Growth surface topography of kaolinite-group minerals and their simulation based on the regular sequence of enantiomorphic layers

2014 ◽  
Vol 59 (4) ◽  
pp. 594-606
Author(s):  
N. D. Samotoin ◽  
N. S. Bortnikov
2020 ◽  
Author(s):  
Colin L. Hisey ◽  
James I. Hearn ◽  
Yohanes N. S. Nursalim ◽  
Derek J. Hansford ◽  
Cherie Blenkiron ◽  
...  

2017 ◽  
Vol 9 (22) ◽  
pp. 18531-18539 ◽  
Author(s):  
Arunima Bhattacharjee ◽  
Mughees Khan ◽  
Maya Kleiman ◽  
Allon I. Hochbaum

Micromachines ◽  
2021 ◽  
Vol 12 (5) ◽  
pp. 496
Author(s):  
Timo Platt ◽  
Alexander Meijer ◽  
Torben Merhofe ◽  
Dirk Biermann

One of the major advantages of micromachining is the high achievable surface quality at highly flexible capabilities in terms of the machining of workpieces with complex geometric properties. Unfortunately, finishing operations often result in extensive process times due to the dependency of the resulting surface topography on the cutting parameter, e.g., the feed per tooth, fz. To overcome this dependency, special tool shapes, called wipers, have proven themselves in the field of turning. This paper presents the transfer of such tool shapes to solid carbide milling tools for micromachining. In this context, a material removal simulation (MRS) was used to investigate promising wiper geometries for micro end mills (d = 1 mm). Through experimental validation of the results, the surface topography, the resulting process forces, and tendencies in the residual stress state were investigated, machining the hot work tool steel (AISI H11). The surface-related results show a high agreement and thus the potential of MRS for tool development. Deviations from the experimental data for large wipers could be attributed to the non-modeled tool deflections, friction, and plastic deformations. Furthermore, a slight geometry-dependent increase in cutting forces and compressive stresses were observed, while a significant reduction in roughness up to 84% and favorable topography conditions were achieved by adjusting wipers and cutting parameters.


Author(s):  
Colin L. Hisey ◽  
James I. Hearn ◽  
Derek J. Hansford ◽  
Cherie Blenkiron ◽  
Lawrence W. Chamley

Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.


Author(s):  
P.G. Pawar ◽  
P. Duhamel ◽  
G.W. Monk

A beam of ions of mass greater than a few atomic mass units and with sufficient energy can remove atoms from the surface of a solid material at a useful rate. A system used to achieve this purpose under controlled atmospheres is called an ion miliing machine. An ion milling apparatus presently available as IMMI-III with a IMMIAC was used in this investigation. Unless otherwise stated, all the micro milling operations were done with Ar+ at 6kv using a beam current of 100 μA for each of the two guns, with a specimen tilt of 15° from the horizontal plane.It is fairly well established that ion bombardment of the surface of homogeneous materials can produce surface topography which resembles geological erosional features.


Author(s):  
David C. Joy ◽  
Dennis M. Maher

High-resolution images of the surface topography of solid specimens can be obtained using the low-loss technique of Wells. If the specimen is placed inside a lens of the condenser/objective type, then it has been shown that the lens itself can be used to collect and filter the low-loss electrons. Since the probeforming lenses in TEM instruments fitted with scanning attachments are of this type, low-loss imaging should be possible.High-resolution, low-loss images have been obtained in a JEOL JEM 100B fitted with a scanning attachment and a thermal, fieldemission gun. No modifications were made to the instrument, but a wedge-shaped, specimen holder was made to fit the side-entry, goniometer stage. Thus the specimen is oriented initially at a glancing angle of about 30° to the beam direction. The instrument is set up in the conventional manner for STEM operation with all the lenses, including the projector, excited.


Author(s):  
Z.L. Wang ◽  
J. Bentley ◽  
R.E. Clausing ◽  
L. Heatherly ◽  
L.L. Horton

Microstructural studies by transmission electron microscopy (TEM) of diamond films grown by chemical vapor deposition (CVD) usually involve tedious specimen preparation. This process has been avoided with a technique that is described in this paper. For the first time, thick as-grown diamond films have been examined directly in a conventional TEM without thinning. With this technique, the important microstructures near the growth surface have been characterized. An as-grown diamond film was fractured on a plane containing the growth direction. It took about 5 min to prepare a sample. For TEM examination, the film was tilted about 30-45° (see Fig. 1). Microstructures of the diamond grains on the top edge of the growth face can be characterized directly by transmitted electron bright-field (BF) and dark-field (DF) images and diffraction patterns.


Author(s):  
J.P. Benedict ◽  
Ron Anderson ◽  
S. J. Klepeis

Traditional specimen preparation procedures for non-biological samples, especially cross section preparation procedures, involves subjecting the specimen to ion milling for times ranging from minutes to tens of hours. Long ion milling time produces surface alteration, atomic number and rough-surface topography artifacts, and high temperatures. The introduction of new tools and methods in this laboratory improved our ability to mechanically thin specimens to a point where ion milling time was reduced to one to ten minutes. Very short ion milling times meant that ion milling was more of a cleaning operation than a thinning operation. The preferential thinning and the surface topography that still existed in briefly ion milled samples made the study of interfaces between materials such as platinum silicide and silicon difficult. These two problems can be eliminated by completely eliminating the ion milling step and mechanically polishing the sample to TEM transparency with the procedure outlined in this communication. Previous successful efforts leading to mechanically thinned specimens have shown that problems center on tool tilt control, removal of polishing damage, and specimen cleanliness.


Author(s):  
William Krakow ◽  
Alec N. Broers

Low-loss scanning electron microscopy can be used to investigate the surface topography of solid specimens and provides enhanced image contrast over secondary electron images. A high resolution-condenser objective lens has allowed the low-loss technique to resolve separations of Au nucleii of 50Å and smaller dimensions of 25Å in samples coated with a fine grained carbon-Au-palladium layer. An estimate of the surface topography of fine grained vapor deposited materials (20 - 100Å) and the surface topography of underlying single crystal Si in the 1000 - 2000Å range has also been investigated. Surface imaging has also been performed on single crystals using diffracted electrons scattered through 10−2 rad in a conventional TEM. However, severe tilting of the specimen is required which degrades the resolution 15 to 100 fold due to image forshortening.


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