2 Characterization of the Bundling of CNT Aqueous Dispersions in General; Monitoring of the Debundling Process in Particular: A Short Overview of Suitable Characterization Techniques

2012 ◽  
pp. 71-111
Author(s):  
Sweta Pendyala ◽  
Dave Albert ◽  
Katherine Hawkins ◽  
Michael Tenney

Abstract Resistive gate defects are unusual and difficult to detect with conventional techniques [1] especially on advanced devices manufactured with deep submicron SOI technologies. An advanced localization technique such as Scanning Capacitance Imaging is essential for localizing these defects, which can be followed by DC probing, dC/dV, CV (Capacitance-Voltage) measurements to completely characterize the defect. This paper presents a case study demonstrating this work flow of characterization techniques.


2021 ◽  
Vol 0 (0) ◽  
Author(s):  
Uwe Hempelmann

Abstract The chapter defines the terms pigments and fillers according to international standards and gives a short overview over the history and economic aspects and uses. The general common chemical and physical properties are outlined and basic methods for characterization of the pigments and their behavior in binders are described.


2014 ◽  
Vol 35 ◽  
pp. 348-357 ◽  
Author(s):  
Fernando Rincón ◽  
José Muñoz ◽  
Pablo Ramírez ◽  
Hortensia Galán ◽  
M. Carmen Alfaro

Author(s):  
Michael S. Hatzistergos

Characterization of an issue provides the required information to determine the root cause of a problem and direct the researcher towards the appropriate solution. Through the explosion of nanotechnology in the past few years, the use of sophisticated analytical equipment has become mandatory. There is no one analytical technique that can provide all the answers a researcher is looking for. Therefore, a large number of very different instruments exist, and knowing which one is best to employ for a specific problem is key to success.


2020 ◽  
Vol 15 (4) ◽  
pp. 495-508
Author(s):  
Vahideh Sarabi-Aghdam ◽  
Seyed H. Hosseini-Parvar ◽  
Ali Motamedzadegan ◽  
Saeed Mirarab Razi ◽  
Ali Rashidinejad

Mathematics ◽  
2020 ◽  
Vol 8 (6) ◽  
pp. 863 ◽  
Author(s):  
Luisa Di Piazza ◽  
Kazimierz Musiał

We give a short overview on the decomposition property for integrable multifunctions, i.e., when an “integrable in a certain sense” multifunction can be represented as a sum of one of its integrable selections and a multifunction integrable in a narrower sense. The decomposition theorems are important tools of the theory of multivalued integration since they allow us to see an integrable multifunction as a translation of a multifunction with better properties. Consequently, they provide better characterization of integrable multifunctions under consideration. There is a large literature on it starting from the seminal paper of the authors in 2006, where the property was proved for Henstock integrable multifunctions taking compact convex values in a separable Banach space X. In this paper, we summarize the earlier results, we prove further results and present tables which show the state of art in this topic.


1990 ◽  
Vol 189 ◽  
Author(s):  
M. Kunst

ABSTRACTAfter a general survey of characterization techniques the use of transient photoconductivity measurements in the microwave frequency range for the characterization of semiconductors and semiconductor devices for (opto)electronic applications is treated. Experimental details and applications of these measurements are given.


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