scholarly journals Sub pixel resolution using spectral-spatial encoding in x-ray imaging

PLoS ONE ◽  
2021 ◽  
Vol 16 (10) ◽  
pp. e0258481
Author(s):  
Timothy P. Szczykutowicz ◽  
Sean D. Rose ◽  
Alexander Kitt

Purpose Previous efforts at increasing spatial resolution have relied on decreasing focal spot and or detector element size. Many “super resolution” methods require physical movement of a component of the imaging system. This work describes a method for achieving spatial resolution on a scale smaller than the detector pixel without motion of the object or detector. Methods We introduce a weighting of the photon energy spectrum on a length scale smaller than a single pixel using a physical filter that can be placed between the focal spot and the object, between the object and the detector, or integrated into the x-ray source or detector. We refer to the method as sub pixel encoding (SPE). We show that if one acquires multiple measurements (i.e. x-ray projections), information can be synthesized at a spatial scale defined by the spectrum modulation, not the detector element size. Specifically, if one divides a detector pixel into n sub regions, and m photon-matter interactions are present, the number of x-ray measurements needed to solve for the detector response of each sub region is mxn. We discuss realizations of SPE using multiple x-ray spectra with an energy integrating detector, a single spectra with a photon counting detector, and the single photon-matter interaction case. We demonstrate the feasibility of the approach using a simulated energy integrating detector with a detector pitch of 2 mm for 80-140 kV medical and 200-600 kV industrial applications. Phantoms used for both example SPE realization had some features only a 1 mm detector could resolve. We calculate the covariance matrix of SPE output to characterize the and noise propagation and correlation of our test examples. Results The mathematical foundation of SPE is provided, with details worked out for several detector types and energy ranges. Two numerical simulations were provided to demonstrate feasibility. In both the medical and industrial simulations, some phantom features were only observable with the 1 mm and SPE synthesized 2 mm detector, while the 2 mm detector was not able to visualize them. Covariance matrix analysis demonstrated negative diagonal terms for both example cases. Conclusions The concept of encoding object information at a length scale smaller than a single pixel element, and then retrieving that information was introduced. SPE simultaneously allows for an increase in spatial resolution and provides “dual energy” like information about the underlying photon-matter interactions.

1992 ◽  
Vol 10 (4) ◽  
pp. 685-688 ◽  
Author(s):  
V. A. Bolotin ◽  
I. N. Burdonsky ◽  
V. V. Gavrilov ◽  
A. Yu. Gol'tsov ◽  
E. V. Zhuzhukalo ◽  
...  

The article reviews experiments on flash X radiography of laser-accelerated foils. The spatial resolution, sensitivity, spectral range, and signal-to-noise ratio of measurements were carefully optimized and characterized. The method was used at the Mishen facility to measure a distribution of mass ablative rate across the focal spot and for observation of the transverse plasma flows during the drive laser pulse.


This chapter describes and explains the components of modern CT scanners, including the gantry, X-ray tube, collimators, detectors, data channels, and associated terminology. Terminology includes detector element size, row width, array configuration, and slice thickness.


1983 ◽  
Vol 16 (2) ◽  
pp. 198-203 ◽  
Author(s):  
J. R. Milch

An X-ray camera is required in many low-angle diffraction experiments to focus the X-ray beam incident on the specimen. This paper describes an X-ray camera designed to record two-dimensional diffraction data from small specimens with unit cells as large as 50 nm. It matches the 200 μm focal spot of a rotating-anode X-ray generator to an electro-optical detector with a spatial resolution of 300 μm. The camera is very flexible and can accommodate a total source-to-detector distance of 2.5 m. The X-ray beam is focused by two 20 cm mirrors bent by simple two-point benders. The theory of such benders and the design of X-ray cameras incorporating them is discussed briefly. The paper also describes a fast (1 ms) X-ray shutter and simple ion chambers useful for alignment and operation.


