scholarly journals COMPONENT-BASED EMBEDDED SOFTWARE ENGINEERING: DEVELOPMENT FRAMEWORK, QUALITY ASSURANCE AND A GENERIC ASSESSMENT ENVIRONMENT

2002 ◽  
Vol 12 (02) ◽  
pp. 107-133 ◽  
Author(s):  
XIA CAI ◽  
MICHAEL R. LYU ◽  
KAM-FAI WONG
Keyword(s):  
Quality Assurance ◽  
Embedded Systems ◽  
Software Development ◽  
Digital Signal Processor ◽  
Real Life ◽  
Digital Signal ◽  
Embedded Software ◽  
Development Framework ◽  
Assessment Environment ◽  
Flexible Component

Embedded software is used to control the functions of mechanical and physical devices by dedicated digital signal processor and computers. Nowadays, heterogeneous and collaborative embedded software systems are widely adopted to engage the physical world. To make such software extremely reliable, very efficient and highly flexible, component-based embedded software development can be employed for the complex embedded systems, especially those based on object-oriented (OO) approaches. In this paper, we introduce a component-based embedded software framework and the features it inherits. We propose a quality assurance (QA) model for component-based embedded software development, which covers both the component QA and the system QA as well as their interactions. Furthermore, we propose a generic quality assessment environment for component-based embedded systems: ComPARE. ComPARE can be used to assess real-life off-the-shelf components and to evaluate and validate the models selected for their evaluation. The overall component-based embedded systems can then be composed and analyzed seamlessly.

scholarly journals SHIL and DHIL Simulations of Nonlinear Control Methods Applied for Power Converters Using Embedded Systems

Electronics ◽  
2018 ◽  
Vol 7 (10) ◽  
pp. 241 ◽  
Author(s):  
Arthur Rosa ◽  
Matheus Silva ◽  
Marcos Campos ◽  
Renato Santana ◽  
Welbert Rodrigues ◽  
...  
Keyword(s):  
Embedded Systems ◽  
Nonlinear Control ◽  
Real Time ◽  
Digital Signal Processor ◽  
High Performance ◽  
Power Converters ◽  
Digital Signal ◽  
Simulation Method ◽  
Hardware In The Loop ◽  
Control Techniques

In this work, a new real-time Simulation method is designed for nonlinear control techniques applied to power converters. We propose two different implementations: in the first one (Single Hardware in The Loop: SHIL), both model and control laws are inserted in the same Digital Signal Processor (DSP), and in the second approach (Double Hardware in The Loop: DHIL), the equations are loaded in different embedded systems. With this methodology, linear and nonlinear control techniques can be designed and compared in a quick and cheap real-time realization of the proposed systems, ideal for both students and engineers who are interested in learning and validating converters performance. The methodology can be applied to buck, boost, buck-boost, flyback, SEPIC and 3-phase AC-DC boost converters showing that the new and high performance embedded systems can evaluate distinct nonlinear controllers. The approach is done using matlab-simulink over commodity Texas Instruments Digital Signal Processors (TI-DSPs). The main purpose is to demonstrate the feasibility of proposed real-time implementations without using expensive HIL systems such as Opal-RT and Typhoon-HL.

Design of a Random Test Platform for DSP Serials Used in Embedded Systems

2011 ◽  
Vol 267 ◽  
pp. 98-103
Author(s):  
Chi Pin Wei ◽  
Zhao Lin Li ◽  
Hao Liu ◽  
Zhi Xiang Chen
Keyword(s):  
Embedded Systems ◽  
Embedded System ◽  
Digital Signal Processor ◽  
Digital Signal ◽  
Testing Procedure ◽  
Functional Verification ◽  
Test Program ◽  
Random Test ◽  
Test Platform ◽  
The Embedded System

Embedded systems with digital signal processor (DSP) become more and more popular for the increasing requirement of supercomputing these days. Efficient development of DSP serials used in embedded systems shortens the embedded system R&D cycle. Functional verification is one of the most complex and expensive tasks during DSP serials design process. A random test platform which is urged for DSP serials verification is proposed in this paper. The platform can automatically generate the random test program. The platform also realized the recording and checking of simulation results, which make the verification more effective. In order to improve the efficiency of DSP verification, a testing experience library has been generated through the testing procedure. This platform can be transplanted for different DSP models easily by updating few modules. According to the verification results, this platform has satisfactory coverage of DSP models.

