Abnormal Junction Profile of Submicrometer Complementary Metal Oxide Semiconductor Devices with Co Silicidation and Shallow Trench Isolation Processes
2001 ◽
Vol 4
(11)
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pp. G88
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2002 ◽
Vol 20
(3)
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pp. 918
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2010 ◽
Vol 28
(2)
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pp. 391-397
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1997 ◽
Vol 15
(6)
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pp. 1936
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1999 ◽
Vol 38
(Part 1, No. 4B)
◽
pp. 2232-2237
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2009 ◽
Vol 27
(3)
◽
pp. 1261
2011 ◽
Vol 32
(7)
◽
pp. 076001
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