Effect of Zinc Doping on the Electrical and Dielectric
Properties of CCTO Compound Synthesized by Solid-State Method

In this work, the influence of zinc doping on structural and dielectric properties of CaCu(3-x)ZnxTi4O12 (CCZxTO with x = 0, 2.5, 5, 7.5, 10, 12.5 and 15%) ceramics sintered at 1000 ºC for 8 h was studied. The ceramic samples were prepared by the conventional solid-state and calcined at 1050 ºC for 4 h. The X-ray diffraction (XRD) analysis of pure and Zn-doped CCTO were analyzed by using Rietveld refinement with cubic CCTO phase with no trace impurity phase. The scanning electron microscopy (SEM) investigation showed that for Zn-doped CCTO, the grains distributions were homogenous with average sizes which decreased with increasing of Zn concentration. The dielectric permittivity as function of temperature showed two dielectric anomalies (weakly and strong) and the dielectric constant value largely decreased for x = 2.5%, which is about tree magnitude smaller than the pure ceramic. Then it increased and reached a maximum at x = 10%, which is larger than the value of pure ceramic. And for x > 10%, the dielectric constant decreased for about two magnitude smaller than the ceramic at x = 10%. The cole-cole diagramm for all the samples showed existence of two semi-arcs attributed to the grains and grains boundaries. It was found that the Rg values were much smaller than the Rgb value. This give an evidance on the formation of interior barrier layer capacity (IBLC).

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Effect of Transition Metal on Structural and Dielectric Properties of Mg0.5Tm0.5Fe2O4 (Tm = Zn and Cu) System

10.5772/intechopen.96729 ◽

2021 ◽

Author(s):

Pallavi Saxena ◽

Anand Yadav

Keyword(s):

Dielectric Constant ◽

Dielectric Properties ◽

Interfacial Polarization ◽

Xrd Analysis ◽

X Ray Diffraction ◽

High Frequencies ◽

X Ray ◽

Cubic Structure ◽

High Dielectric

This study explored the structural and dielectric features of Mg0.5Tm0.5Fe2O4 (Tm = Zn and Cu) that were synthesized by the Solid-state reaction (SSR) method. The X-ray powder diffraction (XRD) analysis reveals that the prepared samples are single-phase cubic structure without any impurity. Rietveld-refined X-ray diffraction results reveal the formation of cubic structure and all the peaks of Mg0.5Zn0.5Fe2O4 and Mg0.5Cu0.5Fe2O4 are perfectly indexed in the cubic (Fd-3 m) structure. Dielectric constant and dielectric loss variation with frequency were also explored. Both decrease when the relevant alternating field is increasing and become constant at high frequencies which reflects the important role of interfacial polarization. Furthermore, the Mg0.5Cu0.5Fe2O4 having the smallest crystallite size (~ 44.73 nm) has a high dielectric constant (~ 4.41 × 104) value as compare to Mg0.5Zn0.5Fe2O4.

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Effects of La-Dopant on Phase, Microstructure and Dielectric Properties of Bi4Ti3O12 Ceramics

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.93-94.251 ◽

2010 ◽

Vol 93-94 ◽

pp. 251-254 ◽

Cited By ~ 1

Author(s):

Pasinee Siriprapa ◽

Anucha Watcharapasorn ◽

Sukanda Jiansirisomboon

Keyword(s):

Dielectric Constant ◽

Grain Size ◽

Dielectric Properties ◽

Solid State ◽

Diffraction Analysis ◽

Solid State Reaction ◽

Preferred Orientation ◽

X Ray Diffraction ◽

Conventional Solid State Reaction ◽

X Ray

Bi4-xLaxTi3O12 (where x = 0, 0.25, 0.50, 0.75 and 1) powders and ceramics were prepared using conventional solid state reaction and sintering procedures. The calcination was carried out at 750 °C for 4 h and sintering was done at 1150 °C for 4 h. The density of all ceramics was found to be comparable regardless of La concentration. X-ray diffraction analysis showed that preferred orientation of ceramic grains was reduced with addition of La ions. This reduced preferred orientation was accompanied by a decrease in grain size. The temperature dependence of dielectric constant showed a decrease in Tc with increasing La concentration.

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Steady nature of dielectric behaviour in Sm1.5Sr0.5NiO4 – CCTO composites

Modern Electronic Materials ◽

10.3897/j.moem.5.46694 ◽

2019 ◽

Vol 5 (4) ◽

pp. 145-150

Author(s):

Kevin Abraham ◽

A. K. Thomas ◽

Jini Thomas ◽

K. V. Saban

Keyword(s):

Dielectric Constant ◽

Dielectric Properties ◽

Solid State ◽

Loss Factor ◽

Dielectric Behaviour ◽

Dielectric Studies ◽

X Ray Diffraction ◽

Conventional Solid State Reaction ◽

X Ray ◽

Practical Applications

The composite materials of 0.5 Sm1.5Sr0.5NiO4, 0.5 CCTO and 0.75 Sm1.5Sr0.5NiO4, 0.25 CCTO mixtures were prepared through the conventional solid state reaction in an attempt to obtain good dielectric properties for practical applications. The structural properties were determined by powder X-ray diffraction and single phases were obtained for Sm1.5Sr0.5NiO4 and CaCu3Ti4O12 compounds. The dielectric studies analysed over a range of frequencies (100 KHz–10 MHz) and temperatures (30 to 200 °C) revealed a desired dielectric constant values with a low steady nature of dielectric loss factor. Through impedance spectroscopy, the attained dielectric behaviour was due to the highly insulating grain boundaries at lower frequencies and semiconducting grains at higher frequencies.

