Jahnsite—whiteite solid solutions and associated minerals in the phosphate pegmatite at Hagendorf-Süd, Bavaria, Germany

2010 ◽  
Vol 74 (6) ◽  
pp. 969-978 ◽  
Author(s):  
I. E. Grey ◽  
W. G. Mumme ◽  
S. M. Neville ◽  
N. C. Wilson ◽  
W. D. Birch
Keyword(s):  
Electron Microscopy ◽  
Solid Solutions ◽  
Microprobe Analysis ◽  
Electron Microprobe Analysis ◽  
Full Range ◽  
Intensity Data ◽  
Compositional Zoning ◽  
Phosphate Mineral ◽  
End Members ◽  
Scanning Electron

AbstractSecondary phosphate assemblages from the Hagendorf Süd granitic pegmatite, containing the new Mn-Al phosphate mineral, nordgauite, have been characterized using scanning electron microscopy and electron microprobe analysis. Nordgauite nodules enclose crystals of the jahnsite—whiteite group of minerals, showing pronounced compositional zoning, spanning the full range of Fe/Al ratios between jahnsite and whiteite. The whiteite-rich members are F-bearing, whereas the jahnsite-rich members contain no F. Associated minerals include sphalerite, apatite, parascholzite, zwieselite-triplite solid solutions and a kingsmountite-related mineral. The average compositions of whiteite and jahnsite from different zoned regions correspond to jahnsite-(CaMnMn), whiteite-(CaMnMn) and the previously undescribed whiteite-(CaMnFe) end-members. Mo-Kα CCD intensity data were collected on a twinned crystal of the (CaMnMn)-dominant whiteite and refined in P2/a to wRobs = 0.064 for 1015 observed reflections.

Scanning Electron Microscopy and Electron Microprobe Analysis of Malignant Cell Cultures

1968 ◽  
Vol 26 ◽  
pp. 164-165
Author(s):  
R. I. Johnsson-Hegyeli ◽  
A. F. Hegyeli ◽  
D. K. Landstrom ◽  
W. C. Lane
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Cell Cultures ◽  
Electron Microprobe ◽  
Microprobe Analysis ◽  
Electron Microprobe Analysis ◽  
Three Dimensional ◽  
Malignant Cell ◽  
Interference Microscopy ◽  
Scanning Electron

Last year we reported on the use of reflected light interference microscopy (RLIM) for the direct color photography of the surfaces of living normal and malignant cell cultures without the use of replicas, fixatives, or stains. The surface topography of living cells was found to follow underlying cellular structures such as nuceloli, nuclear membranes, and cytoplasmic organelles, making possible the study of their three-dimensional relationships in time. The technique makes possible the direct examination of cells grown on opaque as well as transparent surfaces. The successful in situ electron microprobe analysis of the elemental composition and distribution within single tissue culture cells was also reported.This paper deals with the parallel and combined use of scanning electron microscopy (SEM) and the two previous techniques in a study of living and fixed cancer cells. All three studies can be carried out consecutively on the same experimental specimens without disturbing the cells or their structural relationships to each other and the surface on which they are grown. KB carcinoma cells were grown on glass coverslips in closed Leighto tubes as previously described. The cultures were photographed alive by means of RLIM, then fixed with a fixative modified from Sabatini, et al (1963).

scholarly journals Efflorescent Sulfate Crystallization on Fractured and Polished Colloform Pyrite Surfaces: A Migration Pathway of Trace Elements

Minerals ◽  
2019 ◽  
Vol 10 (1) ◽  
pp. 12
Author(s):  
Dimitrina Dimitrova ◽  
Vassilka Mladenova ◽  
Lutz Hecht
Keyword(s):  
Electron Microscopy ◽  
Trace Elements ◽  
Inductively Coupled Plasma ◽  
Microprobe Analysis ◽  
Electron Microprobe Analysis ◽  
X Ray ◽  
Inductively Coupled ◽  
Migration Pathway ◽  
Plasma Mass Spectrometry ◽  
Scanning Electron

