scholarly journals Role of Cationic and Anionic Dopants on the Structural, Morphological, Optical and Magnetic Properties of Lead Oxide Nanocrystals Prepared by Solvothermal Method

2021 ◽  
Vol 33 (9) ◽  
pp. 2043-2048
Author(s):  
N. Saraswathi ◽  
K.J. Abhirama
Keyword(s):  
Lead Oxide ◽  
Spectroscopic Analysis ◽  
Orthorhombic Phase ◽  
Band Gap Energy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Average Grain Size ◽  
Ferromagnetic Nature ◽  
Diffraction Patterns

A facile and simple microwave assisted solvothermal technique was adopted for the synthesis of undoped and doped (Mn2+, S2–) lead oxide nanoparticles. Thermogravimetric analysis and differential thermal analysis were carried out to realize the thermal behaviour of PbO nanoparticles. The synthesized nanoparticles were annealed at about 400 ºC. The calcined samples were characterized by powder X-ray diffraction, SEM, EDX, UV spectroscopic analysis and VSM measurement. The diffraction patterns of the prepared nanoparticles showed the formation of an orthorhombic phase of lead oxide. All the samples were in nano- regime with an average grain size of 22-26 nm. Spherical morphology of the samples was revealed in the SEM micrographs. EDX pattern confirmed the presence of cationic and anionic dopants. The band gap energy values range from 4.2 to 5.6 eV. The VSM measurement revealed that the sample has weak ferromagnetic nature.

Deposition of TiO2 Thin Films Using Magnetron Sputtering

2011 ◽  
Vol 217-218 ◽  
pp. 1743-1746
Author(s):  
Xing Long Guo
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Magnetron Sputtering ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
Analysis Method ◽  
X Ray Diffraction ◽  
X Ray ◽  
Average Grain Size ◽  
Diffraction Patterns

TiO2 with 20nm in diameter have been prepared by using magnetron sputtering technique. The structure of these powers was determined by X-ray diffraction experiments. The average grain size and particle size in these powers were measured by the line profile analysis method of X-ray diffraction patterns and by scan electron microscopy, respectively. The thin films were investigated by using XRD, SEM measurements.

X-ray Diffraction and Modelling Studies of Multilayer SnO2 Thin Film Gas Sensors

1995 ◽  
Vol 403 ◽  
Author(s):  
L. E. Depero ◽  
C. Perego ◽  
L. Sangaletti ◽  
G. Sberveglieri
Keyword(s):  
Thin Film ◽  
Orthorhombic Phase ◽  
Sno2 Thin Film ◽  
X Ray Diffraction ◽  
X Ray ◽  
Modelling Studies ◽  
Cation Coordination ◽  
Diffraction Patterns ◽  
Two Phases ◽  
The Relationship

AbstractStructural studies have been carried out on SnO2 multilayer thin film grown by the Rheotaxial Growth and Thermal Oxidation method on A120 3 substrates. A preliminary analysis of the X-ray diffraction patterns shows that, in addition to the Sn0 2 cassiterite phase, a strong contribution from an orthorhombic Sn02 phase is present.In the case of the 3-layer film, the orthorhombic phase is structurally and microstructurally stable after an annealing up to 32 h at 400 'C. The cation coordination is similar to that found in cassiterite, but the chains of edge-sharing [SnO6]8- octahedra run in a zig-zag fashion along the [100] direction, each straight unit containing four octahedra. The relationship between the two phases is discussed on the basis of structural simulations including twinning planes in the crystal structure.

Sinterbility of (Bi4-xLax)Ti3O12 Ceramics

2008 ◽  
Vol 55-57 ◽  
pp. 841-844 ◽  
Author(s):  
Pasinee Siriprapa ◽  
Anucha Watcharapasorn ◽  
Sukanda Jiansirisomboon
Keyword(s):  
Grain Orientation ◽  
Sintering Temperature ◽  
Orthorhombic Phase ◽  
Preferred Orientation ◽  
Doping Content ◽  
X Ray Diffraction ◽  
Microstructural Investigation ◽  
X Ray ◽  
Lanthanum Titanate ◽  
Diffraction Patterns

This research studied the effects of sintering temperature and La3+ doping content on phase, microstructure and densification of bismuth lanthanum titanate (Bi4-xLaxTi3O12; BLT) ceramics when x = 0, 0.25, 0.5, 0.75 and 1.0, respectively. The BLT powders were prepared using a mixed-oxide method. The mixtures were calcined at 750°C for 4 h before being pressed and sintered at 1000-1150°C for 4 h. The result of phase analysis by X–ray diffraction (XRD) indicated the existence of orthorhombic phase for all sintering temperatures. The XRD peak intensities of the ceramics showed preferred orientation of a particular set of {00l}-type planes. The ceramics mainly composed of plate-like grains. Increasing the sintering temperature increased grain size and increased preferred grain orientation. The present of La3+ in BLT ceramics reduced preferred orientation especially at higher sintering temperature. Results of microstructural investigation agreed well with X-ray diffraction patterns.