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Steady nature of dielectric behaviour in Sm1.5Sr0.5NiO4 – CCTO composites

Modern Electronic Materials ◽

10.3897/j.moem.5.4.46694 ◽

2019 ◽

Vol 5 (4) ◽

pp. 145-150

Author(s):

Kevin Abraham ◽

A. K. Thomas ◽

Jini Thomas ◽

K. V. Saban

Keyword(s):

Dielectric Constant ◽

Dielectric Properties ◽

Solid State ◽

Loss Factor ◽

Dielectric Behaviour ◽

Dielectric Studies ◽

X Ray Diffraction ◽

Conventional Solid State Reaction ◽

X Ray ◽

Practical Applications

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Effect of Ni Nano-Powders Addition on the Dielectric Properties of Ba(Ti,Zr)O3 Based Y5V Ceramics

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.124-126.691 ◽

2007 ◽

Vol 124-126 ◽

pp. 691-694

Author(s):

Lei Chen ◽

Xiao Hui Wang ◽

Long Tu Li ◽

Zhi Lun Gui

Keyword(s):

Dielectric Constant ◽

Dielectric Properties ◽

Ceramic Matrix ◽

Xrd Analysis ◽

Primary Phase ◽

Polarization Degree ◽

X Ray Diffraction ◽

X Ray ◽

Perovskite Lattice ◽

Scanning Electron

In this paper, the influence of nickel (Ni) nano-powders addition on the microstructures and dielectric properties of Ba(Ti,Zr)O3 based Y5V non-reducing ceramics were investigated. The X-ray diffraction (XRD) analysis indicated that the primary phase was Ba(Ti,Zr)O3 and no Ni phase appeared until the amount of Ni exceeded 5mol%. Scanning electron microscope (SEM) observation showed that the Ni particles distributed homogenously throughout BTZ ceramic matrix. The incorporation of Ni altered the perovskite lattice parameters and thus led to the change of polarization degree under electric field and the improvement of the dielectric constant at Curie temperature.

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Facile Solid State Method Route Synthesis and Enhance Visible Light Activities of BiVO4 by Doping Co

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.703.316 ◽

2016 ◽

Vol 703 ◽

pp. 316-320

Author(s):

Hai Feng Chen ◽

Jing Ling Hu ◽

Bing Xu

Keyword(s):

Solid State ◽

Visible Light ◽

Catalytic Effect ◽

Catalytic Properties ◽

Raw Materials ◽

X Ray Diffraction ◽

Solid State Method ◽

Illumination Time ◽

X Ray ◽

State Method

Using NH4VO3, Bi (NO3)3•5H2O and Co (NO3)2•6H2O as raw materials, Co doped BiVO4 (Co/BiVO4) photocatalysts were successfully prepared by solid state method. And the photo catalytic properties were test in this work. Crystal structures of these samples were characterized by X-ray diffraction (XRD). The Methyl Orange (MO) was simulated as the sewage under the visible light to explorer the influence of the illumination time and the mass of photocatalyst. The visible-light absorption spectrum of BiVO4 was broadening with doping Co. It was found that the Co/BiVO4 had higher photocatalytic activity than pure BiVO4 .The reason of enhanced catalytic effect also had been analyzed and discussed in the article.

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INVESTIGATIONS ON Sm- AND Nb-SUBSTITUTED PZT CERAMICS

Modern Physics Letters B ◽

10.1142/s0217984906012134 ◽

2006 ◽

Vol 20 (29) ◽

pp. 1879-1882 ◽

Cited By ~ 3

Author(s):

CHANDRA PRAKASH ◽

J. K. JUNEJA

Keyword(s):

Dielectric Constant ◽

Single Phase ◽

Xrd Analysis ◽

Chemical Formula ◽

X Ray Diffraction ◽

Pzt Ceramics ◽

Ceramic Method ◽

X Ray ◽

Niobium Doping ◽

Constant Versus

In the present paper, we report the effect of Samarium substitution and Niobium doping on the properties of a PZT(52:48). The properties studied are: structural, dielectric and ferroelectric. The samples with chemical formula Pb 0.99 Sm 0.01 Zr 0.52 Ti 0.48 O 3 were prepared by solid-state dry ceramic method. Small amount (0.5 wt%) of Nb 2 O 5 was also added. X-ray diffraction (XRD) analysis showed formation of a single phase with tetragonal structure. Dielectric properties were studied as a function of temperature and frequency. Transition temperature, Tc, was determined from dielectric constant versus temperature plot. The material shows well-defined ferroelectric (PE) hysteresis loop.

