Abnormal Junction Profile of Submicrometer Complementary Metal Oxide Semiconductor Devices with Co Silicidation and Shallow Trench Isolation Processes

2001 ◽  
Vol 4 (11) ◽  
pp. G88 ◽  
Author(s):  
Chel-Jong Choi ◽  
Tae-Yeon Seong ◽  
Key-Min Lee ◽  
Joo-Hyoung Lee ◽  
Young-Jin Park ◽  
...  
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