scholarly journals Strength of the Bond of Structural Steel S235JR to Bronze SAE660 Produced by Casting in Pre-Mold

2017 ◽  
Vol 17 (3) ◽  
pp. 149-154
Author(s):  
M. Zaheri ◽  
S.E. Vahdat
Keyword(s):  
Electron Microscope ◽  
Sulfuric Acid ◽  
Scanning Electron Microscope ◽  
Acid Solution ◽  
Structural Steel ◽  
Shear Test ◽  
Thrust Bearing ◽  
Production Method ◽  
Technical Specifications ◽  
Scanning Electron

Abstract Different methods are used for production of bronze bearings. In terms of technical specifications, the success of each of these methods depends on the bond’s strength and in terms of economic, the production method is important. In this study, the aim is to study the strength and microstructure of steel-bronze thrust bearing bond that has been produced through the casting using pre-mold. In this study, in order to bond, the raw metals are chemically washed with sulfuric acid solution for five minutes at first. Then, the molten bronze SAE660 is cast in a structural steel S235JR pre-mold. The bond’s strength has been measured using the shear test three times; the measurement of bond’s length has been done using field emission scanning electron microscope (FESEM). The results indicate that the strength of the bond is at least 94.8 MPa and bond’s length is 0.45 micrometers. Therefore, this method was successful for trust bearing application.

Characteristics of Hot Ductility and Fracture in Micro-Alloyed Q345B Structural Steel

2011 ◽  
Vol 194-196 ◽  
pp. 150-156 ◽  
Author(s):  
Fang Dong ◽  
Cheng Su ◽  
Yuan Yuan Bai
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Continuous Casting ◽  
Structural Steel ◽  
Void Nucleation ◽  
Hot Ductility ◽  
Strain Rates ◽  
Casting Condition ◽  
Temperature Range ◽  
Scanning Electron

Hot-ductility tests of the microalloyed Q345B structural steel were performed in a tensile machine of Gleeble-1500D at different strain rates of 1.5•10-3/s 、2.5•10-3/s and 2•10-2/s and at temperature range from 1300°C to 700°C(Δ T=100°C ), which are close to the continuous casting condition of steel. Fracture surfaces were examined using a scanning electron microscope; it was found that the hot decrease as strain rate decrease, because the void growth mechanism predominates over void nucleation, giving time for nucleation cracks to grow. The minimum ductility was found at about 800°C for the strain rates of 1.5•10-3/s and 2.5•10-3/s, and the fracture was intergranular. The steel has good plasticity in temperature range from 1200°C to 900°C which is suitable for straighten operation.

Etching Patterns of Co-Cr Alloys for Bonded Cast Restorations

1987 ◽  
Vol 66 (9) ◽  
pp. 1479-1484 ◽  
Author(s):  
K. Ekstrand ◽  
I.E. Ruyter
Keyword(s):  
Electron Microscope ◽  
Hydrochloric Acid ◽  
Scanning Electron Microscope ◽  
Acid Solution ◽  
Alloy Composition ◽  
Missing Teeth ◽  
Etch Pattern ◽  
Cr Content ◽  
Electrolytic Etching ◽  
Scanning Electron

Resin-bonded bridges may replace missing teeth and act as splints in periodontal treatment. The objective of this study was to investigate the etch pattern after electrolytic etching of selected Co-Cr alloys in hydrochloric acid and to assess the changes in alloy composition after different etching times. The alloys investigated were Vitallium, Wironit, Wironium, Nobilium Hard, and Niranium NN. Alloy specimens were electrolytically etched in a hydrochloric acid solution for 1, 2, 5, and 10 min. The etched specimens were examined in a light microscope and a scanning electron microscope (SEM). Different etching patterns were revealed in the various alloys. Microprobe analyses after the etching of Vitallium showed generally that Co was released and that Cr content increased at the surface.

scholarly journals ANALISIS UKURAN PARTIKEL SILIKA HASIL EKSTRAKSI DARI BATU PADAS ASAL KABUPATEN KETAPANG KALIMANTAN BARAT

2018 ◽  
Vol 1 (1) ◽  
pp. 39
Author(s):  
Risya Sasri ◽  
Nurlina Nurlina ◽  
Lia Destiarti ◽  
Intan Syahbanu
Keyword(s):  
Image Processing ◽  
Particle Size ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Acid Solution ◽  
Silica Particle ◽  
Size Change ◽  
West Kalimantan ◽  
Sem Image ◽  
Scanning Electron

Analysis of particle size of silica was extracted from rocks from Ketapang Regency, West Kalimantan based on characterization using scanning electron microscope (SEM) have been carried out. The analysis was performed to determine the particle size change in extraction silica without and with activation using acid solution. SEM image processing was performed on a 10 μm scale at 350x magnification through the image-J software to determine the particle size distribution. The results of the analysis showed that the area and diameter of the silica particle extracted from rocks were 3,935 μm2 and 3,147 μm (without activation) and 4,28 μm2 and 3,267 μm (activated) respectively.

The Alteration of the Pore Spaces in Sandstones

1973 ◽  
Vol 31 ◽  
pp. 210-211
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
The Other ◽  
Coarse Grained ◽  
Depositional Fabric ◽  
Soluble Components ◽  
Scanning Electron ◽  
Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Characterization of Sputtered Films using the Scanning Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 44-45
Author(s):  
R. F. Schneidmiller ◽  
W. F. Thrower ◽  
C. Ang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Sputtered Films ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Control Film ◽  
Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

Field Emission SEM Equipped With Noise Compensator

1973 ◽  
Vol 31 ◽  
pp. 302-303
Author(s):  
S. Saito ◽  
H. Todokoro ◽  
S. Nomura ◽  
T. Komoda
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Contrast ◽  
Probe Current ◽  
High Resolution Images ◽  
Scanning Electron

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

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