Effects of Donor Doping on Microstructure and Electrical Properties of Bismuth Layer-Structured Bi4Ti3O12 Ceramics

2007 ◽  
Vol 280-283 ◽  
pp. 259-262 ◽  
Author(s):  
Lina Zhang ◽  
Su Chuan Zhao ◽  
Liao Ying Zheng ◽  
Guo Rong Li ◽  
Qing Rui Yin
Keyword(s):  
Electrical Conductivity ◽  
High Temperature ◽  
Electrical Properties ◽  
Ferroelectric Properties ◽  
Orthorhombic Phase ◽  
X Ray Diffraction ◽  
Suitable Candidate ◽  
X Ray ◽  
Donor Doping ◽  
Diffraction Patterns

A study was conducted on the effects of donor dopants, Nb2O5 and WO3, on microstructure and electric properties of Bi4Ti3O12 (BIT) ceramics. X-ray diffraction patterns of the materials showed a single orthorhombic phase structure. The microstructure results revealed the appearance of plate-like grain. The donor doping decreased the conductivity of BIT by as much as 3 orders of magnitude. The dielectric and ferroelectric properties of doped-BIT materials were also investigated. The decrease in the electrical conductivity allowed the doped samples to be poled to develop piezoelectricity. Thermal annealing studies of the samples indicated the donor-doped BIT were suitable candidate materials for high-temperature piezoelectric applications.

THE ROLE OF LIPOIDS IN THE X-RAY DIFFRACTION PATTERNS OF NERVE

Science ◽  
1935 ◽  
Vol 82 (2115) ◽  
pp. 44-45 ◽  
Author(s):  
F. O. Schmitt ◽  
R. S. Bear ◽  
G. L. Clark
Keyword(s):  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Patterns

scholarly journals The Influence of Bath Temperature on the Properties of SILAR Deposited Cobalt Selenide Thin Films

2021 ◽  
Vol 11 (4) ◽  
pp. 7393-7398
Author(s):  
S. M. Ho ◽  
T. J. S. Anand
Keyword(s):  
Thin Films ◽  
Bath Temperature ◽  
X Ray Diffraction ◽  
Silar Method ◽  
X Ray ◽  
Glass Slides ◽  
Average Grain Size ◽  
Diffraction Patterns ◽  
C 50 ◽  
Cobalt Selenide

In this paper, cobalt selenide thin films have been deposited onto glass slides with the SILAR method under various bath temperatures. The structure, optical properties, and morphology of thin films were investigated. The X-ray diffraction patterns confirmed that the number of peak intensities increased with increasing bath temperature. From the AFM images, bigger sizes and thicker films were observed for the films prepared at 80°C. The average grain size was estimated to be 0.2µm, 0.15µm, and 0.25µm when the bath temperature was 40°C, 50°C, and 80°C respectively. The highest absorbance value was observed for films prepared at 80°C. The band gap values range from 2eV to 2.4eV.

Franconite, NaNb2O5(OH)·3H2O: structure determination and the role of H bonding, with comments on the crystal chemistry of franconite-related minerals

2014 ◽  
Vol 78 (3) ◽  
pp. 591-607 ◽  
Author(s):  
M. M. M. Haring ◽  
A. M. McDonald
Keyword(s):  
Crystal Structure ◽  
Ion Exchange ◽  
Molecular Sieves ◽  
Chemical Analyses ◽  
X Ray Diffraction ◽  
Synthetic Compounds ◽  
X Ray ◽  
Distorted Octahedral ◽  
Diffraction Patterns

AbstractThe crystal structure of franconite, NaNb2O5(OH)·3H2O, has been characterized by single-crystal X-ray diffraction using material from Mont Saint-Hilaire, Québec, Canada. Results givea= 10.119(2),b= 6.436(1),c= 12.682(2) Å and β = 99.91(3)° and confirm the correct space group asP21/c. The crystal structure, refined toR= 4.63% andwR2=11.95%, contains oneNasite, two distorted octahedralNbsites and nineOsites. It consists of clusters of four edge-sharing Nb(O,OH)6octahedra, linked through shared corners to adjacent clusters, forming layers of Nb(O,OH)6octahedra. These alternate along [100] with layers composed of NaO(H2O)4polyhedra, the two being linked together by well defined H bonding. The predominance of H bonding, essential to the mineral, results in a perfect {100} cleavage. Chemical analyses (n= 7) of four crystals give the empirical formula (Na0.73Ca0.13☐0.14)∑=1.00(Nb1.96Ti0.02Si0.02Al0.01)∑=2.01O5(OH)·3H2O (based on nine oxygens) or ideally NaNb2O5(OH)·3H2O. Franconite is crystallo-chemically related to SOMS [Sandia Octahedral Molecular Sieves; Na2Nb2−xMxO6−x(OH)x·H2O with M = Ti, Zr, Hf], a group of synthetic compounds with strong ion-exchange capabilities. Both hochelagaite (CaNb4O11·nH2O) and ternovite (MgNb4O11·nH2O) have X-ray powder diffraction patterns and cation ratios similar to those of franconite indicating that these minerals probably have similar structures.

