Study and Reduction of Variability in 28 nm Fully Depleted Silicon on Insulator Technology
2016 ◽
Vol 12
(1)
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pp. 64-73
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Keyword(s):
2013 ◽
Vol 471
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pp. 012026
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2008 ◽
Vol 17
(7-10)
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pp. 1248-1251
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