Author(s):  
R. Hutchings ◽  
I.P. Jones ◽  
M.H. Loretto ◽  
R.E. Smallman

There is increasing interest in X-ray microanalysis of thin specimens and the present paper attempts to define some of the factors which govern the spatial resolution of this type of microanalysis. One of these factors is the spreading of the electron probe as it is transmitted through the specimen. There will always be some beam-spreading with small electron probes, because of the inevitable beam divergence associated with small, high current probes; a lower limit to the spatial resolution is thus 2αst where 2αs is the beam divergence and t the specimen thickness.In addition there will of course be beam spreading caused by elastic and inelastic interaction between the electron beam and the specimen. The angle through which electrons are scattered by the various scattering processes can vary from zero to 180° and it is clearly a very complex calculation to determine the effective size of the beam as it propagates through the specimen.


Author(s):  
J. R. Michael

X-ray microanalysis in the analytical electron microscope (AEM) refers to a technique by which chemical composition can be determined on spatial scales of less than 10 nm. There are many factors that influence the quality of x-ray microanalysis. The minimum probe size with sufficient current for microanalysis that can be generated determines the ultimate spatial resolution of each individual microanalysis. However, it is also necessary to collect efficiently the x-rays generated. Modern high brightness field emission gun equipped AEMs can now generate probes that are less than 1 nm in diameter with high probe currents. Improving the x-ray collection solid angle of the solid state energy dispersive spectrometer (EDS) results in more efficient collection of x-ray generated by the interaction of the electron probe with the specimen, thus reducing the minimum detectability limit. The combination of decreased interaction volume due to smaller electron probe size and the increased collection efficiency due to larger solid angle of x-ray collection should enhance our ability to study interfacial segregation.


Author(s):  
Brian Cross

A relatively new entry, in the field of microscopy, is the Scanning X-Ray Fluorescence Microscope (SXRFM). Using this type of instrument (e.g. Kevex Omicron X-ray Microprobe), one can obtain multiple elemental x-ray images, from the analysis of materials which show heterogeneity. The SXRFM obtains images by collimating an x-ray beam (e.g. 100 μm diameter), and then scanning the sample with a high-speed x-y stage. To speed up the image acquisition, data is acquired "on-the-fly" by slew-scanning the stage along the x-axis, like a TV or SEM scan. To reduce the overhead from "fly-back," the images can be acquired by bi-directional scanning of the x-axis. This results in very little overhead with the re-positioning of the sample stage. The image acquisition rate is dominated by the x-ray acquisition rate. Therefore, the total x-ray image acquisition rate, using the SXRFM, is very comparable to an SEM. Although the x-ray spatial resolution of the SXRFM is worse than an SEM (say 100 vs. 2 μm), there are several other advantages.


Author(s):  
J. Zhang ◽  
D.B. Williams ◽  
J.I. Goldstein

Analytical sensitivity and spatial resolution are important and closely related factors in x-ray microanalysis using the AEM. Analytical sensitivity is the ability to distinguish, for a given element under given conditions, between two concentrations that are nearly equal. The analytical sensitivity is directly related to the number of x-ray counts collected and, therefore, to the probe current, specimen thickness and counting time. The spatial resolution in AEM analysis is determined by the probe size and beam broadening in the specimen. A finer probe and a thinner specimen give a higher spatial resolution. However, the resulting lower beam current and smaller X-ray excitation volume degrade analytical sensitivity. A compromise must be made between high spatial resolution and an acceptable analytical sensitivity. In this paper, we show the necessity of evaluating these two parameters in order to determine the low temperature Fe-Ni phase diagram.A Phillips EM400T AEM with an EDAX/TN2000 EDS/MCA system and a VG HB501 FEG STEM with a LINK AN10 EDS/MCA system were used.


Author(s):  
D. A. Carpenter ◽  
Ning Gao ◽  
G. J. Havrilla

A monolithic, polycapillary, x-ray optic was adapted to a laboratory-based x-ray microprobe to evaluate the potential of the optic for x-ray micro fluorescence analysis. The polycapillary was capable of collecting x-rays over a 6 degree angle from a point source and focusing them to a spot approximately 40 µm diameter. The high intensities expected from this capillary should be useful for determining and mapping minor to trace elements in materials. Fig. 1 shows a sketch of the capillary with important dimensions.The microprobe had previously been used with straight and with tapered monocapillaries. Alignment of the monocapillaries with the focal spot was accomplished by electromagnetically scanning the focal spot over the beveled anode. With the polycapillary it was also necessary to manually adjust the distance between the focal spot and the polycapillary.The focal distance and focal spot diameter of the polycapillary were determined from a series of edge scans.


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