CRITICAL STEPS IN DATA ANALYSIS FOR PRECISION CASIMIR FORCE MEASUREMENTS WITH SEMICONDUCTING FILMS

2011 ◽  
Vol 26 (22) ◽  
pp. 3900-3909 ◽  
Author(s):  
A. A. BANISHEV ◽  
CHIA-CHENG CHANG ◽  
U. MOHIDEEN
Keyword(s):  
Data Analysis ◽  
Indium Tin Oxide ◽  
Casimir Force ◽  
High Vacuum ◽  
Force Measurements ◽  
Uv Treatment ◽  
Critical Data ◽  
Ito Film ◽  
Atomic Force ◽  
Gold Sphere

Some experimental procedures and corresponding results of the precision measurement of the Casimir force between low doped Indium Tin Oxide ( ITO ) film and gold sphere are described. Measurements were performed using an Atomic Force Microscope in high vacuum. It is shown that the magnitude of the Casimir force decreases after prolonged UV treatment of the ITO film. Some critical data analysis steps such as the correction for the mechanical drift of the sphere-plate system and photodiodes are discussed.

scholarly journals CRITICAL STEPS IN DATA ANALYSIS FOR PRECISION CASIMIR FORCE MEASUREMENTS WITH SEMICONDUCTING FILMS

2011 ◽  
Vol 03 ◽  
pp. 497-506 ◽  
Author(s):  
A. A. BANISHEV ◽  
CHIA-CHENG CHANG ◽  
U. MOHIDEEN
Keyword(s):  
Data Analysis ◽  
Indium Tin Oxide ◽  
Casimir Force ◽  
High Vacuum ◽  
Force Measurements ◽  
Uv Treatment ◽  
Critical Data ◽  
Ito Film ◽  
Atomic Force ◽  
Gold Sphere

Some experimental procedures and corresponding results of the precision measurement of the Casimir force between low doped Indium Tin Oxide (ITO) film and gold sphere are described. Measurements were performed using an Atomic Force Microscope in high vacuum. It is shown that the magnitude of the Casimir force decreases after prolonged UV treatment of the ITO film. Some critical data analysis steps such as the correction for the mechanical drift of the sphere-plate system and photodiodes are discussed.

CASIMIR FORCE EXPERIMENTS IN AIR: TWO BIRDS WITH ONE STONE

2010 ◽  
Vol 25 (11) ◽  
pp. 2231-2239 ◽  
Author(s):  
S. DE MAN ◽  
K. HEECK ◽  
K. SMITH ◽  
R. J. WIJNGAARDEN ◽  
D. IANNUZZI
Keyword(s):  
Atomic Force Microscope ◽  
High Precision ◽  
Electrostatic Potential ◽  
Casimir Force ◽  
Hydrodynamic Force ◽  
Force Sensor ◽  
Force Measurements ◽  
Atomic Force ◽  
Potential Measure ◽  
Interacting Surfaces

We present a short overview of the recent efforts of our group in the design of high precision Casimir force setups. We first describe our Atomic Force Microscope based technique that allows one to simultaneously and continuously calibrate the instrument, compensate for a residual electrostatic potential, measure the Casimir force, and, in the presence of a fluid in the gap between the interacting surfaces, measure the hydrodynamic force. Then we briefly discuss a new force sensor that adapts well to Casimir force measurements in critical environments.

CONSTRAINTS ON YUKAWA-TYPE HYPOTHETICAL INTERACTIONS FROM RECENT CASIMIR FORCE MEASUREMENTS

2002 ◽  
Vol 17 (29) ◽  
pp. 4143-4152 ◽  
Author(s):  
G. L. KLIMCHITSKAYA ◽  
U. MOHIDEEN
Keyword(s):  
Atomic Force Microscope ◽  
Long Range ◽  
Casimir Force ◽  
Casimir Effect ◽  
Torsion Pendulum ◽  
Force Measurements ◽  
Atomic Force ◽  
Long Range Interactions ◽  
Conventional Methods

Constraints on the Yukawa-type long-range interactions following from the Casimir effect are considered. The constraints obtained from the recent Casimir force measurements by means of a torsion pendulum and an atomic force microscope are collected and compared. New constraints are obtained from the measurement of the lateral Casimir force. The conclusion is made that the Casimir effect has an advantage over the conventional methods in obtaining stronger constraints on hypothetical interactions.

