Imaging of a test object with a trapezoidal profile and large side wall inclinations in a scanning electron microscope in the backscattered electron mode

Author(s):  
Yu. A. Novikov
1987 ◽  
Vol 60 (4) ◽  
pp. 689-704 ◽  
Author(s):  
B. C. Begnoche ◽  
R. L. Keefe ◽  
A. G. Causa

Abstract A variety of techniques were developed or investigated which were useful in pinpointing microfailure locations and determining failure mechanisms at the aramid fiber-adhesive-rubber interfaces. All of the techniques were microscopy related. The scanning electron microscope was the most useful tool, especially in the seldom used backscattered electron mode, when its variety of add-on options were employed, and support techniques were developed. Optical incident-light fluorescence microscopy used in the medical field proved to be a valuable supplement to the SEM, allowing verification of the microfailure mode when used on the same samples.


2014 ◽  
Vol 668-669 ◽  
pp. 936-939
Author(s):  
Quan Wen ◽  
Zhao Yang Ding ◽  
Fu Sheng Kou ◽  
Peng Zhou

Mechanism and functions of S-4800 Scanning Electron Microscope are introduced in this paper. The image-forming mechanism and structure of SEM are studied, and the signal transformation of secondary electron and backscattered electron is presented. The main application fields of SEM are researched.


2004 ◽  
Vol 19 (2) ◽  
pp. 100-103 ◽  
Author(s):  
R. P. Goehner ◽  
J. R. Michael

The identification of crystallographic phases in the scanning electron microscope (SEM) has been limited by the lack of a simple way to obtain electron diffraction data of an unknown while observing the microstructure of the specimen. With the development of charge coupled device (CCD)-based detectors, backscattered electron Kikuchi patterns, alternately referred to as electron backscattered diffraction (EBSD) patterns, can be easily collected. Previously, EBSD has been limited to crystallographic orientation studies due to the poor pattern quality collected with video rate detector systems. With CCD detectors, a typical EBSD can now be acquired from a micron or submicron sized crystal using an exposure time of 1–10 s with an accelerating voltage of 10–40 kV and a beam current as low as 0.1 nA. Crystallographic phase analysis using EBSD is unique in that the properly equipped SEM permits high magnification images, EBSDs, and elemental information to be collected from bulk specimens. EBSD in the SEM has numerous advantages over other electron beam-based crystallographic techniques. The large angular view (∼70°) provided by EBSD and the ease of specimen preparation are distinct advantages of the technique. No sample preparation beyond what is commonly used for SEM specimens is required for EBSD.


Author(s):  
L.W. McDonald ◽  
R.F.W. Pease ◽  
T.L. Hayes

In previous studies from this laboratory the scanning electron microscope has been used to examine biological materials in the cathodo-luminescense and secondary electron modes. In these studies intact cells or even entire insects have been examined, some in the living state. Epithelial surfaces have been exposed and examined. Prior to the work to be described, no reports of the examination of tissue sections in the scanning electron microscope have been found, although sufaces of solid one millimeter cubes of tissue have been examined.In the present work blocks of solid tissue fixed in buffered aldehyde have been dehydrated in graded alcohols, embedded in paraffin, section at 4μ and examined successfully in the scanning electron microscope. These sections have been over 1 cm square and have been stained for subsequent comparative examination with the light microscope. With the scanning electron microscope in the secondary electron mode, magnifications of X5,000 have been found useful. In addition to the increased resolution as compared to the light microscope, a three dimensional image is obtained. An advantage over the conventional electron microscope is that tissue areas 1,000 times greater may be examined in the large sections without any obscuring grid bars, again with the three dimensional image. With the cathode ray display tube used, magnifications range from X30 to over X20,000


Author(s):  
Peter Friedman

A technique is presented here which facilitates the identification of myelinated axons in human spinal nerves and spinal cord using the scanning electron microscope (SEM). By examining the backscattered electron (BSE) image of a modified osmium-thiocarbohydrazide-osmium (OTO) treatment the myelin sheaths of individual axons can be identified.Two factors contribute to this BSE imaging: 1) multiple layers of osmium (mediated by the osmiophilic ligand thiocarbohydrazide, NH2NHCSNHNH2) are deposited in the tissue during the 0T0 treatment, and 2) since the myelin sheath contains the greatest concentration of unsaturated lipids, it incorporates more osmium than any other neural structure. This enhanced mass-density of the myelin sheath will then be imaged in the BSE mode of the SEM as a brighter area due to the greater number of primary electrons being backscattered by the osmium.


Author(s):  
P. S. D. Lin ◽  
M. K. Lamvik

Unlike a CEM or high resolution STEM, where the specimen is immersed between the pole pieces of the objective lens, a scanning electron microscope has its specimen stage situated off the lens field. After scattering with the specimen, electrons follow straight paths. It is rather simple to deduce the information from the signal. A transmission stage in a SEM is therefore a useful device for studying various scattering processes and the contrast thus generated.The transmission stage can also be used in connection with the investigation of secondary and backscattered electron emission phenomena. Previously, a back-scattered electron detector was installed in one of the scanning microscopes in the laboratory.


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