The colloform pyrite variety incorporates many trace elements that are released in the environment during rapid oxidation. Colloform pyrite from the Chiprovtsi silver–lead deposit in Bulgaria and its oxidation efflorescent products were studied using X-ray diffractometry, scanning electron microscopy, electron microprobe analysis, and laser ablation inductively coupled plasma mass spectrometry. Pyrite is enriched with (in ppm): Co (0.1–964), Ni (1.8–3858), Cu (2.9–3188), Zn (3.1–77), Ag (1.2–1771), As (8179–52,787), Se (2.7–21.7), Sb (48–17792), Hg (4–2854), Tl (1.7–2336), Pb (13–7072), and Au (0.07–2.77). Gypsum, anhydrite, szomolnokite, halotrichite, römerite, copiapite, aluminocopiapite, magnesiocopiapite, coquimbite, aluminocoquimbite, voltaite, and ammoniomagnesiovoltaite were identified in the efflorescent sulfate assemblage. Sulfate minerals contain not only inherited elements from pyrite (Cr, Fe, Co, Ni, Cu, Zn, Ag, In, As, Sb, Hg, Tl, and Pb), but also newly introduced elements (Na, Mg, Al, Si, P, K, Ca, Sc, Ti, V, Mn, Ga, Rb, Sr, Y, Zr, Sn, Cs, Ba, REE, U, and Th). Voltaite group minerals, copiapite, magnesiocopiapite, and römerite incorporate most of the trace elements, especially the most hazardous As, Sb, Hg, and Tl. Colloform pyrite occurrence in the Chiprovtsi deposit is limited. Its association with marbles would further restrict the oxidation and release of hazardous elements into the environment.

Characterization of metallurgical grade silicon

1990 ◽  
Vol 5 (9) ◽  
pp. 1894-1899 ◽  
Author(s):  
J. C. Anglézio ◽  
C. Servant ◽  
F. Dubrous
Keyword(s):  
Electron Microscopy ◽  
Microprobe Analysis ◽  
Electron Microprobe Analysis ◽  
Optical Metallography ◽  
Metallurgical Grade Silicon ◽  
Transmission Electron ◽  
Grade Silicon ◽  
Precipitated Phases ◽  
Scanning Electron

Optical metallography, scanning electron microscopy, electron microprobe analysis, and transmission electron microscopy were used to characterize metallurgical grade silicon, produced in an electric are furnace. Coincidence fraction determinations were assumed to be Σ7 and Σ9 when grain boundaries are underlined by precipitated phases and Σ3 when they are not. The study of intergranular compounds was emphasized; ten compounds were found, the main ones being Si2Ca, Si8Al6Fe4Ca, Si2Al2Ca, Si2FeTi, and Si2.4Fe (α leboitc). The precipitation of these compounds was discussed according to the principal impurity concentrations in silicon. The crystalline structure of Si8Al6Fe4Ca was determined to be triclinic with a = 1.3923 nm, b = 1.3896 nm, c = 1.3900 nm and α = 92.4°, β = 110.3°, γ = 119.9°.

Electron microprobe analysis of the distribution of silicon in the leaves of Selaginella emmeliana

1980 ◽  
Vol 58 (23) ◽  
pp. 2459-2466 ◽  
Author(s):  
Nancy G. Dengler ◽  
Eric Y-C. Lin
Keyword(s):  
Electron Microscopy ◽  
Microprobe Analysis ◽  
Electron Microprobe Analysis ◽  
Cell Types ◽  
Preliminary Survey ◽  
Leaf Epidermis ◽  
Abaxial Side ◽  
X Ray ◽  
Tangential Wall ◽  
Scanning Electron

Scanning electron microscopy and X-ray microanalysis of the ventral leaves of Selaginella emmeliana demonstrated high levels of silicon in the marginal sclereids and about one-half the abaxial epidermal cells. Although both of these cell types bear rows of knobs or warts on the outer tangential wall, the X-ray spectra indicate that silicon is distributed throughout the wall and that it is not concentrated in these projections. In S. emmeliana, stomata are confined to a band of low silicon cells overlying the midrib on the abaxial side of the leaf. A small proportion of these stomata also contain high levels of silicon and are characterized by a constricted stomatal aperture. A preliminary survey of three other species of Selaginella indicates that accumulation of silicon in the leaf epidermis is characteristic for each.

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