Design and Realization of Simulation Environment of Embedded Software and Hardware Intergration Based on GEF

2013 ◽  
Vol 756-759 ◽  
pp. 2226-2230
Author(s):  
Bo Geng ◽  
Qing Hua Cao
Keyword(s):  
Embedded Systems ◽  
Software Development ◽  
Design Process ◽  
Systems Design ◽  
Embedded Software ◽  
Engineering System ◽  
Simulation Platform ◽  
Development Environment ◽  
Test Environment ◽  
Software And Hardware

Embedded software and hardware integration simulation platform is developed for simulating the embedded systems design process in current engineering system, which can facilitate finding various problems in system design process. For example, in the system scheme phase, the scheme and design verification are untimely and inadequate. In the early prototype phase, software development lags behind result in deferral of the overall progress of the system. And in the late prototype stage, the problem is lacking configuration item test environment. Embedded software and hardware integration simulation platform can provide verification of hardware and software integration and test development environment. Therefore, the quality of software development in embedded systems can be significantly improved and development cycle can be remarkably shortened by using this simulation platform.

Dataflow Model–based Software Synthesis Framework for Parallel and Distributed Embedded Systems

2021 ◽  
Vol 26 (5) ◽  
pp. 1-38
Author(s):  
Eunjin Jeong ◽  
Dowhan Jeong ◽  
Soonhoi Ha
Keyword(s):  
Embedded Systems ◽  
Software Development ◽  
Synthesis Method ◽  
Real Life ◽  
Task Graph ◽  
Software Synthesis ◽  
Distributed Embedded Systems ◽  
Hardware Platform ◽  
Processing Elements ◽  
Model Based

Existing software development methodologies mostly assume that an application runs on a single device without concern about the non-functional requirements of an embedded system such as latency and resource consumption. Besides, embedded software is usually developed after the hardware platform is determined, since a non-negligible portion of the code depends on the hardware platform. In this article, we present a novel model-based software synthesis framework for parallel and distributed embedded systems. An application is specified as a set of tasks with the given rules for execution and communication. Having such rules enables us to perform static analysis to check some software errors at compile-time to reduce the verification difficulty. Platform-specific programs are synthesized automatically after the mapping of tasks onto processing elements is determined. The proposed framework is expandable to support new hardware platforms easily. The proposed communication code synthesis method is extensible and flexible to support various communication methods between devices. In addition, the fault-tolerant feature can be added by modifying the task graph automatically according to the selected fault-tolerance configurations by the user. The viability of the proposed software development methodology is evaluated with a real-life surveillance application that runs on six processing elements.

A Survey on Quality Attributes and Quality Models for Embedded Software

2021 ◽  
pp. 1114-1132
Author(s):  
Zouheyr Tamrabet ◽  
Toufik Marir ◽  
Farid MOKHATI
Keyword(s):  
Embedded Systems ◽  
Software Development ◽  
Software Quality ◽  
Embedded Software ◽  
Entire System ◽  
Quality Engineering ◽  
High Quality ◽  
Quality Models ◽  
Software Failures

This article describes how software quality engineering is an inevitable activity, which must be accomplished during software development process in order to avoid software failures and ensuring its quality. Embedded systems are computer platforms, which require high quality software. Many researchers interested in embedded systems have demonstrated that the quality of the embedded software has a significant effect on the performances of the entire system. In the literature, several works have been emerged from this line of research. The aim of this article is to present a survey of the most important works, which deal with embedded software quality engineering. A comparative study is also given in order to show strengths and weaknesses of each work.

Application of Error Estimating Model to Control Quality in Embedded Software Development

2010 ◽  
Vol 130 (3) ◽  
pp. 496-502
Author(s):  
Yoshiyuki Anan ◽  
Toyoshiro Nakashima ◽  
Kazunori Iwata ◽  
Hiroshi Yonemitsu ◽  
Tetsu Yoshioka ◽  
...  
Keyword(s):  
Software Development ◽  
Embedded Software ◽  
Control Quality

Yield Enhancement Study: Process Variation and Design Margins Leading to Timing Issues in the RAM

2000 ◽  
Author(s):  
Srikanth Perungulam ◽  
Scott Wills ◽  
Greg Mekras
Keyword(s):  
Cross Sections ◽  
Digital Signal Processor ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Random Access ◽  
Digital Signal ◽  
Yield Enhancement ◽  
Final Conclusion ◽  
Stage Separation ◽  
Study Process

Abstract This paper illustrates a yield enhancement effort on a Digital Signal Processor (DSP) where random columns in the Static Random Access Memory (SRAM) were found to be failing. In this SRAM circuit, sense amps are designed with a two-stage separation and latch sequence. In the failing devices the bit line and bit_bar line were not separated far enough in voltage before latching got triggered. The design team determined that the sense amp was being turned on too quickly. The final conclusion was that a marginal sense amp design, combined with process deviations, would result in this type of failure. The possible process issues were narrowed to variations of via resistances on the bit and bit_bar lines. Scanning Electron Microscope (SEM) inspection of the the Focused Ion Beam (FIB) cross sections followed by Transmission Electron Microscopy (TEM) showed the presence of contaminants at the bottom of the vias causing resistance variations.

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