Membranes, Electrodes, and Membrane-Electrodes Assemblies Analyzed before and after Operation By Atomic Force Microscopy

In an effort to study an alternative approach to make graphene from graphene oxide (GO), exposure of GO to high-energy X-ray radiation has been performed. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM) have been used to characterize GO before and after irradiation. Results indicate that GO exposed to high-energy radiation is converted to an amorphous carbon phase that is conductive.

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Atomic Force Microscopy Analysis of Bacterial Surface Morphology Before and After Cell Washing

Journal of Scanning Probe Microscopy ◽

10.1166/jspm.2006.007 ◽

2006 ◽

Vol 1 (2) ◽

pp. 63-73 ◽

Cited By ~ 4

Author(s):

A. M. Gallardo-Moreno ◽

Y. Liu ◽

M. L. González-Martín ◽

T. A. Camesano

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Atomic Force Microscopy Analysis ◽

Bacterial Surface ◽

Force Microscopy ◽

Atomic Force ◽

Before And After ◽

Microscopy Analysis

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AFM Study of Untreated and Treated Fibers of Mongolian Goat Cashmere

Materials Science Forum ◽

10.4028/www.scientific.net/msf.610-613.175 ◽

2009 ◽

Vol 610-613 ◽

pp. 175-178 ◽

Cited By ~ 3

Author(s):

Namsrai Javkhlantugs ◽

Enkhbaatar Ankhbayar ◽

Khishigjargal Tegshjargal ◽

Damdin Enkhjargal ◽

Chimed Ganzorig

Keyword(s):

Surface Roughness ◽

Atomic Force Microscopy ◽

Fine Structure ◽

Ambient Conditions ◽

Bleaching Process ◽

Surface Change ◽

Force Microscopy ◽

Atomic Force ◽

Before And After ◽

The Difference

The morphological surface change of untreated and treated fibers of the Mongolian goat cashmere was investigated by atomic force microscopy (AFM) at ambient conditions. The cuticle scale heights of the Mongolian goat cashmere fibers were measured by the AFM for the fibers before and after treatment. The experimental results showed that the difference between the fine structure of the cuticle and surface roughness of untreated and treated fibers. We found that the surface morphological change of the cashmere fibers was strongly degraded after the bleaching process.

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Atomic Force Microscopy Study of the Effect of Antimicrobial Peptides on the Cell Envelope of Escherichia coli

Antimicrobial Agents and Chemotherapy ◽

10.1128/aac.49.10.4085-4092.2005 ◽

2005 ◽

Vol 49 (10) ◽

pp. 4085-4092 ◽

Cited By ~ 122

Author(s):

M. Meincken ◽

D. L. Holroyd ◽

M. Rautenbach

Keyword(s):

Escherichia Coli ◽

Atomic Force Microscopy ◽

Morphological Changes ◽

Cell Envelope ◽

Microscopy Study ◽

Target Cells ◽

Force Microscopy ◽

E Coli ◽

Atomic Force ◽

Before And After

ABSTRACT The influences of the antibacterial magainin 2 and PGLa from the African clawed frog (Xenopus laevis) and the hemolytic bee venom melittin on Escherichia coli as the target cell were studied by atomic force microscopy (AFM). Nanometer-scale images of the effects of the peptides on this gram-negative bacterium's cell envelope were obtained in situ without the use of fixing agents. These high-resolution AFM images of the surviving and intact target cells before and after peptide treatment showed distinct changes in cell envelope morphology as a consequence of peptide action. Although all three peptides are lytic to E. coli, it is clear from this AFM study that each peptide causes distinct morphological changes in the outer membrane and in some cases the inner membrane, probably as a consequence of different mechanisms of action.

