Measuring and Optimizing Thermal Interface Material Performance for VR Heatsink Designs

Author(s):  
Jun Lu ◽  
Michelle C. Lin ◽  
Bernie Short

With increasingly high powers on processors, memories, and chipsets, the voltage regulators (VR) become heavily loaded and a heatsink is often required to prevent overheating the surrounding components on the board. For VR heatsink designs, thermal interface silicone gap filler pads are often used and there is an increasing need to improve VR thermal solutions by reducing thermal resistance of the TIM. A series of TIM2 thickness and performance measurements based on thermal testing was performed in order to understand gap filler characteristics, optimize TIM performance, and utilize best retention design. By utilizing a VR thermal and mechanical test board in wind tunnel testing using the same VR heatsink, thermal performance of TIM2 using gap filler pads over a range of airflow velocities can be measured and compared. The study shows how the optimum TIM performance can be achieved by using the gap filler pads with appropriate thickness for the given designed heatsink standoff heights. The benefit of choosing the right thickness pads over others can be significant and is a valuable learning that can be applied to future VR heatsink designs. Furthermore, the silicone gap filler characteristics and its relationship to board bending and result TIM thickness and thermal performance are investigated and further improved. The learnings help understand the limitations and where the area of improvement can be for future VR heatsink designs.

Author(s):  
Baratunde A. Cola ◽  
Xianfan Xu ◽  
Timothy S. Fisher

The thermal performance of an interface material comprised of a metal foil with dense, vertically oriented carbon nanotube (CNT) arrays synthesized on both of its surfaces is characterized for rough and smooth interfaces. The CNT/foil deforms in the interfaces by two mechanisms, CNT deformation and foil deformation, that may significantly increase the number of CNT contact spots on both sides of the foil. As a result, the thermal conduction at the CNT-array-free-tip interfaces is greatly increased from previous measurements.


Author(s):  
Simon Vandevelde ◽  
Alain Daidié ◽  
Marc Sartor

This paper proposes the use of 1D basic models to build a design assistance tool capable of evaluating the heat transfer between a third-level electronic packaging and its support, considering a conventional configuration where a thermal interface material is placed between these two parts. Using this kind of tool early in the design process may facilitate choices concerning geometry and material. The packaging is modelled by a stepped beam (the equipment) and the interface layer by a nonlinear elastic foundation (the thermal interface material). Considering that the electronic equipment bends under the effect of the forces exerted by the fasteners, the tool makes it possible to determine the contact zone remaining operative after deformation, and the pressure distribution at the interface. Mechanical results are then used to calculate the steady-state heat transfer between the equipment and its support, taking into account the diffusion within the equipment and the thermal interface material, and also the thermal contact resistances, the latter being dependent on the contact pressure. A detailed case study is used to illustrate the utility of the approach. The 1D models are exploited to illustrate the interest of the design assistance tool. The influence of different parameters on the thermal performance is studied and a new innovative proposal is analyzed, which could lead to a significant increase in thermal performance.


Energies ◽  
2019 ◽  
Vol 12 (11) ◽  
pp. 2080 ◽  
Author(s):  
Andreas Nylander ◽  
Josef Hansson ◽  
Majid Kabiri Samani ◽  
Christian Chandra Darmawan ◽  
Ana Borta Boyon ◽  
...  

As feature density increases within microelectronics, so does the dissipated power density, which puts an increased demand on thermal management. Thermal interface materials (TIMs) are used at the interface between contacting surfaces to reduce the thermal resistance, and is a critical component within many electronics systems. Arrays of carbon nanotubes (CNTs) have gained significant interest for application as TIMs, due to the high thermal conductivity, no internal thermal contact resistances and an excellent conformability. While studies show excellent thermal performance, there has to date been no investigation into the reliability of CNT array TIMs. In this study, CNT array TIMs bonded with polymer to close a Si-Cu interface were subjected to thermal cycling. Thermal interface resistance measurements showed a large degradation of the thermal performance of the interface within the first 100 cycles. More detailed thermal investigation of the interface components showed that the connection between CNTs and catalyst substrate degrades during thermal cycling even in the absence of thermal expansion mismatch, and the nature of this degradation was further analyzed using X-ray photoelectron spectroscopy. This study indicates that the reliability will be an important consideration for further development and commercialization of CNT array TIMs.


Author(s):  
Y. Zhao ◽  
D. Strauss ◽  
Y. C. Chen ◽  
T. Liao ◽  
C. L. Chen

Thermal interface materials (TIMs) play a critical role in microelectronics packaging. In this paper, a novel aligned-graphite/solder TIM is described. Unlike traditional TIMs infiltrated with randomly-oriented high-conductivity fillers, the aligned-graphite/solder TIMs provide both extraordinarily high thermal conductivity along the heat transport direction, and controllable stiffness to conform to surfaces with different roughness and hardness, greatly improving the overall heat transfer performance. In addition, vertically connected solder layers can lock the graphite layers in place and reinforce the strength of the entire package. Thermal performance of the graphite TIMs was determined experimentally based on the ASTM-D5470 method with comparison to two commercially available TIMs. The graphite TIMs also experienced a thermal cycling test and a high temperature stability test to establish its performance merit in practical applications. Experiments showed that the overall thermal resistivity of a 150-to-200-μm-thick graphite TIM film was less than 0.035 °C/(W/cm2) when bonding two smooth copper surfaces together at a processing pressure of 30 psi, which corresponds to an approximately 2–3X improvement over a Ag-Sn solder alloy (Indalloy 121). Preliminary thermal cycling and high temperature stability tests showed that the thermal performance of the graphite TIM was very stable, and did not degrade during these tests. The tests also indicated that the presence of surface roughness of 10 μm on one of the copper surfaces reduced the overall thermal resistivity by approximately 30%. A numerical simulation verified this trend.


2014 ◽  
Vol 45 (12) ◽  
pp. 1726-1733 ◽  
Author(s):  
P. Anithambigai ◽  
S. Shanmugan ◽  
D. Mutharasu ◽  
T. Zahner ◽  
D. Lacey

Author(s):  
Andriy Diachenko ◽  
Hanna Malieieva

This paper describes the representation and generation of a key pair for one of the promising candidates at the NIST USA level in the NIST PQC competition for the direction of digital signatures of the Rainbow algorithm. This algorithm is a candidate for the third round of selection and a possible option for Ukraine to build its own DS standards based on the mathematics of multivariable quadratic schemes (MQ transformations), which is used in this algorithm. Within the competition, the developers give several sets of parameters for different security levels and several possible implementations of the algorithm (classical, CZ, compressed), but the given description and performance measurements, for the described algorithm, concern the classical Rainbow scheme (although the declared performance improvement is also fair in relation to other versions).


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