Fabrication, Characterization and Optical Studies of Cu(In1-xGax)3Se5 Bulk Compounds

2009 ◽  
Vol 1210 ◽  
Author(s):  
Dayane Habib ◽  
Georges El Hajj Moussa ◽  
Roy Al Asmar ◽  
Michael Ibrahim ◽  
Mario Remond El Tahchi ◽  
...  
Keyword(s):  
Optical Response ◽  
Band Gap Energy ◽  
Chalcopyrite Structure ◽  
X Ray Diffraction ◽  
Large Shift ◽  
X Ray ◽  
Lattice Constants ◽  
Quaternary Compounds ◽  
Diffraction Patterns ◽  
Peak Versus

AbstractIn this paper we present the structural and optical properties of Cu(In1-xGax)3Se5 ternary and quaternary compounds crystals fabricated by horizontal Bridgman technique. The Cu(In1-xGax)3Se5 materials were characterized by Energy Dispersive Spectrometry (EDS), hot point probe method, X-ray diffraction, Photoluminescence (PL), and Optical response (Photoconductivity). The Cu(In1-xGax)3Se5 have an Ordered Vacancy Chalcopyrite-type structure with lattice constants varying as a function of the x composition. A good stœchiometry given by the EDS characterization method is well observed in our samples and its magnitude deviation Δy is slight; so, our samples present a nearly perfect stœchiometry (Δy = 0) [1]. X-Ray diffraction patterns show the presence of many preferential orientations according to the planes (112), (220) and (312) of all the samples [2]. Also, it shows a linear shifting of peaks towards the higher magnitudes of 2θ when the x composition increases. These compounds can be of stanite structure [3] or an Ordered Vacancy Chalcopyrite structure (OVC) [4] or Ordered Defect Chalcopyrite Structure (ODC). We observe a large shift of the main PL and optical response emission peak versus x composition. The band gap energy of Cu(In1-xGax)3Se5 compounds is found to vary from 1.23 eV to 1.85 eV as a function of x. [1] Migual A. Contreras, Holm Wiesner, Rick Mtson, John Tuttle, Kanna Ramanathan, Rommel Noufi, Mat. Res. Soc. Symp. Proc. Vol. 426 (1996) 243-254. [2] Ariswan, G. El Haj Moussa, M. Abdelali, F. Guastavino, C. Llinares, Solid State Communications 124 (2002) 391-396. [3] M. Suzuki, T. Uenoyama, T. Wada, T. Hanada, Y. Nakamura, Jpn. J. Appl. Phys. 36 L1139 (1997). [4] Kristjan Laes, Sergei Bereznev, A. Tverjanovich, E.N. Borisov, Tiit Varema, Olga Volobujeva , Andres Öpik. Thin Solid Films 517 (2009) 2286–2290.

scholarly journals Structural, electrical and optical properties of CdS thin films and the effect of annealing on photoconductivity

2019 ◽  
Vol 12 (25) ◽  
pp. 138-147
Author(s):  
Haidar Jwad Abdul-Ameer Al-Rehamey
Keyword(s):  
Thin Films ◽  
Optical Transmittance ◽  
Band Gap Energy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glass Substrates ◽  
Average Grain Size ◽  
Type Semiconductor ◽  
Cds Thin Films ◽  
Cds Films

Cadmium sulfide (CdS) thin films with n-type semiconductor characteristics were prepared by flash evaporating method on glass substrates. Some films were annealed at 250 oC for 1hr in air. The thicknesses of the films was estimated to be 0.5µ by the spectrometer measurement. Structural, morphological, electrical, optical and photoconductivity properties of CdS films have been investigated by X-ray diffraction, AFM, the Hall effect, optical transmittance spectra and photoconductivity analysis, respectively. X-ray diffraction (XRD) pattern shows that CdS films are in the stable hexagonal crystalline structure. Using Debye Scherrerś formula, the average grain size for the samples was found to be 26 nm. The transmittance of the samples was determined from optical trasmittance spectra. It is observed that the direct band gap energy for as deposited and annealed films are (2.55, 2.45) eV, respectively. The effect of annealing at 250 oC for 1hr in air on optical and photoconductivity of films under various intensity of illuminations (43.81 and 115.12) mW/cm2 was studied. The dark and photocurrents of the annealed films were found to be greater than that of as deposited.

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