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Surface Morphology of Nanoscale TiSi2 Epitaxial Islands on Si(00l)

MRS Proceedings ◽

10.1557/proc-448-223 ◽

1996 ◽

Vol 448 ◽

Cited By ~ 1

Author(s):

Woochul Yang ◽

F.J. Jedema ◽

H. Ade ◽

R.J Nemanich

Keyword(s):

Surface Roughness ◽

Atomic Force Microscopy ◽

Strain Field ◽

Island Size ◽

Island Formation ◽

Force Microscopy ◽

Atomic Force ◽

Before And After ◽

Size Uniformity ◽

Rough Substrate

AbstractThe morphologies of nanoscale epitaxial islands of TISi2 are studied. The islands are prepared by deposition of ultrathin Ti (3-20Å) on both smooth and roughened.Si(001) substrates. The island formation is initiated by annealing to 800-1000°C. The roughened substrates are prepared by etching with atomic H produced in a plasma. The morphologies of the substrate before and after island formation are examined by atomic force microscopy (AFM). In particular, the influence of surface-roughness on both the formation of islands and the size distribution of islands is investigated. On a rough substrate islands with a lateral dimension of ~350Å and a vertical dimension of ~25Å were observed with size uniformity of ~20%. Also it was observed that the roughness of the surface reduced the island size and affected the island distribution. The results are discussed in terms of surface energy and the strain field around the islands.

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Characterization of H-Plasma Treated ZnO Crystals by Positron Annihilation and Atomic Force Microscopy

Defect and Diffusion Forum ◽

10.4028/www.scientific.net/ddf.331.113 ◽

2012 ◽

Vol 331 ◽

pp. 113-125 ◽

Cited By ~ 5

Author(s):

Jakub Čížek ◽

I. Procházka ◽

J. Kuriplach ◽

W. Anwand ◽

Gerhard Brauer ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Positron Annihilation ◽

Crystal Surface ◽

Photon Momentum ◽

Force Microscopy ◽

Atomic Force ◽

Before And After ◽

Positron Lifetime Spectroscopy ◽

Complementary Techniques

Nominally undoped, hydrothermally grown ZnO single crystals have been investigated before and after exposure to remote H-plasma. Defect characterization has been made by two complementary techniques of positron annihilation: positron lifetime spectroscopy and coincidence Doppler broadening. The high-momentum parts of the annihilation photon momentum distribution have been calculated from first principles in order to assist in defect identification. The positron annihilation results are supplemented by Atomic Force Microscopy for characterization of the crystal surface. It was found that virgin ZnO crystal contains Zn-vacancies associated with hydrogen. H-plasma treatment causes a significant reduction in concentration of these complexes. Physical mechanism of this effect is discussed in the paper.

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MICROSTRUCTURE OF NANOSILICA MODIFIED BINDER BY ATOMIC FORCE MICROSCOPY

Jurnal Teknologi ◽

10.11113/jt.v78.9480 ◽

2016 ◽

Vol 78 (7-3) ◽

Author(s):

Ahmad Kamil Arshad ◽

Mohamad Saifullah Samsudin ◽

Juraidah Ahmad ◽

Khairil Azman Masri

Keyword(s):

Atomic Force Microscopy ◽

Physical Properties ◽

Asphalt Binder ◽

Visual Evaluation ◽

Force Microscopy ◽

Atomic Force ◽

Surface Stiffness ◽

Before And After ◽

Modified Binder ◽

Temperature Susceptibility

In this paper, the effect of nanosilica (NS) on the physical properties as well as aging on the morphology of asphalt binder was investigated. Asphalt binder penetration grade 60/70 (PEN 60/70) was modified with NS at concentrations of 1% to 5% by weight of binder. Scanning electron microscopy (SEM) was used to have a visual evaluation of Nanosilica dispersion. The physical properties tested include is softening point, penetration, ductility, viscosity and storage stability. Temperature susceptibility was evaluated using penetration index (PI) and penetration viscosity number (PVN). Nanosilica modified binder (NSMB) were aged using the rolling thin film oven test (RTFO) and pressure aging vessel (PAV). The morphology of the virgin asphalt binder and NSMB before and after aging was characterized by tapping mode atomic force microscopy (AFM). From the physical properties test, the addition of NS was found to improve the asphalt binder properties and can resist high temperature susceptibility. The results of the AFM imaging showed that the addition of nanosilica in asphalt binder improved its surface stiffness. The overall surface stiffness of the asphalt binder after aging also increased. It can be concluded from this study that 2% to 4% of NS gave the optimum performance for the binder.

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