Properties of TiO2/TiOx Active Layers and Fabrication Resistive Switching Device
2019 ◽
Vol 18
(03n04)
◽
pp. 1940085
Keyword(s):
X Ray
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The electrical and structural properties of titanium oxides TiO2/TiOx fabricated by reactive magnetron sputtering were studied and used in a memristor. X-ray diffraction and [Formula: see text]–[Formula: see text] measurements were performed in order to characterize the fabricated structures.
2011 ◽
Vol 18
(01n02)
◽
pp. 23-31
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2009 ◽
Vol 79-82
◽
pp. 489-492
2013 ◽
Vol 750-752
◽
pp. 2092-2095
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2007 ◽
Vol 21
(18n19)
◽
pp. 3489-3492
2013 ◽
Vol 363
◽
pp. 277-281
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