling or bending and flex substrate could dissipate energy that otherwise would be absorbed by solder joint. Therefore, the substrate flexibility has a great effect on solder joint reliability and the reliability improvement was attributed to flex buckling or bending during temperature cycling.

Design for Solder Joint Fatigue Life of BGA Package Subject to Mechanical Environment

2013 ◽  
Vol 2013 (1) ◽  
pp. 000250-000259
Author(s):  
Jia-Shen Lan ◽  
Mei-Ling Wu
Keyword(s):  
Fatigue Life ◽  
Analytical Solution ◽  
Solder Joint ◽  
Solder Joints ◽  
Assessment Model ◽  
Personal Digital Assistants ◽  
Pcb Assembly ◽  
Bga Package ◽  
Mechanical Bending ◽  
Solder Joint Fatigue

There has been a dramatic proliferation of research concerned with thermal stress in electronic package for the last three decades. Moreover, reviewing the mechanical bending during printed circuit board (PCB) assembly has become important in the reliability assessment of modern electronic systems. The primary research demonstrates that the assessment approach can be applied successfully to the design model of a ball grid array (BGA) package with a more complete and accurate assessment model for solder joint fatigue life under mechanical bending. Previous research has focused mostly on the thermal analysis in electronic packages; however, most modern portable electronic products used in mobile devices, personal digital assistants, and aircraft have to endure extreme environments that involve not only thermal but also mechanical bending conditions. Initially, mechanical bending tests were conducted to demonstrate the reliability of the electronic packaging during the manufacturing and shipping process. Currently, the microelectronic packaging faces mechanical bending when everyone uses his or her Smartphones. The mechanical bending occurs when the user touches the screen on the Smartphone. Therefore, interest in the mechanical bending of BGA packaging has increased with the uptake in mobile device use. In this research, the analytical solution and finite element analysis (FEA) are both presented to investigate the solder joint fatigue life. The analytical solution is presented for a PCB assembly subjected to mechanical bending by taking the axial stress, shear stress, and moment of the solder joints with discontinuity function into account. A FEM is proposed to analyze the solder joint fatigue life and to investigate the reliability of solder joints in BGA packaging subjected to mechanical bending.

Heat Sink Induced Thermo-Mechanical Joint Strain in QFN Devices

2013 ◽  
Vol 2013 (1) ◽  
pp. 000467-000472
Author(s):  
Gerard McVicker ◽  
Vijay Khanna ◽  
Sri M. Sri-Jayantha
Keyword(s):  
Solder Joint ◽  
Heat Sink ◽  
Power Distribution ◽  
Strain Energy ◽  
Heat Dissipation ◽  
Coefficient Of Thermal Expansion ◽  
Inelastic Strain ◽  
Temperature Cycling ◽  
Image Correlation ◽  
Solder Joint Fatigue

A Blade Server System (BSS) utilizes Voltage Regulator Modules (VRM), in the form of Quad Flat No-Lead (QFN) devices, to provide power distribution to various components on the system board. Depending on the power requirements of the circuit, these VRM's can be mounted as single devices or banked together. In addition, the power density of the VRM can be high enough to warrant heat dissipation through the use of a heat sink. Typically, during field conditions (FC) the BSS are powered on and off up to four times per day, with their ambient temperature cycling between 25°C and 80°C. This cyclical temperature gradient drives inelastic strain in the solder joints due to the coefficient of thermal expansion (CTE) mismatch between the QFN and the circuit card. In addition, the heat sink, coupled to the QFN and the circuit card, can induce additional inelastic solder joint strain, resulting in early solder joint fatigue failure. To understand the effect of the heat sink mounting, a FEM (Finite Element Model) of four QFN's mounted to a BSS circuit card was developed. The model was exercised to calculate the maximum strain energy in a critical joint, due to the cyclical straining, and the results were compared for a QFN with and without a heat sink. It was determined that the presence of the heat sink did contribute to higher strain energy and therefore could lead to earlier joint failure. While the presence of the heat sink is required, careful design of the mounting should be employed to provide lateral slip, essentially decoupling the heat sink from the QFN joint strain. Details of the modeling and results, along with DIC (Digital Image Correlation) measurements of heat sink lateral slip, are presented.

