Optical architecture using multiwavelength and polarization encoding for high-speed parallel relational database processing

Abstract New aerospace designs will incorporate new concepts as a result of advances made in the scientific and engineering technologies. These new concepts will afford the aircraft designer with an interesting and somewhat envious dilemma. The aircraft designer will have unprecedented flexibility in design concepts. However, this new flexibility will often be paralleled in ever increasing design complexity. Aircraft such as the High Speed Civil Transport (HSCT) will provide a design environment which will require the efficient use of new technologies in an arena which has historically proven to have stringent performance and cost goals which must be met in order to result in a successful design. The complexity of the HSCT design will dictate a close multidisciplinary effort requiring large amounts of data exchange. Moreover, with the enormous development costs associated with such a design, corporate teaming is essential. It is critical to the success of the HSCT and future aircraft design that a new approach be taken toward the management and exchange of information. A top-down data management design structure should be developed and implemented in the early stages in order to optimize the design process. A small scale multidisciplinary relational database management design has been developed for the HSCT in order to gain a better understanding of how efficient data management can optimize the aircraft design process.

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A case study of development of the transportation plan and the operation control system for a high-speed railway using a relational database

Computers in Railways XIV ◽

10.2495/cr140481 ◽

2014 ◽

Cited By ~ 1

Author(s):

T. Nakamura

Keyword(s):

Control System ◽

Relational Database ◽

High Speed ◽

High Speed Railway ◽

Operation Control ◽

Transportation Plan

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Microfabrication research at the National Submicron Facility

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100074331 ◽

1983 ◽

Vol 41 ◽

pp. 86-89

Author(s):

E.D. Wolf

Keyword(s):

Integrated Circuits ◽

Particle Physics ◽

High Speed ◽

New Technology ◽

High Energy ◽

High Energy Particle ◽

New Science ◽

Wide Range ◽

Intermediate Domain ◽

Circuit Function

Most microelectronics devices and circuits operate faster, consume less power, execute more functions and cost less per circuit function when the feature-sizes internal to the devices and circuits are made smaller. This is part of the stimulus for the Very High-Speed Integrated Circuits (VHSIC) program. There is also a need for smaller, more sensitive sensors in a wide range of disciplines that includes electrochemistry, neurophysiology and ultra-high pressure solid state research. There is often fundamental new science (and sometimes new technology) to be revealed (and used) when a basic parameter such as size is extended to new dimensions, as is evident at the two extremes of smallness and largeness, high energy particle physics and cosmology, respectively. However, there is also a very important intermediate domain of size that spans from the diameter of a small cluster of atoms up to near one micrometer which may also have just as profound effects on society as “big” physics.

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Vacuum System to Minimize the Specimen Contamination of High-Performance EM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100077967 ◽

1977 ◽

Vol 35 ◽

pp. 68-69

Author(s):

N. Yoshimura ◽

K. Shirota ◽

T. Etoh

Keyword(s):

Electron Microscope ◽

High Speed ◽

High Performance ◽

High Vacuum ◽

Vacuum System ◽

Pump System ◽

Pumping System ◽

Diffusion Pump ◽

Almost All ◽

Cascade Type

One of the most important requirements for a high-performance EM, especially an analytical EM using a fine beam probe, is to prevent specimen contamination by providing a clean high vacuum in the vicinity of the specimen. However, in almost all commercial EMs, the pressure in the vicinity of the specimen under observation is usually more than ten times higher than the pressure measured at the punping line. The EM column inevitably requires the use of greased Viton O-rings for fine movement, and specimens and films need to be exchanged frequently and several attachments may also be exchanged. For these reasons, a high speed pumping system, as well as a clean vacuum system, is now required. A newly developed electron microscope, the JEM-100CX features clean high vacuum in the vicinity of the specimen, realized by the use of a CASCADE type diffusion pump system which has been essentially improved over its predeces- sorD employed on the JEM-100C.

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The on-line use of histogram data for high-speed correction and alignment of electron microscope images

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100112713 ◽

1984 ◽

Vol 42 ◽

pp. 556-557

Author(s):

William Krakow

Keyword(s):

Power Spectrum ◽

High Speed ◽

Direct Memory Access ◽

Digital Television ◽

Contrast Transfer Function ◽

The Past ◽

High Resolution Tem ◽

On Line ◽

Correction Of Astigmatism ◽

The Fourier Transform

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.

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Structural changes in silicon-on-insulator material during post-implantation annealing

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100145054 ◽

1986 ◽

Vol 44 ◽

pp. 736-737

Author(s):

C. O. Jung ◽

S. J. Krause ◽

S.R. Wilson

Keyword(s):

Integrated Circuits ◽

Oxide Layer ◽

High Speed ◽

Structural Changes ◽

Device Fabrication ◽

Silicon On Insulator ◽

High Quality ◽

Radiation Hardened ◽

Post Implantation ◽

Very High

Silicon-on-insulator (SOI) structures have excellent potential for future use in radiation hardened and high speed integrated circuits. For device fabrication in SOI material a high quality superficial Si layer above a buried oxide layer is required. Recently, Celler et al. reported that post-implantation annealing of oxygen implanted SOI at very high temperatures would eliminate virtually all defects and precipiates in the superficial Si layer. In this work we are reporting on the effect of three different post implantation annealing cycles on the structure of oxygen implanted SOI samples which were implanted under the same conditions.

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