EVALUATION OF THIN SECTION STANDARDS FOR LOCAL ANALYSIS OF LIGHT ELEMENTS BY MICRO-PIXE ANALYSIS
For quantitative measurements of light elements by micro-PIXE (particle-induced X-ray emission) analysis, suitable external standards have been expected. In this paper thin sections of polyvinyl alcohol solution containing phosphorus ( P ) and potassium ( K ) were assessed for their purpose as standards by micro-PIXE analysis. Homogeneity of P and K added to the standard materials were validated by 1 μm and 10 μm-step scanning of the standard. The relative standard deviations of the X-ray intensity of the standards P and K were < 25% and <16%, respectively. The calibration line between the X-ray intensity obtained from a 100 × 100 μm2 area and the elements concentration was also acceptable, indicating that the thin section standards are adequate for an external standard of micro-PIXE measurements for light elements.