Heat Sink Induced Thermomechanical Joint Strain in QFN Devices

2014 ◽  
Vol 11 (2) ◽  
pp. 80-86
Author(s):  
Gerard McVicker ◽  
Vijay Khanna ◽  
M. Sri-Jayantha
Keyword(s):  
Solder Joint ◽  
Heat Sink ◽  
Power Distribution ◽  
Strain Energy ◽  
Heat Dissipation ◽  
Coefficient Of Thermal Expansion ◽  
Inelastic Strain ◽  
Temperature Cycling ◽  
Image Correlation ◽  
Solder Joint Fatigue

A blade server system (BSS) utilizes voltage regulator modules (VRMs), in the form of quad flat no-lead (QFN) devices, to provide power distribution to various components on the system board. Depending on the power requirements of the circuit, these VRMs can be mounted as single devices or banked together. In addition, the power density of the VRM can be high enough to warrant heat dissipation through the use of a heat sink. Typically, at field conditions (FCs), the BSS are powered on and off up to four times per day, with their ambient temperature cycling between 25°C and 80°C. This cyclical temperature gradient drives inelastic strain in the solder joints due to the coefficient of thermal expansion (CTE) mismatch between the QFN and the circuit card. In addition, the heat sink, coupled with the QFN and the circuit card, can induce additional inelastic solder joint strain, resulting in early solder joint fatigue failure. To understand the effect of the heat sink mounting, a FEM (finite element model) of four QFNs mounted to a BSS circuit card was developed. The model was exercised to calculate the maximum strain energy in a critical joint due to cyclic strain, and the results were compared for a QFN with and without a heat sink. It was determined that the presence of the heat sink did contribute to higher strain energy and therefore could lead to earlier joint failure. Although the presence of the heat sink is required, careful design of the mounting should be employed to provide lateral slip, essentially decoupling the heat sink from the QFN joint strain. Details of the modeling and results, along with DIC (digital image correlation) measurements of heat sink lateral slip, are presented.

Effects of Strain Rate and Amplitude Variations on Solder Joint Fatigue Life in Isothermal Cycling

2016 ◽  
Vol 138 (2) ◽  
Author(s):  
Sa'd Hamasha ◽  
Peter Borgesen
Keyword(s):  
Fatigue Life ◽  
Solder Joint ◽  
Strain Rate ◽  
Solder Joints ◽  
Constitutive Relations ◽  
Snagcu Solder ◽  
Shear Fatigue ◽  
Deformation Properties ◽  
Service Conditions ◽  
Solder Joint Fatigue

The behavior of lead-free solder alloys under realistic service conditions is still not well understood. Life prediction of solder joints relies on conducting accelerated tests and extrapolating results to service conditions. This can be very misleading without proper constitutive relations and without understanding the effects of cycling parameter variations common under realistic service conditions. It has been shown that the fatigue life depends on the inelastic work accumulation, independently of cycling-induced material property variations, which explains the breakdown of damage accumulation rules and allows the development of a modified Miner's rule. This paper discusses the interacting effects of strain rate and amplitude variations on solder joint fatigue life. Individual SnAgCu solder joints with two different Ag contents (SAC305 and SAC105) were tested in low cycling shear fatigue under single and varying amplitudes with different strain rates. Such a shear fatigue experiment allows the measurement of work accumulation and the evolution of solder deformation properties during cycling. The results showed that cycling with a lower strain rate at fixed amplitude causes more damage per cycle. Alternating between mild amplitude at a high strain rate and harsh amplitude at a low strain rate leads to ongoing increases in the rate of damage at the mild amplitude and thus relatively rapid failure. In comparing SAC305 with SAC105, the effect of strain rate on both alloys is almost the same, and SAC305 is still more fatigue resistant than SAC105 in varying amplitude cycling with any strain rate.

Sign in / Sign up

Export Citation Format

Share Document