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Phase Development and Dielectric Properties of 0.98BaTiO3-0.02Ba (Mg1/3Nb2/3) O3 Ceramic

Materials Science Forum ◽

10.4028/www.scientific.net/msf.700.58 ◽

2011 ◽

Vol 700 ◽

pp. 58-62

Author(s):

Rachanusorn Roongtao ◽

Supagorn Rugmai ◽

Wanwilai C. Vittayakorn

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Dielectric Constant ◽

Dielectric Properties ◽

Loss Factor ◽

X Ray Diffraction ◽

Phase Purity ◽

X Ray ◽

Phase Development ◽

Scanning Electron

The 0.98BaTiO3-0.02Ba (Mg1/3Nb2/3) O3ceramics has been synthesized through a conventional mixed-oxide by using BT nanopowder and BMN micropowder. The phase purity of the powders and the ceramics was examined using X-ray diffraction (XRD). The 0.98BT-0.02BMN powders were sintered to 92% of the theoretical density at a temperature of 1300 °C for 2 h. The microstructure of the sintered surface was investigated using scanning electron microscopy (SEM). The dielectric constant (εr) and loss factor (tanδ) of the sintered pellets at Curie temperture were 3000 and 0.015, respectively.

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Structure and electric properties of cerium substituted SrBi1.8Ce0.2Nb2O9 and SrBi1.8Ce0.2Ta2O9 ceramics

Processing and Application of Ceramics ◽

10.2298/pac1603183a ◽

2016 ◽

Vol 10 (3) ◽

pp. 183-188 ◽

Cited By ~ 5

Author(s):

Mohamed Afqir ◽

Amina Tachafine ◽

Didier Fasquelle ◽

Mohamed Elaatmani ◽

Jean-Claude Carru ◽

...

Keyword(s):

Dielectric Constant ◽

Solid State ◽

Room Temperature ◽

Single Phase ◽

Solid State Reaction Method ◽

X Ray Diffraction ◽

Reaction Method ◽

X Ray ◽

Lcr Meter ◽

Curie Temperature Tc

SrBi1.8Ce0.2Nb2O9 (SBCN) and SrBi1.8Ce0.2Ta2O9 (SBCT) powders were prepared via solid-state reaction method. X-ray diffraction analysis reveals that the SBCN and SBCT powders have the single phase orthorhom-bic Aurivillius structure at room temperature. The contribution of Raman scattering and FTIR spectroscopy of these samples were relatively smooth and resemble each other. The calcined powders were uniaxially pressed and sintered at 1250?C for 8 h to obtaine dense ceramics. Dielectric constant, loss tangent and AC conductivity of the sintered Ce-doped SrBi2Nb2O9 and SrBi2Ta2O9 ceramics were measured by LCR meter. The Ce-doped SBN (SBCN) ceramics have a higher Curie temperature (TC) and dielectric constant at TC (380?C and ?? ~3510) compared to the Ce-doped SBT (SBCT) ceramics (330?C and ?? ~115) when measured at 100Hz. However, the Ce-doped SBT (SBCT) ceramics have lower conductivity and dielectric loss.

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The effects of calcination and doping on structural and dielectric properties of CaCu3-xCoxTi4O12 ceramic

Mediterranean Journal of Chemistry ◽

10.13171/10.13171/mjc8319052011nh ◽

2019 ◽

Vol 8 (3) ◽

pp. 234

Author(s):

Nasr Hadi ◽

Tajdine Lamcharfi ◽

Farid Abdi ◽

Nor-Said Echtoui ◽

Ahmed Harrach ◽

...

Keyword(s):

Dielectric Constant ◽

Dielectric Properties ◽

Complex Impedance ◽

Impedance Analysis ◽

Xrd Analysis ◽

Secondary Phases ◽

Solid State Method ◽

Complex Impedance Analysis ◽

Oxide Powders ◽

Increasing Temperature

The influences of calcination temperature and doping with cobalt in A–site on structural and dielectric properties of CaCu3-xCoxTi4O12 (CCCxTO, x = 0.00, 0.02 and 0.10) ceramics sintered at 1050 0C for 8h were investigated. The ceramic samples are prepared by the conventional solid-state method using high purity oxide powders, and they are calcined at 850 °C, 950 °C and 1050 0C for 4h. The X-ray diffraction (XRD) analysis of pure and doped CCTO samples calcined at 950 °C and 1050 0C showed no traces of any other secondary phases, while impurity phases alongside CCTO phase in the x=0.00 sample calcined at 850 0C was observed. Scanning electron microscopy (SEM) investigation showed an increase in grain size with increasing of Co content and calcining temperature. Dielectric measurements indicated that the dielectric constant of the pure CCTO calcined at 1050 0C/4h has a low value in the frequency range of 1kHz up to 1MHz, whereas the substitution of Co up to x = 0.10 into CCTO caused a huge increase in the dielectric constant value of the calcined samples which is equal to 153419 and 18957 at 950 °C and 1050 0C respectively. The complex impedance analysis of all samples shows a decrease in resistance with an increasing temperature, which suggests a semiconductor nature of the samples.

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