scholarly journals NanoSIMS and EPMA dating of lunar zirconolite

2021 ◽  
Vol 8 (1) ◽  
Author(s):  
Nian Wang ◽  
Qian Mao ◽  
Ting Zhang ◽  
Jialong Hao ◽  
Yangting Lin

Abstract Zirconolite is a common Zr-rich accessary mineral in mafic rocks. It is also an ideal U–Pb/Pb–Pb chronometer because it commonly contains high U content (mostly 0.1–10 wt%) and negligible initial Pb. However, zirconolite is usually very small (e.g., ~ 1 μm in width) in lunar rocks, requiring a high spatial resolution analysis. We analyzed a single, large (25 μm × 20 μm) grain of zirconolite in lunar meteorite NWA 4485 using Pb–Pb dating by NanoSIMS and U–Th–Pb dating by EPMA. The resultant U–Th–Pb age is 4540 ± 340 Ma (2σ) with a spatial resolution of 1.3 μm. The Pb–Pb age by NanoSIMS is 4348.5 ± 4.8 Ma (2σ) with a spatial resolution of ~ 2 μm, consistent with the age of 4352 ± 10 Ma and 4344 ± 14 Ma reported in the same meteorite and its paired meteorite NWA 4472. Although U–Th–Pb age is somewhat older, it still includes the NanoSIMS results within the analytical uncertainty. This work demonstrates the potential application of the combined EPMA dating and REE analysis of lunar zirconolite, with the benefits of high spatial resolution, non-destructive, and readily accessibility of the instrument. The precision of the EPMA dating (7.6%, 2σ) can be improved by increasing the counting time for Pb, U and Th. We expect to apply this EPMA technique for a quick and non-destructive age survey and geochemical study of zirconolite grains from the lunar mare basalts newly returned by Chang’E-5 mission which landed on a very young (1.2–2.0 Ga by crater-counting chronology) basalt unit in Procellarum KREEP Terrain.

Coral Reefs ◽  
2021 ◽  
Author(s):  
E. Casoli ◽  
D. Ventura ◽  
G. Mancini ◽  
D. S. Pace ◽  
A. Belluscio ◽  
...  

AbstractCoralligenous reefs are characterized by large bathymetric and spatial distribution, as well as heterogeneity; in shallow environments, they develop mainly on vertical and sub-vertical rocky walls. Mainly diver-based techniques are carried out to gain detailed information on such habitats. Here, we propose a non-destructive and multi-purpose photo mosaicking method to study and monitor coralligenous reefs developing on vertical walls. High-pixel resolution images using three different commercial cameras were acquired on a 10 m2 reef, to compare the effectiveness of photomosaic method to the traditional photoquadrats technique in quantifying the coralligenous assemblage. Results showed very high spatial resolution and accuracy among the photomosaic acquired with different cameras and no significant differences with photoquadrats in assessing the assemblage composition. Despite the large difference in costs of each recording apparatus, little differences emerged from the assemblage characterization: through the analysis of the three photomosaics twelve taxa/morphological categories covered 97–99% of the sampled surface. Photo mosaicking represents a low-cost method that minimizes the time spent underwater by divers and capable of providing new opportunities for further studies on shallow coralligenous reefs.


2001 ◽  
Vol 671 ◽  
Author(s):  
Michael Gostein ◽  
Paul Lefevre ◽  
Alex A. Maznev ◽  
Michael Joffe

ABSTRACTWe discuss applications of optoacoustic film thickness metrology for characterization of copper chemical-mechanical polishing (CMP). We highlight areas where the use of optoacoustics for CMP characterization provides data complementary to that obtained by other techniques because of its ability to directly measure film thickness with high spatial resolution in a rapid, non-destructive manner. Examples considered include determination of planarization length, measurement of film thickness at intermediate stages of polish, and measurement of arrays of metal lines.


ACS Sensors ◽  
2017 ◽  
Vol 2 (9) ◽  
pp. 1310-1318 ◽  
Author(s):  
Alice Soldà ◽  
Giovanni Valenti ◽  
Massimo Marcaccio ◽  
Marco Giorgio ◽  
Pier Giuseppe Pelicci ◽  
...  

2019 ◽  
Vol 44 (1) ◽  
pp. 125-132
Author(s):  
Corinne Dorais ◽  
Antonio Simonetti ◽  
Loretta Corcoran ◽  
Tyler L. Spano ◽  
Peter C. Burns

NIR news ◽  
2017 ◽  
Vol 28 (5) ◽  
pp. 7-12 ◽  
Author(s):  
Te Ma ◽  
Tetsuya Inagaki ◽  
Satoru Tsuchikawa

Wood density and microfibril angle are strongly correlated with wood stiffness, shrinkage, and anisotropy. Understanding the spatial distribution of these values is critical for solid timber applications. In this study, near infrared (NIR) hyperspectral imaging was used to evaluate wood density and microfibril angle in a non-destructive, yet effective manner. Briefly, five wood samples collected from both normal and compression parts of two different Cryptomeria japonica trees were analyzed. Partial least squares regression analysis was performed to determine the relationship between X-ray reference data and NIR spectra, and cross-validation (leave-one-out) was used for checking prediction performances. The validation coefficient of determination (r2) between predicted densities by the NIR technique and measured values by SilviScan (X-ray data) was 0.83 with a root mean squared error of cross-validation (RMSECV) of 105.18 kg/m3. Regarding microfibril angle, r2 and RMSECV were 0.77 and 5.36°, respectively. Finally, wood density and microfibril angle were successfully mapped at a high spatial resolution (156 µm) to facilitate the detection of annual growth ring features and evaluation of aspects of heterogeneous wood quality.


2022 ◽  
Vol 17 (1) ◽  
Author(s):  
Chien-Ping Wang ◽  
Burn Jeng Lin ◽  
Pin-Jiun Wu ◽  
Jiaw-Ren Shih ◽  
Yue-Der Chih ◽  
...  

AbstractAn on-wafer micro-detector for in situ EUV (wavelength of 13.5 nm) detection featuring FinFET CMOS compatibility, 1 T pixel and battery-less sensing is demonstrated. Moreover, the detection results can be written in the in-pixel storage node for days, enabling off-line and non-destructive reading. The high spatial resolution micro-detectors can be used to extract the actual parameters of the incident EUV on wafers, including light intensity, exposure time and energy, key to optimization of lithographic processes in 5 nm FinFET technology and beyond.


2015 ◽  
Vol 306 (2) ◽  
pp. 457-467 ◽  
Author(s):  
Patrick H. Donohue ◽  
Antonio Simonetti ◽  
Elizabeth C. Koeman ◽  
Sara Mana ◽  
Peter C. Burns

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