Role of Interfaces in the Permittivity Tensor of Thin Layers of a Ferromagnetic Metal

JETP Letters ◽  
2021 ◽  
Vol 114 (3) ◽  
pp. 163-165
Author(s):  
S. G. Ovchinnikov ◽  
O. A. Maximova ◽  
S. A. Lyaschenko ◽  
I. A. Yakovlev ◽  
S. N. Varnakov
1993 ◽  
Vol 310 ◽  
Author(s):  
Toshihiko Tani ◽  
Zhengkui Xu ◽  
David A. Payne

AbstractPLZT thin layers were deposited onto various substrates by sol-gel methods, and crystallized under different conditions and substrate treatments. Relationships are given for the chemical characteristics of the substrate's surface and the preferred orientations which develop on heat treatment. A preferred (111) orientation always developed for perovskite crystallized on Pt layers which contained Ti on the surface. This was attributed to the formation of Pt3Ti and the role of heteroepitaxial nucleation and growth sites. In addition, a preferred (100) orientation was also obtained on unannealed Pt/Ti/SiO2/Si substrates which were free of Ti on the surface. This was attributed to self-textured growth with flat faces striving for minimum surface energy conditions. The results are discussed in terms of the importance of interfacial chemistry on the control of texture for crystallization of PLZT thin layers on coated substrates.


2005 ◽  
Vol 97 (3) ◽  
pp. 034905 ◽  
Author(s):  
A. Vomiero ◽  
E. Boscolo Marchi ◽  
G. Mariotto ◽  
G. Della Mea ◽  
A. Scandurra ◽  
...  
Keyword(s):  

Author(s):  
F. Honda ◽  
M. Goto

Tribological performance of sub-nano to nanometer-thick Ag layers deposited on Si(111) have been examined to understand the role of surface thin layers to the wear and friction characteristics. The slider was made of diamond sphere of 3 mm in radius. Sliding tests were carried out in an ultra-high vacuum environment (lower than 4 × 10−8 Pa) and analyzed in-situ by Auger electron spectroscopy (AES) for the quantitative thickness-measurements, by reflection high-energy electron diffraction (RHEED) to clarify the substrate cleanliness and crystallography of the Ag films, and by scanning probe microscopy (SPM) for the morphology of the deposited/slid film surfaces. As the results, a minimum of the friction coefficient 0.007 was observed from the film thickness range of 1.5–10 nm, and exactly no worn particles were found after 100 cycles of reciprocal sliding. Results have directly indicated that solid Ag(111) sliding planes allowed to reduce the friction coefficient very low without any detectable wear particles, and Ag nanocrystallites in Ag polycrystalline layers increase the size to 20–40 nm order, during sliding. The friction coefficient was slightly dependent to the normal load. Results were discussed on the role of the surface atoms to the friction, and a mechanism of sliding on Ag thin layers.


2003 ◽  
Vol 10 (02n03) ◽  
pp. 537-541 ◽  
Author(s):  
Y. Takeda ◽  
M. Tabuchi ◽  
H. Amano ◽  
I. Akasaki

Crystalline and morphological quality of low-temperature (LT)-deposited and annealed AlN and GaN thin layers were investigated by X-ray crystal truncation rod (CTR) scattering and X-ray reflectivity measurements and atomic force microscope (AFM) observation. It was revealed that the LT-AlN layer was more uniform in terms of the crystalline structure and the layer thickness than the LT-GaN layer, before and after annealing. It suggests that LT-AlN is more suitable as a buffer layer between sapphire substrate and GaN.


2012 ◽  
Vol 25 (6) ◽  
pp. 899-903 ◽  
Author(s):  
Andres Castellanos-Gomez ◽  
Emmanuele Cappelluti ◽  
Rafael Roldán ◽  
Nicolás Agraït ◽  
Francisco Guinea ◽  
...  

Energy ◽  
2022 ◽  
Vol 239 ◽  
pp. 122218
Author(s):  
Shangyong Zhou ◽  
Jiancun Gao ◽  
Zhenmin Luo ◽  
Shoutao Hu ◽  
Le Wang ◽  
...  

1987 ◽  
Vol 37 (1) ◽  
pp. 15-28 ◽  
Author(s):  
A. B. Mikhailovskii ◽  
O. G. Onishchenko

The role of relativistic effects in the problem of drift instabilities in an inhomogeneous magnetized plasma is analysed. The kinetic approach is developed, taking into account a non-zero plasma pressure and the electromagnetic character of the perturbations. The general dispersion relation for the perturbations in an inhomogeneous relativistic plasma is obtained. As in the case of a non-relativistic plasma, the dispersion relation is written in terms of the modified dielectric permittivity tensor. This tensor is calculated by taking into account the non-Maxwellian character of the equilibrium momentum distributions of the particles. The relation between the modified dielectric permittivity tensor and the ordinary tensor of dielectric permittivity of a homogeneous plasma is elucidated.


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