SIMS of Biomineralized Tissues: Present Trends and Potentials

1997 ◽  
Vol 11 (4) ◽  
pp. 364-379 ◽  
Author(s):  
A. Lodding

The technique of dynamic secondary ion mass spectrometry (SIMS) has, during the 1980s, become a firmly established tool in the microanalytical and microstructural characterization of dental hard tissues. SIMS has proved to be outstandingly suited for charting the distributions of most elements, even at extremely low concentrations, in tooth and bone materials. In-depth concentration profiles as well as surface distribution maps of elements have been recorded with excellent (sub-micron) morphologic resolution. In spite of documented success, only relatively few teams, in a handful of countries, are presently engaged, to any significant extent, in conducting tooth or bone research by the application of SIMS. For dental-medical-surgical laboratories, a partial reason for non-communication is a lack of information about SIMS and its particular assets. Another reason may be connected with an essentially groundless reputation, among non-specialists, of SIMS being an exclusive and expensive technique. Among SIMS laboratories, on the other hand, the inertia in tackling biomineralization is partly due to some particular artifacts of analysis, hitherto not generally known and controlled. The present paper briefly sketches the chief principles of modem SIMS, emphasizing factors of special relevance in the characterization of biomineralized tissues. Examples of recent applications are provided. Present procedures and their limitations are discussed, especially with regard to elemental quantification and imaging. Suggestions for relatively simple modifications to existing routines are offered with the aim of enhancing the ease and availability of SIMS in odontological and surgical research.

Nanoscale ◽  
2017 ◽  
Vol 9 (44) ◽  
pp. 17571-17575 ◽  
Author(s):  
Paweł Piotr Michałowski ◽  
Piotr Gutowski ◽  
Dorota Pierścińska ◽  
Kamil Pierściński ◽  
Maciej Bugajski ◽  
...  

Non-uniform oxygen contamination in the superlattice region of a quantum cascade laser measured by secondary ion mass spectrometry.


BioResources ◽  
2016 ◽  
Vol 11 (2) ◽  
pp. 5581-5599
Author(s):  
Hong Yan Mou ◽  
Shubin Wu ◽  
Pedro Fardim

Time-of-flight secondary-ion mass spectrometry (ToF-SIMS) is an advanced surface-sensitive technique that can provide both spectral and imaging information about materials. Recently, ToF-SIMS has been used for advanced studies of lignocellulosic biomass. In the current article, the application of ToF-SIMS to the characterization of the surface chemical composition and distribution of biomass components in lignocelluloses is reviewed. Moreover, extended applications of ToF-SIMS in the study of pretreatments, modification of biomaterials, and enzyme activity of lignocellulosic materials are presented and discussed. Sample preparation prior to ToF-SIMS analysis and subsequent interpretation of results is a critical factor in ensuring reliable results. The focus of this review is to give a comprehensive understanding of and offer new hints about the effects of processing conditions on the surface chemistry of lignocellulosic biomass.


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