MEASUREMENTS OF THE NORMAL AND SHAPE DEPENDENT CASIMIR FORCES USING AN ATOMIC FORCE MICROSCOPE

2002 ◽  
Vol 17 (06n07) ◽  
pp. 711-721 ◽  
Author(s):  
F. CHEN ◽  
B. W. HARRIS ◽  
A. ROY ◽  
U. MOHIDEEN
Keyword(s):  
Atomic Force Microscope ◽  
Casimir Force ◽  
Experimental Results ◽  
Precision Measurements ◽  
Force Measurements ◽  
Casimir Forces ◽  
Atomic Force ◽  
History Of

The precision instrumental developments and the modern unification theories using compact dimensions have motivated a resurgence in the field of Casimir force measurements. Here, after a brief discussion of the history of Casimir force measurements, the experimental results of Casimir force measurements using an Atomic Force Microscope will be presented. Precision measurements of the normal Casimir force, demonstration of the shape dependent Casimir force and the lateral Casimir force will be presented.

Formation of oxygen bubbles in K-208 glass under electron irradiation

2020 ◽  
Vol 11 ◽  
pp. 5-14
Author(s):  
R. Kh. Khasanshin ◽  
◽  
L. S. Novikov ◽  
◽  
Keyword(s):  
Surface Layer ◽  
Indium Tin Oxide ◽  
Particle Flux ◽  
Negative Charge ◽  
Force Microscopy ◽  
Ito Film ◽  
Atomic Force ◽  
Radiation Degradation ◽  
Bridge Oxygen ◽  
Oxygen Atoms

The formation of gas-filled bubbles, which is one of the indicators and quantitative criteria for radiation degradation of the surface layer of K-208 glass irradiated by 20-keV electrons, and the effect of ITO (Indium tin oxide) film deposited on the glass, are investigated. Using atomic force microscopy, the nucleation of oxygen bubbles in the surface layer of glass irradiated with a fluence (Φ) of the order of 1015 cm–2 at a particle flux density (φ) of 2·1010 cm–2·s–1 was detected. Gas-filled bubbles appear on the surface of samples with an ITO film at Φ ≥ 4·1015 cm–2 in smaller amounts but larger sizes than on glass without a film. The formation of oxygen bubbles is explained by the formation of a negative charge region in the surface layer of the irradiated glass, in the field of which sodium ions migrate, which plays a key role in the release of non-bridge oxygen atoms. Migration and aggregation of liberated oxygen atoms in defective places in the glass grid leads to the formation of gas-filled bubbles.

scholarly journals PRECISION MEASUREMENT OF THE CASIMIR FORCE FOR Au USING A DYNAMIC AFM

2012 ◽  
Vol 14 ◽  
pp. 270-280 ◽  
Author(s):  
C.-C. CHANG ◽  
A. A. BANISHEV ◽  
R. CASTILLO-GARZA ◽  
G. L. KLIMCHITSKAYA ◽  
V. M. MOSTEPANENKO ◽  
...  
Keyword(s):  
Experimental Data ◽  
Precision Measurement ◽  
Casimir Force ◽  
High Vacuum ◽  
Measurement Range ◽  
Plasma Model ◽  
Atomic Force ◽  
Surface Contaminants ◽  
Modulation Regime ◽  
Model Approach

The gradient of the Casimir force between carefully cleaned Au surfaces of a sphere and a plate is measured using a dynamic atomic force microscope in the frequency modulation regime in high vacuum. The electrostatic calibration of the setup did not reveal any effect of patches or surface contaminants. The experimental data for the force gradient are found to be consistent with theory using the plasma model approach over the entire measurement range. The Drude model approach is excluded by the data at separations from 235 to 400 nm at a 67% confidence level.

scholarly journals Reduction of the Casimir Force from Indium Tin Oxide Film by UV Treatment

2011 ◽  
Vol 107 (9) ◽  
Author(s):  
C.-C. Chang ◽  
A. A. Banishev ◽  
G. L. Klimchitskaya ◽  
V. M. Mostepanenko ◽  
U. Mohideen
Keyword(s):  
Oxide Film ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Casimir Force ◽  
Uv Treatment

Surface Roughness and Grain Size Analysis of Treated Indium Tin Oxide(ITO)Film

2014 ◽  
Vol 680 ◽  
pp. 131-134
Author(s):  
Vithyacharan Retnasamy ◽  
Zaliman Sauli ◽  
Steven Taniselass ◽  
Norhawati Ahmad ◽  
Chai Jee Keng ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Grain Size ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Initial Study ◽  
Grain Size Analysis ◽  
Size Analysis ◽  
Force Microscopy ◽  
Ito Film ◽  
Atomic Force

An initial study has been conducted to characterize the surface morphology of treated Indium Tin Oxide (ITO). Treatment done is annealing process where the samples are put through heat and annealed for an hour. Time of deposition and layers of ITO has been varied to study the correlation between both.The treated ITO are examined under Atomic Force Microscopy (AFM) for the surface roughness and the grain size. Results shows that deposition time of ITO do play an important role in determining a desired grain size in ITO material.

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