X-Ray Residual Stress Mapping in Industrial Materials By Energy Dispersive Diffractometry

1981 ◽  
Vol 25 ◽  
pp. 329-338 ◽  
Author(s):  
C. J. Bechtoldt ◽  
R. C. Placious ◽  
W. J. Boettinger ◽  
M. Kuriyama
Keyword(s):  
Residual Stress ◽  
Optical Resolution ◽  
High Energy ◽  
Energy Dispersive ◽  
Stress Distributions ◽  
X Ray ◽  
Transmission Geometry ◽  
Pipe Line ◽  
Residual Strains ◽  
Industrial Materials

AbstractAn application of energy dispersive diffractometry to the measurement of residual strains (stresses) in the interior of industrial materials is described with particular emphasis on the use of high energy (up to 250 keV) x-ray photons. The use of high energy photons permits better penetration into materials. Hence diffraction data for evaluating bulk residual strains can be obtained in the transmission geometry in contrast with the conventional angular dispersive diffractometry, which uses Bragg reflections from the surface of materials. The reliability and sensitivity (detectability of small strains) of the energy dispersive method are demonstrated through its application to mapping of residual stress distributions across weld zones in Alaskan pipe line segments (API5LX65). The detectability of strain variations within materials depends on x-ray optical resolution and statistics.

X-Ray Residual Stress Mapping in Industrial Materials by Energy Dispersive Diffractometry

1982 ◽  
pp. 329-338 ◽  
Author(s):  
C. J. Bechtoldt ◽  
R. C. Placious ◽  
W. J. Boettinger ◽  
M. Kuriyama
Keyword(s):  
Residual Stress ◽  
Energy Dispersive ◽  
X Ray ◽  
Stress Mapping ◽  
Industrial Materials

scholarly journals Residual Lattice Strain and Phase Distribution in Ti-6Al-4V Produced by Electron Beam Melting

Materials ◽  
2019 ◽  
Vol 12 (4) ◽  
pp. 667 ◽  
Author(s):  
Tuerdi Maimaitiyili ◽  
Robin Woracek ◽  
Magnus Neikter ◽  
Mirko Boin ◽  
Robert Wimpory ◽  
...  
Keyword(s):  
Residual Stress ◽  
Electron Beam ◽  
Electron Beam Melting ◽  
Phase Distribution ◽  
High Energy ◽  
Process Parameter ◽  
Electron Backscattered Diffraction ◽  
X Ray ◽  
Β Phase ◽  
Residual Strains

Residual stress/strain and microstructure used in additively manufactured material are strongly dependent on process parameter combination. With the aim to better understand and correlate process parameters used in electron beam melting (EBM) of Ti-6Al-4V with resulting phase distributions and residual stress/strains, extensive experimental work has been performed. A large number of polycrystalline Ti-6Al-4V specimens were produced with different optimized EBM process parameter combinations. These specimens were post-sequentially studied by using high-energy X-ray and neutron diffraction. In addition, visible light microscopy, scanning electron microscopy (SEM) and electron backscattered diffraction (EBSD) studies were performed and linked to the other findings. Results show that the influence of scan speed and offset focus on resulting residual strain in a fully dense sample was not significant. In contrast to some previous literature, a uniform α- and β-Ti phase distribution was found in all investigated specimens. Furthermore, no strong strain variations along the build direction with respect to the deposition were found. The magnitude of strain in α and β phase show some variations both in the build plane and along the build direction, which seemed to correlate with the size of the primary β grains. However, no relation was found between measured residual strains in α and β phase. Large primary β grains and texture appear to have a strong effect on X-ray based stress results with relatively small beam size, therefore it is suggested to use a large beam for representative bulk measurements and also to consider the prior β grain size in experimental planning, as well as for mathematical modelling.

Nondestructive separation of residual stress and composition gradients in thin films by angle- and energy-dispersive X-ray diffraction. I. Theoretical concepts

2017 ◽  
Vol 50 (1) ◽  
pp. 252-264 ◽  
Author(s):  
Manuela Klaus ◽  
Christoph Genzel
Keyword(s):  
Thin Films ◽  
Residual Stress ◽  
Stress State ◽  
High Energy ◽  
Lattice Parameter ◽  
Energy Dispersive ◽  
Theoretical Concepts ◽  
X Ray ◽  
Residual Stress State ◽  
Composition Gradients

Different X-ray measurement and data evaluation concepts are presented, which allow for residual stress analysis in thin films with pronounced gradients in chemical composition. These gradients lead to a variation in the strain-free lattice parameter a 0 with respect to the film thickness and superimpose the lattice strain induced by the film's inherent stresses. Non-consideration of a 0(z) gradients is shown to lead to considerable errors (`ghost stresses') in the residual stress depth profiles. With the simulated example of a TiC x N1−x film with a pronounced carbon gradient, the first part of this series introduces four approaches, which permit the separation of residual stress and composition depth distributions at different levels of approximation. They are based on lattice spacing depth profile measurements performed in either the sin2ψ mode or the scattering vector mode, or in combinations of these two scanning modes. Depending on the approach used for separating the residual stress and composition gradients, angle- or energy-dispersive diffraction has to be applied, employing monochromatic X-ray sources available in the laboratory or either white high-energy synchrotron radiation or the Bremsstrahlung of conventional X-ray tubes, respectively. The methods introduced here assume a biaxial residual stress state within the film. For a triaxial residual stress state with σ33 ≠ 0, a separation of stress and composition gradients is not straightforward, because an a 0(z) gradient cannot be distinguished from the hydrostatic part of the stress tensor.

Phase composition depth profiles using spatially resolved energy dispersive X-ray diffraction

2004 ◽  
Vol 37 (6) ◽  
pp. 967-976 ◽  
Author(s):  
Andrew C. Jupe ◽  
Stuart R. Stock ◽  
Peter L. Lee ◽  
Nikhila N. Naik ◽  
Kimberly E. Kurtis ◽  
...  
Keyword(s):  
Phase Composition ◽  
Spatial Resolution ◽  
Zinc Coating ◽  
High Energy ◽  
Sulfate Attack ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
X Ray ◽  
Spatially Resolved ◽  
Composition Profiles

Spatially resolved energy dispersive X-ray diffraction, using high-energy synchrotron radiation (∼35–80 keV), was used nondestructively to obtain phase composition profiles along the radii of cylindrical cement paste samples to characterize the progress of the chemical changes associated with sulfate attack on the cement. Phase distributions were acquired to depths of ∼4 mm below the specimen surface with sufficient spatial resolution to discern features less than 200 µm thick. The experimental and data analysis methods employed to obtain quantitative composition profiles are described. The spatial resolution that could be achieved is illustrated using data obtained from copper cylinders with a thin zinc coating. The measurements demonstrate that this approach is useful for nondestructively visualizing the sometimes complex transformations that take place during sulfate attack on cement-based materials. These transformations can be spatially related to microstructure as seen by computed microtomography.

scholarly journals X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via

2016 ◽  
Vol 49 (1) ◽  
pp. 182-187 ◽  
Author(s):  
J. Todt ◽  
H. Hammer ◽  
B. Sartory ◽  
M. Burghammer ◽  
J. Kraft ◽  
...  
Keyword(s):  
Thin Film ◽  
Residual Stress ◽  
Finite Element ◽  
Diffraction Data ◽  
Element Model ◽  
Stress Distributions ◽  
Through Silicon Via ◽  
X Ray ◽  
Tangential Stresses ◽  
Stress Components

Synchrotron X-ray nanodiffraction is used to analyse residual stress distributions in a 200 nm-thick W film deposited on the scalloped inner wall of a through-silicon via. The diffraction data are evaluated using a novel dedicated methodology which allows the quantification of axial and tangential stress components under the condition that radial stresses are negligible. The results reveal oscillatory axial stresses in the range of ∼445–885 MPa, with a distribution that correlates well with the scallop wavelength and morphology, as well as nearly constant tangential stresses of ∼800 MPa. The discrepancy with larger stress values obtained from a finite-element model, as well as from a blanket W film, is attributed to the morphology and microstructural nature of the W film in the via.

Residual stresses in a SiC whisker-reinforced alumina composite by high-temperature X-ray diffraction

1994 ◽  
Vol 9 (1) ◽  
pp. 50-53 ◽  
Author(s):  
Benjamin L. Ballard ◽  
Paul K. Predecki ◽  
Camden R. Hubbard
Keyword(s):  
Residual Stress ◽  
Single Crystal Silicon ◽  
Linear Extrapolation ◽  
X Ray Diffraction ◽  
Crystal Silicon ◽  
X Ray ◽  
Fine Grained ◽  
Silicon Carbide Whiskers ◽  
Alumina Composite ◽  
Residual Strains

Residual strains and microstresses are evaluated for both phase of a hot-pressed, fine-grained α-alumina reinforced with 25 wt% (29 vol%) single-crystal silicon carbide whiskers at temperatures from 25 to 1000 °C. The sample was maintained in a nonoxidizing environment while measurements of the interplaner spacing of alumina (146) and SiC (511 + 333) were made using X-ray diffraction methods. The residual strains were profiled at temperature increments of 250 °C from which the corresponding microstresses were calculated. Linear extrapolation of the SiC ε33 profile indicates that the strains are completely relaxed at a temperature of approximately 1470 °C. These residual stress relaxation results suggest that elevated temperature toughness and fracture strength of this composite may result from cooperative mechanisms.

High energy resolution PIXE spectroscopy at the J. Stefan Institute, Ljubljana

2014 ◽  
Vol 24 (03n04) ◽  
pp. 205-215
Author(s):  
M. Kavčič
Keyword(s):  
Trace Element ◽  
Energy Resolution ◽  
Trace Element Analysis ◽  
High Energy ◽  
Energy Dispersive ◽  
High Energy Resolution ◽  
Pixe Analysis ◽  
X Ray ◽  
Analytical Technique ◽  
Stefan Institute

While traditional proton induced X-ray emission (PIXE) analytical technique is based on the energy dispersive solid state detectors used to collect the X-ray fluorescence from the sample, wavelength dispersive X-ray (WDX) spectrometers are applied in high energy resolution PIXE (HR-PIXE) analysis. The main drawback of the WDX spectroscopy is the relatively low efficiency making it less applicable for trace element PIXE analysis. However, the efficiency was enhanced significantly in modern spectrometers employing cylindrically or even spherically curved crystals combined with position sensitive X-ray detectors. The energy resolution of such a spectrometer may exceed the resolution of the energy dispersive detector by two orders of magnitude while keeping the efficiency at a high enough level to perform trace element analysis. In this paper, the recent history and the development of HR-PIXE spectroscopy at the J. Stefan Institute in Ljubljana is presented. Our current setup based on in-vacuum Johansson-type crystal spectrometer is presented in more details followed by some most recent applications.

S119 Residual Stress Mapping in a Pipe Weld Repair Using High Energy X-ray Diffraction

2008 ◽  
Vol 23 (2) ◽  
pp. 189-189
Author(s):  
P. J. Bouchard ◽  
M. Turski ◽  
L. Edwards
Keyword(s):  
Residual Stress ◽  
High Energy ◽  
X Ray Diffraction ◽  
Weld Repair ◽  
X Ray ◽  
Stress Mapping
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